Licai Jiang

Person

Auburn Hills, MI, US

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray inspecting device, X-ray thin film inspecting method, and met...
- Patent number 10,876,978
- Issue date Dec 29, 2020
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generator and x-ray analysis device
- Patent number 10,854,348
- Issue date Dec 1, 2020
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
- Patent number 10,436,723
- Issue date Oct 8, 2019
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray small angle optical system
- Patent number 10,429,325
- Issue date Oct 1, 2019
- Rigaku Corporation
- Kazuki Ito
- G01 - MEASURING TESTING
Information Patent Grant
High performance Kratky assembly
- Patent number 9,575,017
- Issue date Feb 21, 2017
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray apparatus, method of using the same and X-ray irradiation method
- Patent number 9,336,917
- Issue date May 10, 2016
- Rigaku Corporation
- Tetsuya Ozawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray generating apparatus
- Patent number 9,159,524
- Issue date Oct 13, 2015
- Rigaku Corporation
- Martin Horvarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray beam system offering 1D and 2D beams
- Patent number 9,031,203
- Issue date May 12, 2015
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Grant
Dual mode small angle scattering camera
- Patent number 9,014,335
- Issue date Apr 21, 2015
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scattering measurement device and X-ray scattering measuremen...
- Patent number 8,767,918
- Issue date Jul 1, 2014
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
Multiconfiguration X-ray optical system
- Patent number 8,249,220
- Issue date Aug 21, 2012
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multi-beam X-ray system
- Patent number 8,126,117
- Issue date Feb 28, 2012
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Crystallite size analysis method and apparatus using powder X-ray d...
- Patent number 8,111,807
- Issue date Feb 7, 2012
- Rigaku Corporation
- Takashi Ida
- G01 - MEASURING TESTING
Information Patent Grant
Two dimensional small angle X-Ray scattering camera
- Patent number 8,094,780
- Issue date Jan 10, 2012
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generator with polycapillary optic
- Patent number 7,933,383
- Issue date Apr 26, 2011
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Two-dimensional small angle x-ray scattering camera
- Patent number 7,734,011
- Issue date Jun 8, 2010
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
High intensity x-ray beam system
- Patent number 7,720,197
- Issue date May 18, 2010
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optic with varying focal points
- Patent number 7,706,503
- Issue date Apr 27, 2010
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical system with adjustable convergence
- Patent number 7,245,699
- Issue date Jul 17, 2007
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Two-dimensional small angle x-ray scattering camera
- Patent number 7,139,366
- Issue date Nov 21, 2006
- Osmic, Inc.
- Licai Jiang
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray optical device and multilayer mirror for small angle scatteri...
- Patent number 6,504,902
- Issue date Jan 7, 2003
- Rigaku Corporation
- Yoshio Iwasaki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Multilayer optics with adjustable working wavelength
- Patent number 6,421,417
- Issue date Jul 16, 2002
- Osmic, Inc.
- Licai Jiang
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray lens system
- Patent number 6,389,100
- Issue date May 14, 2002
- Osmic, Inc.
- Boris Verman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Optical scheme for high flux low-background two-dimensional small a...
- Patent number 6,330,301
- Issue date Dec 11, 2001
- Osmic, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with adjustable image distance
- Patent number 6,069,934
- Issue date May 30, 2000
- Osmic, Inc.
- Boris Verman
- G01 - MEASURING TESTING
Information Patent Grant
Single corner kirkpatrick-baez beam conditioning optic assembly
- Patent number 6,041,099
- Issue date Mar 21, 2000
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiple corner Kirkpatrick-Baez beam conditioning optic assembly
- Patent number 6,014,423
- Issue date Jan 11, 2000
- Osmic, Inc.
- George Gutman
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE
- Publication number 20190272929
- Publication date Sep 5, 2019
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...
- Publication number 20190227005
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTOMETER
- Publication number 20170191950
- Publication date Jul 6, 2017
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SMALL ANGLE OPTICAL SYSTEM
- Publication number 20170074809
- Publication date Mar 16, 2017
- Rigaku Corporation
- Kazuki ITO
- G01 - MEASURING TESTING
Information Patent Application
HIGH PERFORMANCE KRATKY ASSEMBLY
- Publication number 20150241366
- Publication date Aug 27, 2015
- Rigaku Innovative Technologies, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATING APPARATUS
- Publication number 20140105367
- Publication date Apr 17, 2014
- Rigaku Corporation
- Martin HORVARTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY BEAM SYSTEM OFFERING 1D AND 2D BEAMS
- Publication number 20130329861
- Publication date Dec 12, 2013
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
DUAL MODE SMALL ANGLE SCATTERING CAMERA
- Publication number 20130329858
- Publication date Dec 12, 2013
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING PATTERNED X-RAY OPTICAL ELEMENTS
- Publication number 20130164457
- Publication date Jun 27, 2013
- Rigaku Innovative Technologies, Inc.
- Bodo Ehlers
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-RAY SCATTERING MEASUREMENT DEVICE AND X-RAY SCATTERING MEASUREMEN...
- Publication number 20120051518
- Publication date Mar 1, 2012
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATOR WITH POLYCAPILLARY OPTIC
- Publication number 20110280530
- Publication date Nov 17, 2011
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD
- Publication number 20110268252
- Publication date Nov 3, 2011
- Rigaku Corporation
- Tetsuya Ozawa
- G01 - MEASURING TESTING
Information Patent Application
Multi-Beam X-Ray System
- Publication number 20110188636
- Publication date Aug 4, 2011
- Rigaku Innovative Technologies, Inc.
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
Multiconfiguration X-ray Optical System
- Publication number 20110085644
- Publication date Apr 14, 2011
- Rigaku Innovative Technology
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
CRYSTALLITE SIZE ANALYSIS METHOD AND APPARATUS USING POWDER X-RAY D...
- Publication number 20110064199
- Publication date Mar 17, 2011
- Rigaku Corporation
- Takashi IDA
- G01 - MEASURING TESTING
Information Patent Application
TWO DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA
- Publication number 20100284516
- Publication date Nov 11, 2010
- Osmic, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
HIGH INTENSITY X-RAY BEAM SYSTEM
- Publication number 20090296889
- Publication date Dec 3, 2009
- Licai Jiang
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY GENERATOR WITH POLYCAPILLARY OPTIC
- Publication number 20090279670
- Publication date Nov 12, 2009
- Boris Verman
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY OPTIC WITH VARYING FOCAL POINTS
- Publication number 20090129552
- Publication date May 21, 2009
- Licai Jiang
- B82 - NANO-TECHNOLOGY
Information Patent Application
TWO-DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA
- Publication number 20080069302
- Publication date Mar 20, 2008
- Osmic, Inc.
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
TWO-DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA
- Publication number 20060269045
- Publication date Nov 30, 2006
- Licai Jiang
- G01 - MEASURING TESTING
Information Patent Application
X-ray optical system with adjustable convergence
- Publication number 20040170250
- Publication date Sep 2, 2004
- Osmic, Inc.
- Boris Verman
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray lens system
- Publication number 20030128811
- Publication date Jul 10, 2003
- Osmic, Inc.
- Boris Verman
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MULTILAYER OPTICS WITH ADJUSTABLE WORKING WAVELENGTH
- Publication number 20020080916
- Publication date Jun 27, 2002
- LICAI JIANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY LENS SYSTEM
- Publication number 20020044626
- Publication date Apr 18, 2002
- BORIS VERMAN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Licai Jiang

