Lee Chahn

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 11,798,780
- Issue date Oct 24, 2023
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,239,052
- Issue date Feb 1, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle ray device and cross-sectional shape estimation pr...
- Patent number 11,133,147
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle ray device and cross-sectional shape estimation pr...
- Patent number 11,101,100
- Issue date Aug 24, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,720,306
- Issue date Jul 21, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and pattern measurement device
- Patent number 10,290,464
- Issue date May 14, 2019
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle beam device
- Patent number 10,249,474
- Issue date Apr 2, 2019
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,786,468
- Issue date Oct 10, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,697,987
- Issue date Jul 4, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 9,472,376
- Issue date Oct 18, 2016
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- G01 - MEASURING TESTING
Information Patent Grant
Electron beam irradiation method and scanning electronic microscope
- Patent number 9,257,259
- Issue date Feb 9, 2016
- Hitachi High-Technologies Corporation
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 7,158,893
- Issue date Jan 2, 2007
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Covalently bonded catalyst carrier and catalytic component
- Patent number 7,108,939
- Issue date Sep 19, 2006
- Hitachi, Ltd.
- Shuichi Suzuki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Catalytic material, electrode, and fuel cell using the same
- Patent number 7,105,246
- Issue date Sep 12, 2006
- Hiatchi Ltd.
- Shuichi Suzuki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 6,907,352
- Issue date Jun 14, 2005
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 6,745,134
- Issue date Jun 1, 2004
- Hitachi, Ltd.
- Kinya Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography apparatus, lithography method and method of manufacturi...
- Patent number 6,635,403
- Issue date Oct 21, 2003
- Hitachi, Ltd.
- Akihiro Miyauchi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Printer device
- Patent number 6,328,426
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Lee Chahn
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device
- Publication number 20220122804
- Publication date Apr 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200312615
- Publication date Oct 1, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE RAY DEVICE AND CROSS-SECTIONAL SHAPE ESTIMATION PR...
- Publication number 20200294756
- Publication date Sep 17, 2020
- Hitachi High-Technologies Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20190180979
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20190103250
- Publication date Apr 4, 2019
- Hitachi High-Technologies Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Pattern Measurement Device
- Publication number 20180182595
- Publication date Jun 28, 2018
- Hitachi High-Technologies Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20170278671
- Publication date Sep 28, 2017
- Hitachi High-Technologies Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20160240348
- Publication date Aug 18, 2016
- HITACHI HIGH-TECHNOLOGIES CORPORATION
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20150357154
- Publication date Dec 10, 2015
- Hitachi High-Technologies Corporation
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20150008322
- Publication date Jan 8, 2015
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM IRRADIATION METHOD AND SCANNING ELECTRONIC MICROSCOPE
- Publication number 20130187045
- Publication date Jul 25, 2013
- Hitachi High-Technologies Corporation
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Catalytic material, electrode, and fuel cell using the same
- Publication number 20050142429
- Publication date Jun 30, 2005
- Shuichi Suzuki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20050139761
- Publication date Jun 30, 2005
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Catalytic material, electrode, and fuel cell using the same
- Publication number 20040121221
- Publication date Jun 24, 2004
- Shuichi Suzuki
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
Valve-encased nozzle device and liquid handling device
- Publication number 20040050974
- Publication date Mar 18, 2004
- Chahn Lee
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20030236636
- Publication date Dec 25, 2003
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20030236634
- Publication date Dec 25, 2003
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lithography apparatus, lithography method and method of manufacturi...
- Publication number 20020101460
- Publication date Aug 1, 2002
- Akihiro Miyauchi
- B82 - NANO-TECHNOLOGY

Person

Patents Grantslast 30 patents

Charged particle beam device

Charged particle beam device

Charged particle ray device and cross-sectional shape estimation pr...

Charged particle ray device and cross-sectional shape estimation pr...

Charged particle beam device

Charged particle beam device and pattern measurement device

Charged particle beam device

Charged particle beam device

Charged particle beam device

Scanning electron microscope

Electron beam irradiation method and scanning electronic microscope

Mass spectrometric data analyzing method, mass spectrometric data a...

Covalently bonded catalyst carrier and catalytic component

Catalytic material, electrode, and fuel cell using the same

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometric data analyzing method, mass spectrometric data a...

Lithography apparatus, lithography method and method of manufacturi...

Printer device

Patents Applicationslast 30 patents

Charged Particle Beam Device

Charged Particle Beam Device

CHARGED PARTICLE RAY DEVICE AND CROSS-SECTIONAL SHAPE ESTIMATION PR...

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device

Charged Particle Beam Device and Pattern Measurement Device

Charged Particle Beam Device

Charged Particle Beam Device

Charged Particle Beam Device

SCANNING ELECTRON MICROSCOPE

ELECTRON BEAM IRRADIATION METHOD AND SCANNING ELECTRONIC MICROSCOPE

Catalytic material, electrode, and fuel cell using the same

Mass spectrometric data analyzing method, mass spectrometric data a...

Catalytic material, electrode, and fuel cell using the same

Valve-encased nozzle device and liquid handling device

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometric data analyzing method, mass spectrometric data a...

Lithography apparatus, lithography method and method of manufacturi...