Lars B. Stiblert

Person

Gothenburg, SE

People

Patents Grantslast 30 patents

Information Patent Grant
Writing apparatuses and methods
- Patent number 8,822,879
- Issue date Sep 2, 2014
- Mycronic AB
- Lars Stiblert
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Method and apparatus for mura detection and metrology
- Patent number 8,160,351
- Issue date Apr 17, 2012
- Micronic Mydata AB
- Torbjörn Sandström
- G01 - MEASURING TESTING
Information Patent Grant
Platforms, apparatuses, systems and methods for processing and anal...
- Patent number 8,122,846
- Issue date Feb 28, 2012
- Micronic Mydata AB
- Lars Stiblert
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Method for measuring the position of a mark in a deflector system
- Patent number 7,912,671
- Issue date Mar 22, 2011
- Micronic Laser Systems AB
- Lars Stiblert
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for image formation
- Patent number 7,365,829
- Issue date Apr 29, 2008
- Micronic Laser Systems AB
- Måns Bjuggren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for measuring the physical properties of a surface and a...
- Patent number 7,148,971
- Issue date Dec 12, 2006
- Micronic Laser Systems AB
- Lars Stiblert
- G01 - MEASURING TESTING
Information Patent Grant
Method for calibration of a metrology stage
- Patent number 6,948,254
- Issue date Sep 27, 2005
- Micronic Laser Systems AB
- Lars Stiblert
- G01 - MEASURING TESTING
Information Patent Grant
Method and instrument for detection of change of thickness or refra...
- Patent number 5,631,171
- Issue date May 20, 1997
- Biostar, Inc.
- Torbjorn Sandstrom
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for detection of an analyte based upon light in...
- Patent number 5,494,829
- Issue date Feb 27, 1996
- Biostar, Inc.
- Torbjorn Sandstrom
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometric method and apparatus for studying physical properties...
- Patent number 4,655,595
- Issue date Apr 7, 1987
- Sagax Instrument AB
- Nils A. N. Bjork
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometric method and apparatus
- Patent number 4,647,207
- Issue date Mar 3, 1987
- Sagax Instrument AB
- Nils A. N. Bjork
- G01 - MEASURING TESTING
Information Patent Grant
Method and member for detecting and/or measuring the concentration...
- Patent number 4,558,012
- Issue date Dec 10, 1985
- Sagax Instrument AB
- B. Hakan Nygren
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for studying surface properties
- Patent number 4,332,476
- Issue date Jun 1, 1982
- Johan E. Stenberg
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method For Measuring The Position Of A Mark In A Deflector System
- Publication number 20110307211
- Publication date Dec 15, 2011
- Micronic MyData Systems AB
- Lars Stiblert
- G01 - MEASURING TESTING
Information Patent Application
Writing apparatuses and methods
- Publication number 20100308024
- Publication date Dec 9, 2010
- Lars Stiblert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD AND APPARATUS FOR MURA DETECTION AND METROLOGY
- Publication number 20090028423
- Publication date Jan 29, 2009
- Micronic Laser Systems AB
- Torbjorn Sandstrom
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Measuring the Position of a Mark in a Deflector System
- Publication number 20080294367
- Publication date Nov 27, 2008
- Lars Stiblert
- G01 - MEASURING TESTING
Information Patent Application
Platforms, apparatuses, systems and methods for processing and anal...
- Publication number 20080032066
- Publication date Feb 7, 2008
- Lars Stiblert
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Writing apparatuses and methods
- Publication number 20070182808
- Publication date Aug 9, 2007
- Lars Stiblert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for calibration of a metrology stage
- Publication number 20050086820
- Publication date Apr 28, 2005
- Lars Stiblert
- G01 - MEASURING TESTING
Information Patent Application
Method for writing a pattern on a surface intended for use in expos...
- Publication number 20050088664
- Publication date Apr 28, 2005
- Lars Stiblert
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for image formation
- Publication number 20050082496
- Publication date Apr 21, 2005
- Mans Bjuggren
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus for measuring the physical properties of a surface and a...
- Publication number 20040150707
- Publication date Aug 5, 2004
- Micronic Laser Systems AB
- Lars Stiblert
- G01 - MEASURING TESTING

Lars B. Stiblert

Person

Patents Grantslast 30 patents

Writing apparatuses and methods

Method and apparatus for mura detection and metrology

Platforms, apparatuses, systems and methods for processing and anal...

Method for measuring the position of a mark in a deflector system

Method and apparatus for image formation

Apparatus for measuring the physical properties of a surface and a...

Method for calibration of a metrology stage

Method and instrument for detection of change of thickness or refra...

Devices and methods for detection of an analyte based upon light in...

Ellipsometric method and apparatus for studying physical properties...

Ellipsometric method and apparatus

Method and member for detecting and/or measuring the concentration...

Method and apparatus for studying surface properties

Patents Applicationslast 30 patents

Method For Measuring The Position Of A Mark In A Deflector System

Writing apparatuses and methods

METHOD AND APPARATUS FOR MURA DETECTION AND METROLOGY

Method for Measuring the Position of a Mark in a Deflector System

Platforms, apparatuses, systems and methods for processing and anal...

Writing apparatuses and methods

Method for calibration of a metrology stage

Method for writing a pattern on a surface intended for use in expos...

Method and apparatus for image formation

Apparatus for measuring the physical properties of a surface and a...