Lin Zhou

Person

LaGrangeville, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic real-time identification and presentation of analogies to...
- Patent number 10,915,819
- Issue date Feb 9, 2021
- International Business Machines Corporation
- Clifford A. Pickover
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for perceiving smell remotely
- Patent number 10,780,271
- Issue date Sep 22, 2020
- Lucas Mingzhi Zhou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reducing distractions caused by user devices in group settings
- Patent number 9,756,552
- Issue date Sep 5, 2017
- International Business Machines Corporation
- Clifford A. Pickover
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wafer thinning endpoint detection for TSV technology
- Patent number 9,349,661
- Issue date May 24, 2016
- GLOBALFOUNDRIES Inc.
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Alignment correction system and method of use
- Patent number 8,736,275
- Issue date May 27, 2014
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Grant
Alignment correction system and method of use
- Patent number 8,680,871
- Issue date Mar 25, 2014
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Grant
Alignment correction system and method of use
- Patent number 8,451,008
- Issue date May 28, 2013
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Grant
Monitoring stage alignment and related stage and calibration target
- Patent number 8,411,270
- Issue date Apr 2, 2013
- International Business Machines Corporation
- Shahin Zangooie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characterizing films using optical filter pseudo substrate
- Patent number 8,080,849
- Issue date Dec 20, 2011
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Grant
Quantification of adsorbed molecular contaminant using thin film me...
- Patent number 7,831,395
- Issue date Nov 9, 2010
- International Business Machines Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Wafer and stage alignment using photonic devices
- Patent number 7,808,657
- Issue date Oct 5, 2010
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Grant
Determining angle of incidence with respect to workpiece
- Patent number 7,742,160
- Issue date Jun 22, 2010
- International Business Machines Corporation
- Clemente Bottini
- G01 - MEASURING TESTING
Information Patent Grant
Metrology tool recipe validator using best known methods
- Patent number 7,716,009
- Issue date May 11, 2010
- International Business Machines Corporation
- Ejaj Ahmed
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Determining azimuth angle of incident beam to wafer
- Patent number 7,646,491
- Issue date Jan 12, 2010
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Grant
Alignment correction system and method of use
- Patent number 7,592,817
- Issue date Sep 22, 2009
- International Business Machines Corporation
- Robert J. Foster
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe apparatus with in-situ measurement probe tip cleanin...
- Patent number 7,569,112
- Issue date Aug 4, 2009
- International Business Machines Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Flipping stage arrangement for reduced wafer contamination cross se...
- Patent number 7,542,136
- Issue date Jun 2, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Grant
Determining root cause for alarm in processing system
- Patent number 7,535,349
- Issue date May 19, 2009
- International Business Machines Corporation
- Dmitriy Shneyder
- G05 - CONTROLLING REGULATING
Information Patent Grant
Charged beam apparatus and method that provide charged beam aerial...
- Patent number 7,485,859
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Structure, system and method for dimensionally unstable layer dimen...
- Patent number 7,479,396
- Issue date Jan 20, 2009
- International Business Machines Corporation
- Lin Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical spot geometric parameter determination using calibration ta...
- Patent number 7,477,365
- Issue date Jan 13, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement of critical dimension and quantification of electron be...
- Patent number 7,397,252
- Issue date Jul 8, 2008
- International Business Machines Corporation
- Lin Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantification of adsorbed molecular contaminant using thin film me...
- Patent number 7,369,947
- Issue date May 6, 2008
- International Business Machines, Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Method of making electromagnetic wave shielded write and read wires...
- Patent number 7,325,294
- Issue date Feb 5, 2008
- International Business Machines Corporation
- Lin Zhou
- G11 - INFORMATION STORAGE
Information Patent Grant
Metrology tool recipe validator using best known methods
- Patent number 7,305,320
- Issue date Dec 4, 2007
- International Business Machines Corporation
- Ejaj Ahmed
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Metrology tool error log analysis methodology and system
- Patent number 7,187,993
- Issue date Mar 6, 2007
- International Business Machines Corporation
- Sarah A. Kay
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Metrology tool error log analysis methodology and system
- Patent number 7,065,425
- Issue date Jun 20, 2006
- Internaitonal Business Machines Corporation
- Sarah A. Kay
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Electromagnetic wave shielded write and read wires on a support for...
