Leung Ling (Alan) PUN

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Hong Kong, HK

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Patents Grantslast 30 patents

Information Patent Grant
Differential temperature sensor with sensitivity set by current-mir...
- Patent number 9,638,584
- Issue date May 2, 2017
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Chun Fai Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CMOS temperature sensor with sensitivity set by current-mirror and...
- Patent number 8,864,377
- Issue date Oct 21, 2014
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Chun Fai Wong
- G01 - MEASURING TESTING
Information Patent Grant
Diode-less full-wave rectifier for low-power on-chip AC-DC conversion
- Patent number 8,797,776
- Issue date Aug 5, 2014
- Hong Kong Applied Science and Technology Research Institute Co., Ltd.
- Kwok Kuen (David) Kwong
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Amplitude-shift-keying (ASK) envelope detector and demodulation cir...
- Patent number 8,711,982
- Issue date Apr 29, 2014
- Hong Kong Applied Science & Technology Research Institute Company, Ltd.
- Guangjie Cai
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Differential Temperature Sensor with Sensitivity Set by Current-Mir...
- Publication number 20140362887
- Publication date Dec 11, 2014
- Chun Fai WONG
- G01 - MEASURING TESTING
Information Patent Application
Diode-Less Full-Wave Rectifier for Low-Power On-Chip AC-DC Conversion
- Publication number 20140104909
- Publication date Apr 17, 2014
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Kwok Kuen (David) KWONG
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CMOS Temperature Sensor with Sensitivity Set by Current-Mirror and...
- Publication number 20130235903
- Publication date Sep 12, 2013
- Hong Kong Applied Science and Technology Research Institute Company Limited
- Chun Fai WONG
- G01 - MEASURING TESTING