Person

Patents Grantslast 30 patents

X-ray inspecting device, X-ray thin film inspecting method, and met...

X-ray generator and x-ray analysis device

X-ray diffractometer with multilayer reflection-type monochromator

X-ray small angle optical system

High performance Kratky assembly

X-ray apparatus, method of using the same and X-ray irradiation method

X-ray generating apparatus

X-ray beam system offering 1D and 2D beams

Dual mode small angle scattering camera

X-ray scattering measurement device and X-ray scattering measuremen...

Multiconfiguration X-ray optical system

Multi-beam X-ray system

Crystallite size analysis method and apparatus using powder X-ray d...

Two dimensional small angle X-Ray scattering camera

X-ray generator with polycapillary optic

Two-dimensional small angle x-ray scattering camera

High intensity x-ray beam system

X-ray optic with varying focal points

X-ray optical system with adjustable convergence

Two-dimensional small angle x-ray scattering camera

X-ray optical device and multilayer mirror for small angle scatteri...

Multilayer optics with adjustable working wavelength

X-ray lens system

Optical scheme for high flux low-background two-dimensional small a...

X-ray diffractometer with adjustable image distance

Single corner kirkpatrick-baez beam conditioning optic assembly

Multiple corner Kirkpatrick-Baez beam conditioning optic assembly

Patents Applicationslast 30 patents

X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE

X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...

X-RAY DIFFRACTOMETER

X-RAY SMALL ANGLE OPTICAL SYSTEM

HIGH PERFORMANCE KRATKY ASSEMBLY

X-RAY GENERATING APPARATUS

X-RAY BEAM SYSTEM OFFERING 1D AND 2D BEAMS

DUAL MODE SMALL ANGLE SCATTERING CAMERA

METHOD OF MANUFACTURING PATTERNED X-RAY OPTICAL ELEMENTS

X-RAY SCATTERING MEASUREMENT DEVICE AND X-RAY SCATTERING MEASUREMEN...

X-RAY GENERATOR WITH POLYCAPILLARY OPTIC

X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD

Multi-Beam X-Ray System

Multiconfiguration X-ray Optical System

CRYSTALLITE SIZE ANALYSIS METHOD AND APPARATUS USING POWDER X-RAY D...

TWO DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA

HIGH INTENSITY X-RAY BEAM SYSTEM

X-RAY GENERATOR WITH POLYCAPILLARY OPTIC

X-RAY OPTIC WITH VARYING FOCAL POINTS

TWO-DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA

TWO-DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA

X-ray optical system with adjustable convergence

X-ray lens system

MULTILAYER OPTICS WITH ADJUSTABLE WORKING WAVELENGTH

X-RAY LENS SYSTEM