Leoncio D. Lopez

Person

Escondido, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
In-situ characterization of a solid-state light source
- Patent number 9,229,045
- Issue date Jan 5, 2016
- Oracle America, Inc.
- David K. McElfresh
- G01 - MEASURING TESTING
Information Patent Grant
Estimating ball-grid-array longevity in a computer system
- Patent number 8,798,944
- Issue date Aug 5, 2014
- Oracle America, Inc.
- Aleksey M. Urmanov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Estimating relative humidity inside a computer system
- Patent number 8,155,765
- Issue date Apr 10, 2012
- Oracle America, Inc.
- Leoncio D. Lopez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced characterization of electrical connection degradation
- Patent number 8,140,277
- Issue date Mar 20, 2012
- Oracle America, Inc.
- David K. McElfresh
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing electrical interconnects with swit...
- Patent number 7,982,468
- Issue date Jul 19, 2011
- Oracle America, Inc.
- Dan Vacar
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting multiple anomalies in a cluster...
- Patent number 7,870,440
- Issue date Jan 11, 2011
- Oracle America, Inc.
- Dan Vacar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing electrical interconnects
- Patent number 7,800,385
- Issue date Sep 21, 2010
- Oracle America, Inc.
- David K. McElfresh
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for performing a real-time root-cause analysis...
- Patent number 7,680,624
- Issue date Mar 16, 2010
- Sun Microsystems, Inc.
- David K. McElfresh
- G08 - SIGNALLING
Information Patent Grant
Technique for diagnosing and screening optical interconnect light s...
- Patent number 7,466,404
- Issue date Dec 16, 2008
- Sun Microsystems, Inc.
- Dan Vacar
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for proactive fault monitoring in interconnects
- Patent number 7,353,431
- Issue date Apr 1, 2008
- Sun Microsystems, Inc.
- Leoncio D. Lopez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Determining the quality and reliability of a component by monitorin...
- Patent number 7,283,919
- Issue date Oct 16, 2007
- Sun Microsystems, Inc.
- Kenny C. Gross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing degradation of components during reliability-evaluat...
- Patent number 7,216,062
- Issue date May 8, 2007
- Sun Microsystem, Inc.
- Dan Vacar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reliability prediction for complex components
- Patent number 7,184,932
- Issue date Feb 27, 2007
- Sun Microsystems, Inc.
- Leoncio D. Lopez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detecting degradation of components during reliability-evaluation s...
- Patent number 7,162,393
- Issue date Jan 9, 2007
- Sun Microsystems, Inc.
- Dan Vacar
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR THE ASSESSMENT OF COMPUTER SYSTEM RELIABILITY...
- Publication number 20130138419
- Publication date May 30, 2013
- Oracle International Corporation
- Leoncio D. Lopez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATING BALL-GRID-ARRAY LONGEVITY IN A COMPUTER SYSTEM
- Publication number 20100324882
- Publication date Dec 23, 2010
- SUN MICROSYSTEMS, INC.
- Aleksey M. Urmanov
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ENHANCED CHARACTERIZATION OF ELECTRICAL CONNECTION DEGRADATION
- Publication number 20100250158
- Publication date Sep 30, 2010
- SUN MICROSYSTEMS, INC.
- David K. McElfresh
- G01 - MEASURING TESTING
Information Patent Application
IN-SITU CHARACTERIZATION OF A SOLID-STATE LIGHT SOURCE
- Publication number 20100121593
- Publication date May 13, 2010
- SUN MICROSYSTEMS, INC.
- David K. McElfresh
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE RELIABILITY OF AN INTERCONNECT
- Publication number 20090326864
- Publication date Dec 31, 2009
- SUN MICROSYSTEMS, INC.
- David K. McElfresh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATING RELATIVE HUMIDITY INSIDE A COMPUTER SYSTEM
- Publication number 20090272176
- Publication date Nov 5, 2009
- SUN MICROSYSTEMS, INC.
- Leoncio D. Lopez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING MULTIPLE ANOMALIES IN A CLUSTER...
- Publication number 20090234484
- Publication date Sep 17, 2009
- SUN MICROSYSTEMS, INC.
- Dan Vacar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING ELECTRICAL INTERCONNECTS WITH SWIT...
- Publication number 20090230977
- Publication date Sep 17, 2009
- SUN MICROSYSTEMS, INC.
- Dan Vacar
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING ELECTRICAL INTERCONNECTS
- Publication number 20090230976
- Publication date Sep 17, 2009
- SUN MICROSYSTEMS, INC.
- David K. McElfresh
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for performing a real-time root-cause analysis...
- Publication number 20080252441
- Publication date Oct 16, 2008
- David K. McElfresh
- G08 - SIGNALLING
Information Patent Application
COMPONENT-ATTACH TEST VEHICLE
- Publication number 20080061812
- Publication date Mar 13, 2008
- SUN MICROSYSTEMS, INC.
- David K. McElfresh
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING THE QUALITY AND RELIABILITY OF A COMPONENT BY MONITORIN...
- Publication number 20070208538
- Publication date Sep 6, 2007
- Kenny C. Gross
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for proactive fault monitoring in interconnects
- Publication number 20060282705
- Publication date Dec 14, 2006
- Leoncio D. Lopez
- G06 - COMPUTING CALCULATING COUNTING

Leoncio D. Lopez

Person

Patents Grantslast 30 patents

In-situ characterization of a solid-state light source

Estimating ball-grid-array longevity in a computer system

Estimating relative humidity inside a computer system

Enhanced characterization of electrical connection degradation

Apparatus and method for testing electrical interconnects with swit...

Method and apparatus for detecting multiple anomalies in a cluster...

Apparatus and method for testing electrical interconnects

Method and apparatus for performing a real-time root-cause analysis...

Technique for diagnosing and screening optical interconnect light s...

Method and apparatus for proactive fault monitoring in interconnects

Determining the quality and reliability of a component by monitorin...

Characterizing degradation of components during reliability-evaluat...

Reliability prediction for complex components

Detecting degradation of components during reliability-evaluation s...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR THE ASSESSMENT OF COMPUTER SYSTEM RELIABILITY...

ESTIMATING BALL-GRID-ARRAY LONGEVITY IN A COMPUTER SYSTEM

ENHANCED CHARACTERIZATION OF ELECTRICAL CONNECTION DEGRADATION

IN-SITU CHARACTERIZATION OF A SOLID-STATE LIGHT SOURCE

DETERMINING THE RELIABILITY OF AN INTERCONNECT

ESTIMATING RELATIVE HUMIDITY INSIDE A COMPUTER SYSTEM

METHOD AND APPARATUS FOR DETECTING MULTIPLE ANOMALIES IN A CLUSTER...

APPARATUS AND METHOD FOR TESTING ELECTRICAL INTERCONNECTS WITH SWIT...

APPARATUS AND METHOD FOR TESTING ELECTRICAL INTERCONNECTS

Method and apparatus for performing a real-time root-cause analysis...

COMPONENT-ATTACH TEST VEHICLE

DETERMINING THE QUALITY AND RELIABILITY OF A COMPONENT BY MONITORIN...

Method and apparatus for proactive fault monitoring in interconnects