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Lelan D. Warren
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Dallas, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus for automatically positioning electronic dice within comp...
Patent number
6,900,459
Issue date
May 31, 2005
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatically positioning electronic die within componen...
Patent number
6,492,187
Issue date
Dec 10, 2002
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method for positioning a semiconductor die within a temporary package
Patent number
6,353,312
Issue date
Mar 5, 2002
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automatically positioning electronic dice...
Patent number
6,210,984
Issue date
Apr 3, 2001
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automatically positioning electronic dice...
Patent number
6,150,828
Issue date
Nov 21, 2000
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automatically positioning electronic dice...
Patent number
6,064,194
Issue date
May 16, 2000
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automatically positioning electronic dice...
Patent number
5,955,877
Issue date
Sep 21, 1999
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automatically positioning electronic dice...
Patent number
5,894,218
Issue date
Apr 13, 1999
Micron Technology, Inc.
Warren M. Farnworth
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Method and apparatus for automatically positioning electronic dice...
Publication number
20030088973
Publication date
May 15, 2003
Warren M. Farnworth
G01 - MEASURING TESTING