Leonard Hayden

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Line-reflect-reflect match calibration
- Patent number 7,908,107
- Issue date Mar 15, 2011
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Method of assembling a wafer probe
- Patent number 7,761,983
- Issue date Jul 27, 2010
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe
- Patent number 7,688,097
- Issue date Mar 30, 2010
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,626,379
- Issue date Dec 1, 2009
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,518,387
- Issue date Apr 14, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe
- Patent number 7,495,461
- Issue date Feb 24, 2009
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,489,149
- Issue date Feb 10, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe for testing a device under test
- Patent number 7,482,823
- Issue date Jan 27, 2009
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe
- Patent number 7,456,646
- Issue date Nov 25, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 7,453,276
- Issue date Nov 18, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe with low contact resistance for testing a device und...
- Patent number 7,436,194
- Issue date Oct 14, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,436,170
- Issue date Oct 14, 2008
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 7,417,446
- Issue date Aug 26, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide adapter for probe assembly having a detachable bias tee
- Patent number 7,352,258
- Issue date Apr 1, 2008
- Cascade Microtech, Inc.
- Mike Andrews
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Shielded probe for high-frequency testing of a device under test
- Patent number 7,304,488
- Issue date Dec 4, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 7,285,969
- Issue date Oct 23, 2007
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,250,752
- Issue date Jul 31, 2007
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe
- Patent number 7,233,160
- Issue date Jun 19, 2007
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 7,205,784
- Issue date Apr 17, 2007
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 7,190,181
- Issue date Mar 13, 2007
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 7,161,363
- Issue date Jan 9, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 7,075,320
- Issue date Jul 11, 2006
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 7,046,023
- Issue date May 16, 2006
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,842,024
- Issue date Jan 11, 2005
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe for testing a device under test
- Patent number 6,815,963
- Issue date Nov 9, 2004
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 6,806,724
- Issue date Oct 19, 2004
- Cascaded Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe for combined signals
- Patent number 6,724,205
- Issue date Apr 20, 2004
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,639,415
- Issue date Oct 28, 2003
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,489,789
- Issue date Dec 3, 2002
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Grant
Probe station having multiple enclosures
- Patent number 6,362,636
- Issue date Mar 26, 2002
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LINE-REFLECT-REFLECT MATCH CALIBRATION
- Publication number 20110178752
- Publication date Jul 21, 2011
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
WAFER PROBE
- Publication number 20100251545
- Publication date Oct 7, 2010
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for combined signals
- Publication number 20080074129
- Publication date Mar 27, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054929
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080054923
- Publication date Mar 6, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080048692
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20080048693
- Publication date Feb 28, 2008
- Cascade Microtech, Inc.
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe
- Publication number 20080042677
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe
- Publication number 20080045028
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe
- Publication number 20080042678
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for combined signals
- Publication number 20080042673
- Publication date Feb 21, 2008
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20080024149
- Publication date Jan 31, 2008
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Line-reflect-reflect match calibration
- Publication number 20080018343
- Publication date Jan 24, 2008
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Calibration system
- Publication number 20070294047
- Publication date Dec 20, 2007
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe
- Publication number 20070200580
- Publication date Aug 30, 2007
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for combined signals
- Publication number 20070159196
- Publication date Jul 12, 2007
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20070075716
- Publication date Apr 5, 2007
- Cascade Microtech, Inc.
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20060267610
- Publication date Nov 30, 2006
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe for combined signals
- Publication number 20060214677
- Publication date Sep 28, 2006
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for combined signals
- Publication number 20050151548
- Publication date Jul 14, 2005
- Cascade Microtech, Inc.
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20050062489
- Publication date Mar 24, 2005
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe for combined signals
- Publication number 20050024069
- Publication date Feb 3, 2005
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20040232927
- Publication date Nov 25, 2004
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Probe for combined signals
- Publication number 20040095156
- Publication date May 20, 2004
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
PROBE FOR COMBINED SIGNALS
- Publication number 20040090238
- Publication date May 13, 2004
- Leonard Hayden
- G01 - MEASURING TESTING
Information Patent Application
Probe station having multiple enclosures
- Publication number 20040027144
- Publication date Feb 12, 2004
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Probe for testing a device under test
- Publication number 20040004491
- Publication date Jan 8, 2004
- K. Reed Gleason
- G01 - MEASURING TESTING
Information Patent Application
Waveguide adapter
- Publication number 20030184404
- Publication date Oct 2, 2003
- Mike Andrews
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe station having multiple enclosures
- Publication number 20030038622
- Publication date Feb 27, 2003
- Ron A. Peters
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe
- Publication number 20020075019
- Publication date Jun 20, 2002
- Leonard Hayden
- G01 - MEASURING TESTING

Leonard Hayden

Person

Patents Grantslast 30 patents

Line-reflect-reflect match calibration

Method of assembling a wafer probe

Wafer probe

Probe station having multiple enclosures

Shielded probe for testing a device under test

Wafer probe

Shielded probe for testing a device under test

Shielded probe for testing a device under test

Wafer probe

Probe for combined signals

Shielded probe with low contact resistance for testing a device und...

Probe station having multiple enclosures

Probe for combined signals

Waveguide adapter for probe assembly having a detachable bias tee

Shielded probe for high-frequency testing of a device under test

Probe for combined signals

Probe station having multiple enclosures

Wafer probe

Probe for combined signals

Probe station having multiple enclosures

Probe for testing a device under test

Probe for combined signals

Probe for combined signals

Probe station having multiple enclosures

Probe for testing a device under test

Probe for combined signals

Probe for combined signals

Probe station having multiple enclosures

Probe station having multiple enclosures

Probe station having multiple enclosures

Patents Applicationslast 30 patents

LINE-REFLECT-REFLECT MATCH CALIBRATION

WAFER PROBE

Probe for combined signals

Probe for testing a device under test

Probe for testing a device under test

Probe for testing a device under test

Probe station having multiple enclosures

Wafer probe

Wafer probe

Wafer probe

Probe for combined signals

Probe for testing a device under test

Line-reflect-reflect match calibration

Calibration system

Wafer probe

Probe for combined signals

Probe for testing a device under test

Probe station having multiple enclosures

Probe for combined signals

Probe for combined signals

Probe station having multiple enclosures

Probe for combined signals

Probe for testing a device under test

Probe for combined signals

PROBE FOR COMBINED SIGNALS

Probe station having multiple enclosures

Probe for testing a device under test

Waveguide adapter

Probe station having multiple enclosures

Wafer probe