Lianjun Liu

Person

Chandler, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor device and method of fabrication
- Patent number 11,383,973
- Issue date Jul 12, 2022
- NXP USA, INC.
- Peng Shao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Structure and methodology for detecting defects during MEMS device...
- Patent number 11,377,348
- Issue date Jul 5, 2022
- NXP USA, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Integrating diverse sensors in a single semiconductor device
- Patent number 11,021,363
- Issue date Jun 1, 2021
- NXP USA, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Structure and methodology for detecting defects during MEMS device...
- Patent number 10,941,037
- Issue date Mar 9, 2021
- NXP USA, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Through substrate via (TSV) and method therefor
- Patent number 10,546,779
- Issue date Jan 28, 2020
- NXP USA, INC.
- Qing Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrating diverse sensors in a single semiconductor device
- Patent number 10,364,140
- Issue date Jul 30, 2019
- NXP USA, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Pressure sensor having a multiple wheatstone bridge configuration o...
- Patent number 10,302,514
- Issue date May 28, 2019
- NXP USA, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Signal interface circuit and pressure sensor system including same
- Patent number 10,215,653
- Issue date Feb 26, 2019
- NXP USA, INC.
- Paige M. Holm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Through substrate via (TSV) and method therefor
- Patent number 10,157,792
- Issue date Dec 18, 2018
- NXP USA, INC.
- Qing Zhang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field sensor with permanent magnet biasing
- Patent number 10,145,907
- Issue date Dec 4, 2018
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Method for selective etching using dry film photoresist
- Patent number 9,960,081
- Issue date May 1, 2018
- NXP USA, INC.
- Colin Bryant Stevens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic field sensor with multiple axis sense capability
- Patent number 9,933,496
- Issue date Apr 3, 2018
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical system devices having crack resistant membra...
- Patent number 9,926,187
- Issue date Mar 27, 2018
- NXP USA, INC.
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Magnetic field sensor with permanent magnet biasing
- Patent number 9,897,667
- Issue date Feb 20, 2018
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Corruption detection and smart reset of ferromagnetic structures in...
- Patent number 9,857,435
- Issue date Jan 2, 2018
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with multiple sense layer magnetization orien...
- Patent number 9,841,469
- Issue date Dec 12, 2017
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field programming of electronic devices on a wafer
- Patent number 9,824,774
- Issue date Nov 21, 2017
- NXP USA, INC.
- Philippe Lance
- G11 - INFORMATION STORAGE
Information Patent Grant
CMOS and pressure sensor integrated on a chip and fabrication method
- Patent number 9,790,082
- Issue date Oct 17, 2017
- NXP USA, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Actively preventing charge induced leakage of semiconductor devices
- Patent number 9,790,085
- Issue date Oct 17, 2017
- NXP USA, INC.
- Dubravka Bilic
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Electric field sensor, system, and method for programming electroni...
- Patent number 9,784,787
- Issue date Oct 10, 2017
- NXP USA, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for reset and stabilization control of a magnetic sensor
- Patent number 9,766,301
- Issue date Sep 19, 2017
- EVERSPIN TECHNOLOGIES, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with skewed sense magnetization of sense layer
- Patent number 9,739,842
- Issue date Aug 22, 2017
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Sensor package including a magnetic field sensor and a continuous c...
- Patent number 9,720,051
- Issue date Aug 1, 2017
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor with structure for reconditioning magnetic po...
- Patent number 9,664,755
- Issue date May 30, 2017
- NXP USA, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Grant
Optical programming of electronic devices on a wafer
- Patent number 9,607,911
- Issue date Mar 28, 2017
- NXP USA, INC.
- Lianjun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe card and method for testing magnetic sensors
- Patent number 9,606,144
- Issue date Mar 28, 2017
- EVERSPIN TECHNOLOGIES, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for resetting a Z-axis sensor flux guide
- Patent number 9,588,211
- Issue date Mar 7, 2017
- EVERSPIN TECHNOLOGIES, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Microelectromechanical system devices having through substrate vias...
- Patent number 9,469,523
- Issue date Oct 18, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Method of making contact posts for a microelectromechanical device
- Patent number 9,343,242
- Issue date May 17, 2016
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Through substrate via with diffused conductive component
- Patent number 9,318,376
- Issue date Apr 19, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Paige M Holm
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEMS Device and Fabrication Process with Reduced Z-Axis Stiction
- Publication number 20240375937
- Publication date Nov 14, 2024
