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New York, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Holographic characterization of irregular particles
Patent number
11,921,023
Issue date
Mar 5, 2024
New York University
David G. Grier
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Holographic characterization of protein aggregates
Patent number
11,747,258
Issue date
Sep 5, 2023
New York University
David G. Grier
G01 - MEASURING TESTING
Information
Patent Grant
Holographic characterization of irregular particles
Patent number
11,543,338
Issue date
Jan 3, 2023
New York University
David G. Grier
G01 - MEASURING TESTING
Information
Patent Grant
Holographic characterization of protein aggregates
Patent number
11,385,157
Issue date
Jul 12, 2022
New York University
David G. Grier
G01 - MEASURING TESTING
Information
Patent Grant
Holographic characterization of protein aggregates
Patent number
11,346,761
Issue date
May 31, 2022
New York University
David G. Grier
G01 - MEASURING TESTING
Information
Patent Grant
Holographic detection and characterization of large impurity partic...
Patent number
10,641,696
Issue date
May 5, 2020
New York University
David B. Ruffner
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION OF IRREGULAR PARTICLES
Publication number
20230213425
Publication date
Jul 6, 2023
NEW YORK UNIVERSITY
David G. GRIER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION OF PROTEIN AGGREGATES
Publication number
20220326130
Publication date
Oct 13, 2022
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION OF PROTEIN AGGREGATES
Publication number
20210199551
Publication date
Jul 1, 2021
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION OF IRREGULAR PARTICLES
Publication number
20210123848
Publication date
Apr 29, 2021
NEW YORK UNIVERSITY
David G. GRIER
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC CHARACTERIZATION USING HU MOMENTS
Publication number
20190234853
Publication date
Aug 1, 2019
SPHERYX, INC.
David B. RUFFNER
G01 - MEASURING TESTING
Information
Patent Application
HOLOGRAPHIC DETECTION AND CHARACTERIZATION OF LARGE IMPURITY PARTIC...
Publication number
20180252628
Publication date
Sep 6, 2018
NEW YORK UNIVERSITY
David B. RUFFNER
G01 - MEASURING TESTING