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Lester L. Larson
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Signal acquisition system having reduced probe loading of a device...
Patent number
8,723,530
Issue date
May 13, 2014
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Grant
Signal acquisition system having reduced probe loading of a device...
Patent number
8,564,308
Issue date
Oct 22, 2013
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Grant
Signal acquisition system having probe cable termination in a signa...
Patent number
8,456,173
Issue date
Jun 4, 2013
Tektronix, Inc.
Daniel G. Knierim
G01 - MEASURING TESTING
Information
Patent Grant
Signal acquisition system having reduced probe loading of a device...
Patent number
8,436,624
Issue date
May 7, 2013
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Grant
Signal acquisition system having a compensation digital filter
Patent number
8,278,940
Issue date
Oct 2, 2012
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Grant
Test and measurement instrument and method of calibrating
Patent number
8,103,473
Issue date
Jan 24, 2012
Tektronix, Inc.
Ronald A. Acuff
G01 - MEASURING TESTING
Information
Patent Grant
Capturing both digital and analog forms of a signal through the sam...
Patent number
6,847,199
Issue date
Jan 25, 2005
Tektronix, Inc.
A. Roy Kaufman
G01 - MEASURING TESTING
Information
Patent Grant
Multi-channel, low input capacitance signal probe and probe head
Patent number
6,781,391
Issue date
Aug 24, 2004
Tektronix, Inc.
Gary W. Reed
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE...
Publication number
20130221985
Publication date
Aug 29, 2013
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
Signal Acquisition System Having a Compensation Digital Filter
Publication number
20110074391
Publication date
Mar 31, 2011
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
Low Capacitance Signal Acquisition System
Publication number
20110074441
Publication date
Mar 31, 2011
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
Publication number
20110074392
Publication date
Mar 31, 2011
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
Signal Acquisition System Having Probe Cable Termination in a Signa...
Publication number
20110074389
Publication date
Mar 31, 2011
Tektronix, Inc.
Daniel G. Knierim
G01 - MEASURING TESTING
Information
Patent Application
Signal Acquisition System Having Reduced Probe Loading of a Device...
Publication number
20110074390
Publication date
Mar 31, 2011
Tektronix, Inc.
Josiah A. Bartlett
G01 - MEASURING TESTING
Information
Patent Application
CHANNEL RECONFIGURABLE LOGIC ANALYZER
Publication number
20090125269
Publication date
May 14, 2009
Tektronix, Inc.
Ronald Arthur ACUFF
G01 - MEASURING TESTING
Information
Patent Application
Capturing both digital and analog forms of a signal through the sam...
Publication number
20030160625
Publication date
Aug 28, 2003
A. Roy Kaufman
G01 - MEASURING TESTING
Information
Patent Application
Multi-channel, low input capacitance signal probe and probe head
Publication number
20030107388
Publication date
Jun 12, 2003
Gary W. Reed
G01 - MEASURING TESTING