Leyue Jiang

Person

Wuxi, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Single proof mass based three-axis accelerometer
- Patent number 11,493,533
- Issue date Nov 8, 2022
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Single proof mass based three-axis accelerometer
- Patent number 11,150,265
- Issue date Oct 19, 2021
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Integrated current sensor
- Patent number 11,016,124
- Issue date May 25, 2021
- ACEINNA TRANSDUCER SYSTEMS CO, LTD.
- Dalai Li
- G01 - MEASURING TESTING
Information Patent Grant
Linearity compensation circuit and sensing apparatus using the same
- Patent number 10,914,792
- Issue date Feb 9, 2021
- ACEINNA TRANSDUCER SYSTEMS CO., LTD.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Method for wafer-level chip scale package testing
- Patent number 9,676,619
- Issue date Jun 13, 2017
- MEMSIC SEMICONDUCTOR (WUXI) CO., LTD.
- Yang Zhao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Monolithic three-axis magnetic field sensor
- Patent number 9,658,298
- Issue date May 23, 2017
- Memsic, Inc.
- Yongyao Cai
- G01 - MEASURING TESTING
Information Patent Grant
Planar three-axis magnetometer
- Patent number 9,116,198
- Issue date Aug 25, 2015
- Memsic, Inc.
- Yongyao Cai
- G01 - MEASURING TESTING
Information Patent Grant
Z-axis capacitive accelerometer
- Patent number 8,701,490
- Issue date Apr 22, 2014
- Memsic, Inc.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Single chip tri-axis accelerometer
- Patent number 7,424,826
- Issue date Sep 16, 2008
- Memsic, Inc.
- Yaping Hua
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER
- Publication number 20210405084
- Publication date Dec 30, 2021
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER
- Publication number 20210132107
- Publication date May 6, 2021
- MEMSIC Semiconductor (TIANJIN) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
COIL AND A MANUFACTURING METHOD THEREOF
- Publication number 20210035735
- Publication date Feb 4, 2021
- ACEINNA Transducer Systems Co., Ltd.
- Leyue Jiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CURRENT SENSOR
- Publication number 20200209285
- Publication date Jul 2, 2020
- ACEINNA Transducer Systems Co., Ltd.
- Dalai Li
- G01 - MEASURING TESTING
Information Patent Application
GLASS ISOLATION DEVICE AND A MANUFACTURING METHOD THEREOF, AND A CU...
- Publication number 20200209286
- Publication date Jul 2, 2020
- ACEINNA Transducer Systems Co., Ltd.
- Dalai Li
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Magnetic Sensor Device, Self-Calibration Methods And Current Sensor
- Publication number 20180372810
- Publication date Dec 27, 2018
- ACEINNA Transducer Systems Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
Linearity Compensation Circuit And Sensing Apparatus Using The Same
- Publication number 20180306871
- Publication date Oct 25, 2018
- ACEINNA Transducer Systems Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Field Sensor With Three-Dimensional Spiral Reset Coil
- Publication number 20170115363
- Publication date Apr 27, 2017
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
Method For Wafer-Level Chip Scale Package Testing
- Publication number 20170113929
- Publication date Apr 27, 2017
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Yang Zhao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Magnetic Field Sensor With Integrated Self-Test Reset Wire
- Publication number 20170115360
- Publication date Apr 27, 2017
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
Anisotropic Magnetoresistance Sensor
- Publication number 20160313412
- Publication date Oct 27, 2016
- Memsic Semiconductor (Wuxi) Co., Ltd.
- Dalai Li
- G01 - MEASURING TESTING
Information Patent Application
MONOLITHIC THREE-AXIS MAGNETIC FIELD SENSOR
- Publication number 20150285873
- Publication date Oct 8, 2015
- MEMSIC, INC.
- Yongyao Cai
- G01 - MEASURING TESTING
Information Patent Application
PLANAR THREE-AXIS MAGNETOMETER
- Publication number 20130265039
- Publication date Oct 10, 2013
- Yongyao Cai
- G01 - MEASURING TESTING
Information Patent Application
FOLDABLE SUBSTRATE
- Publication number 20130249542
- Publication date Sep 26, 2013
- Yang Zhao
- B32 - LAYERED PRODUCTS
Information Patent Application
MONOLITHIC TRI-AXIS AMR SENSOR AND MANUFACTURING METHOD THEREOF
- Publication number 20120206137
- Publication date Aug 16, 2012
- MEMSIC, INC.
- Yongyao Cai
- G01 - MEASURING TESTING
Information Patent Application
Z-AXIS CAPACITIVE ACCELEROMETER
- Publication number 20120125103
- Publication date May 24, 2012
- MEMSIC, INC.
- Leyue Jiang
- G01 - MEASURING TESTING
Information Patent Application
HIGHLY SENSITIVE CAPACITIVE SENSOR AND METHODS OF MANUFACTURING THE...
- Publication number 20120048019
- Publication date Mar 1, 2012
- Hanqin Zhou
- G01 - MEASURING TESTING
Information Patent Application
Single chip tri-axis accelerometer
- Publication number 20070101813
- Publication date May 10, 2007
- Memsic, Inc.
- Yaping Hua
- G01 - MEASURING TESTING

Leyue Jiang

Person

Patents Grantslast 30 patents

Single proof mass based three-axis accelerometer

Single proof mass based three-axis accelerometer

Integrated current sensor

Linearity compensation circuit and sensing apparatus using the same

Method for wafer-level chip scale package testing

Monolithic three-axis magnetic field sensor

Planar three-axis magnetometer

Z-axis capacitive accelerometer

Single chip tri-axis accelerometer

Patents Applicationslast 30 patents

SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER

SINGLE PROOF MASS BASED THREE-AXIS ACCELEROMETER

COIL AND A MANUFACTURING METHOD THEREOF

INTEGRATED CURRENT SENSOR

GLASS ISOLATION DEVICE AND A MANUFACTURING METHOD THEREOF, AND A CU...

Magnetic Sensor Device, Self-Calibration Methods And Current Sensor

Linearity Compensation Circuit And Sensing Apparatus Using The Same

Magnetic Field Sensor With Three-Dimensional Spiral Reset Coil

Method For Wafer-Level Chip Scale Package Testing

Magnetic Field Sensor With Integrated Self-Test Reset Wire

Anisotropic Magnetoresistance Sensor

MONOLITHIC THREE-AXIS MAGNETIC FIELD SENSOR

PLANAR THREE-AXIS MAGNETOMETER

FOLDABLE SUBSTRATE

MONOLITHIC TRI-AXIS AMR SENSOR AND MANUFACTURING METHOD THEREOF

Z-AXIS CAPACITIVE ACCELEROMETER

HIGHLY SENSITIVE CAPACITIVE SENSOR AND METHODS OF MANUFACTURING THE...

Single chip tri-axis accelerometer