- NXP USA, Inc.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SENSOR DEVICE AND METHOD OF FABRICATION
- Publication number 20210221677
- Publication date Jul 22, 2021
- NXP USA, Inc.
- Peng Shao
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...
- Publication number 20210155474
- Publication date May 27, 2021
- NXP USA, Inc.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...
- Publication number 20200207618
- Publication date Jul 2, 2020
- NXP USA, Inc.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INTEGRATING DIVERSE SENSORS IN A SINGLE SEMICONDUCTOR DEVICE
- Publication number 20190292042
- Publication date Sep 26, 2019
- NXP USA,INC.
- LIANJUN LIU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MOTION TRIGGERED SYSTEM POWER UP
- Publication number 20190092104
- Publication date Mar 28, 2019
- NXP USA, Inc.
- Firoz Ahmed
- B60 - VEHICLES IN GENERAL
Information Patent Application
THROUGH SUBSTRATE VIA (TSV) AND METHOD THEREFOR
- Publication number 20190074220
- Publication date Mar 7, 2019
- NXP USA, Inc.
- QING ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SIGNAL INTERFACE CIRCUIT AND PRESSURE SENSOR SYSTEM INCLUDING SAME
- Publication number 20180292280
- Publication date Oct 11, 2018
- NXP USA, Inc.
- Paige M. Holm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRESSURE SENSOR HAVING A MULTIPLE WHEATSTONE BRIDGE CONFIGURATION O...
- Publication number 20180172533
- Publication date Jun 21, 2018
- NXP USA, Inc.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Application
THROUGH SUBSTRATE VIA (TSV) AND METHOD THEREFOR
- Publication number 20180122698
- Publication date May 3, 2018
- FREESCALE SEMICONDUCTOR, INC.
- QING ZHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR CHARACTERIZING CRITICAL PARAMETERS RESULTING...
- Publication number 20180053698
- Publication date Feb 22, 2018
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...
- Publication number 20170341926
- Publication date Nov 30, 2017
- Chad S Dawson
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MAGNETIC FIELD SENSOR WITH MULTIPLE AXIS SENSE CAPABILITY
- Publication number 20170307697
- Publication date Oct 26, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH PERMANENT MAGNET BIASING
- Publication number 20170293001
- Publication date Oct 12, 2017
- Freescale Semiconductor Inc.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH MULTIPLE SENSE LAYER MAGNETIZATION ORIEN...
- Publication number 20170212175
- Publication date Jul 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH PERMANENT MAGNET BIASING
- Publication number 20170212189
- Publication date Jul 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH SKEWED SENSE MAGNETIZATION OF SENSE LAYER
- Publication number 20170212176
- Publication date Jul 27, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATING DIVERSE SENSORS IN A SINGLE SEMICONDUCTOR DEVICE
- Publication number 20170081174
- Publication date Mar 23, 2017
- FREESCALE SEMICONDUCTOR, INC.
- LIANJUN LIU
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
CORRUPTION DETECTION AND SMART RESET OF FERROMAGNETIC STRUCTURES IN...
- Publication number 20160334472
- Publication date Nov 17, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC FIELD SENSOR, SYSTEM, AND METHOD FOR PROGRAMMING ELECTRONI...
- Publication number 20160306007
- Publication date Oct 20, 2016
- FREESCALE SEMICONDUCTOR, INC.
- LIANJUN LIU
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PROGRAMMING OF ELECTRONIC DEVICES ON A WAFER
- Publication number 20160276231
- Publication date Sep 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- LIANJUN LIU
- G01 - MEASURING TESTING
Information Patent Application
WAFER-LEVEL MAGNETIC FIELD PROGRAMMING OF MAGNETIC FIELD SENSORS
- Publication number 20160274188
- Publication date Sep 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- LIANJUN LIU
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD PROGRAMMING OF ELECTRONIC DEVICES ON A WAFER
- Publication number 20160276004
- Publication date Sep 22, 2016
- FREESCALE SEMICONDUCTOR, INC.
- Philippe LANCE
- G11 - INFORMATION STORAGE
Information Patent Application
APPARATUS AND METHOD FOR RESET AND STABILIZATION CONTROL OF A MAGNE...
- Publication number 20160084920
- Publication date Mar 24, 2016
- EVERSPIN TECHNOLOGIES, INC.
- Lianjun LIU
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR WITH Z-AXIS SELF-TEST CAPABILITY
- Publication number 20150346290
- Publication date Dec 3, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE HAVING CONDUCTIVE MICROSTRUCTURES LATERALLY SURROUNDED...
- Publication number 20150291414
- Publication date Oct 15, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
INERTIAL SENSOR WITH TRIM CAPACITANCE AND METHOD OF TRIMMING OFFSET
- Publication number 20150268268
- Publication date Sep 24, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Application
MICROELECTROMECHANICAL SYSTEM DEVICES HAVING THROUGH SUBSTRATE VIAS...
- Publication number 20150225229
- Publication date Aug 13, 2015
- Lianjun Liu
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PROBE CARD AND METHOD FOR TESTING MAGNETIC SENSORS
- Publication number 20150219689
- Publication date Aug 6, 2015
- EVERSPIN TECHNOLOGIES, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR RECONDITIONING Z-AXIS SENSOR FLUX GUIDES
- Publication number 20150204951
- Publication date Jul 23, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Paige M. Holm
- G01 - MEASURING TESTING

Lianjun Liu

Person

Patents Grantslast 30 patents

Sensor device and method of fabrication

Structure and methodology for detecting defects during MEMS device...

