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Liang-Kai Han
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Fishkill, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Deep trench isolation of embedded DRAM for improved latch-up immunity
Patent number
6,885,080
Issue date
Apr 26, 2005
International Business Machines Corporation
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of providing variant fills in semiconductor trenches
Patent number
6,410,402
Issue date
Jun 25, 2002
International Business Machines Corporation
Jay Harrington
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Nitrogen co-implantation to form shallow junction-extensions of p-t...
Patent number
6,369,434
Issue date
Apr 9, 2002
International Business Machines Corporation
Kai Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating different gate oxide thicknesses within the...
Patent number
6,335,262
Issue date
Jan 1, 2002
International Business Machines Corporation
Scott W. Crowder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Self-aligned deep trench isolation to shallow trench isolation
Patent number
6,297,127
Issue date
Oct 2, 2001
International Business Machines Corporation
Bomy A. Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiple thickness of gate oxide
Patent number
6,258,673
Issue date
Jul 10, 2001
International Business Machines Corporation
Kevin M. Houlihan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low programming voltage anti-fuse
Patent number
6,096,580
Issue date
Aug 1, 2000
International Business Machines Corporation
S. Sundar Kumar Iyer
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DEEP TRENCH ISOLATION OF EMBEDDED DRAM FOR IMPROVED LATCH-UP IMMUNITY
Publication number
20050106836
Publication date
May 19, 2005
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Deep trench isolation of embedded DRAM for improved latch-up immunity
Publication number
20030162400
Publication date
Aug 28, 2003
International Business Machines Corporation
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for fabricating different gate oxide thickness within the sa...
Publication number
20030094660
Publication date
May 22, 2003
Scott W. Crowder
H01 - BASIC ELECTRIC ELEMENTS