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Leo A. Noel
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Essex Junction, VT, US
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last 30 patents
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Patent Grant
Testing high I/O integrated circuits on a low I/O tester
Patent number
6,260,163
Issue date
Jul 10, 2001
International Business Machines Corporation
Luke D. Lacroix
G01 - MEASURING TESTING
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Patent Grant
Device for indicating the fixability of a logic circuit
Patent number
6,185,709
Issue date
Feb 6, 2001
International Business Machines Corporation
Jeffrey Harris Dreibelbis
G11 - INFORMATION STORAGE
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Patent Grant
Dynamic test reordering
Patent number
6,078,189
Issue date
Jun 20, 2000
International Business Machines Corporation
Leo A. Noel
G01 - MEASURING TESTING