Integrating diverse sensors in a single semiconductor device

Structure and methodology for detecting defects during MEMS device...

Through substrate via (TSV) and method therefor

Integrating diverse sensors in a single semiconductor device

Pressure sensor having a multiple wheatstone bridge configuration o...

Signal interface circuit and pressure sensor system including same

Through substrate via (TSV) and method therefor

Magnetic field sensor with permanent magnet biasing

Method for selective etching using dry film photoresist

Magnetic field sensor with multiple axis sense capability

Microelectromechanical system devices having crack resistant membra...

Magnetic field sensor with permanent magnet biasing

Corruption detection and smart reset of ferromagnetic structures in...

Magnetic field sensor with multiple sense layer magnetization orien...

Magnetic field programming of electronic devices on a wafer

CMOS and pressure sensor integrated on a chip and fabrication method

Actively preventing charge induced leakage of semiconductor devices

Electric field sensor, system, and method for programming electroni...

Method for reset and stabilization control of a magnetic sensor

Magnetic field sensor with skewed sense magnetization of sense layer

Sensor package including a magnetic field sensor and a continuous c...

Magnetic field sensor with structure for reconditioning magnetic po...

Optical programming of electronic devices on a wafer

Probe card and method for testing magnetic sensors

Apparatus and method for resetting a Z-axis sensor flux guide

Microelectromechanical system devices having through substrate vias...

Method of making contact posts for a microelectromechanical device

Through substrate via with diffused conductive component

Patents Applicationslast 30 patents

MEMS Device and Fabrication Process with Reduced Z-Axis Stiction

SENSOR DEVICE AND METHOD OF FABRICATION

STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...

STRUCTURE AND METHODOLOGY FOR DETECTING DEFECTS DURING MEMS DEVICE...

INTEGRATING DIVERSE SENSORS IN A SINGLE SEMICONDUCTOR DEVICE

MOTION TRIGGERED SYSTEM POWER UP

THROUGH SUBSTRATE VIA (TSV) AND METHOD THEREFOR

SIGNAL INTERFACE CIRCUIT AND PRESSURE SENSOR SYSTEM INCLUDING SAME

PRESSURE SENSOR HAVING A MULTIPLE WHEATSTONE BRIDGE CONFIGURATION O...

THROUGH SUBSTRATE VIA (TSV) AND METHOD THEREFOR

SYSTEM AND METHOD FOR CHARACTERIZING CRITICAL PARAMETERS RESULTING...

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING CRACK RESISTANT MEMBRA...

MAGNETIC FIELD SENSOR WITH MULTIPLE AXIS SENSE CAPABILITY

MAGNETIC FIELD SENSOR WITH PERMANENT MAGNET BIASING

MAGNETIC FIELD SENSOR WITH MULTIPLE SENSE LAYER MAGNETIZATION ORIEN...

MAGNETIC FIELD SENSOR WITH PERMANENT MAGNET BIASING

MAGNETIC FIELD SENSOR WITH SKEWED SENSE MAGNETIZATION OF SENSE LAYER

INTEGRATING DIVERSE SENSORS IN A SINGLE SEMICONDUCTOR DEVICE

CORRUPTION DETECTION AND SMART RESET OF FERROMAGNETIC STRUCTURES IN...

ELECTRIC FIELD SENSOR, SYSTEM, AND METHOD FOR PROGRAMMING ELECTRONI...

OPTICAL PROGRAMMING OF ELECTRONIC DEVICES ON A WAFER

WAFER-LEVEL MAGNETIC FIELD PROGRAMMING OF MAGNETIC FIELD SENSORS

MAGNETIC FIELD PROGRAMMING OF ELECTRONIC DEVICES ON A WAFER

APPARATUS AND METHOD FOR RESET AND STABILIZATION CONTROL OF A MAGNE...

MAGNETIC FIELD SENSOR WITH Z-AXIS SELF-TEST CAPABILITY

MEMS DEVICE HAVING CONDUCTIVE MICROSTRUCTURES LATERALLY SURROUNDED...

INERTIAL SENSOR WITH TRIM CAPACITANCE AND METHOD OF TRIMMING OFFSET

MICROELECTROMECHANICAL SYSTEM DEVICES HAVING THROUGH SUBSTRATE VIAS...

PROBE CARD AND METHOD FOR TESTING MAGNETIC SENSORS

APPARATUS AND METHOD FOR RECONDITIONING Z-AXIS SENSOR FLUX GUIDES