- Patent number 6,839,202
- Issue date Jan 4, 2005
- International Business Machines Corporation
- Lin Zhou
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Electromagnetic Wave and Energy Storage
- Publication number 20230155546
- Publication date May 18, 2023
- York Zhiyuan Zhou
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SYSTEM AND METHOD FOR PERCEIVING SMELL REMOTELY
- Publication number 20180110981
- Publication date Apr 26, 2018
- Lucas Mingzhi Zhou
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND SYSTEM FOR AUTOMATIC REAL-TIME IDENTIFICATION AND PRESEN...
- Publication number 20180005116
- Publication date Jan 4, 2018
- International Business Machines Corporation
- Clifford A. Pickover
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER THINNING ENDPOINT DETECTION FOR TSV TECHNOLOGY
- Publication number 20150206809
- Publication date Jul 23, 2015
- International Business Machines Corporation
- Hanyi Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20130245993
- Publication date Sep 19, 2013
- International Business Machines Corporation
- Robert J. FOSTER
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20130238112
- Publication date Sep 12, 2013
- International Business Machines Corporation
- Robert J. FOSTER
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE
- Publication number 20090312982
- Publication date Dec 17, 2009
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Application
MONITORING STAGE ALIGNMENT AND RELATED STAGE AND CALIBRATION TARGET
- Publication number 20090185183
- Publication date Jul 23, 2009
- International Business Machines Corporation
- Shahin Zangooie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARACTERIZING FILMS USING OPTICAL FILTER PSEUDO SUBSTRATE
- Publication number 20090186427
- Publication date Jul 23, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING SIGNAL QUALITY OF OPTICAL METROLOGY TOOL
- Publication number 20090182529
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ANGLE OF INCIDENCE WITH RESPECT TO WORKPIECE
- Publication number 20090180108
- Publication date Jul 16, 2009
- International Business Machines Corporation
- Clemente Bottini
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SPOT GEOMETRIC PARAMETER DETERMINATION USING CALIBRATION TA...
- Publication number 20090027660
- Publication date Jan 29, 2009
- Shahin Zangooie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alignment Correction System and Method of Use
- Publication number 20090021236
- Publication date Jan 22, 2009
- International Business Machines Corporation
- Robert J. Foster
- G05 - CONTROLLING REGULATING
Information Patent Application
FLIPPING STAGE ARRANGEMENT FOR REDUCED WAFER CONTAMINATION CROSS SE...
- Publication number 20090009763
- Publication date Jan 8, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
WAFER AND STAGE ALIGNMENT USING PHOTONIC DEVICES
- Publication number 20090002721
- Publication date Jan 1, 2009
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING AZIMUTH ANGLE OF INCIDENT BEAM TO WAFER
- Publication number 20080316471
- Publication date Dec 25, 2008
- International Business Machines Corporation
- Shahin Zangooie
- G01 - MEASURING TESTING
Information Patent Application
CHARGED BEAM APPARATUS AND METHOD THAT PROVIDE CHARGED BEAM AERIAL...
- Publication number 20080258055
- Publication date Oct 23, 2008
- International Business Machines Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE APPARATUS WITH IN-SITU MEASUREMENT PROBE TIP CLEANIN...
- Publication number 20080223118
- Publication date Sep 18, 2008
- International Business Machines Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING TOOL SET MATCHING USING PRODUCTION DATA
- Publication number 20080201009
- Publication date Aug 21, 2008
- International Business Machines Corporation
- Andrew C. Brendler
- G05 - CONTROLLING REGULATING
Information Patent Application
QUANTIFICATION OF ADSORBED MOLECULAR CONTAMINANT USING THIN FILM ME...
- Publication number 20080154519
- Publication date Jun 26, 2008
- International Business Machines Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING ROOT CAUSE FOR ALARM IN PROCESSING SYSTEM
- Publication number 20080140225
- Publication date Jun 12, 2008
- International Business Machines Corporation
- Dmitriy Shneyder
- G05 - CONTROLLING REGULATING
Information Patent Application
MASK LAYER TRIM METHOD USING CHARGED PARTICLE BEAM EXPOSURE
- Publication number 20080138986
- Publication date Jun 12, 2008
- International Business Machines Corporation
- Lin Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT OF CRITICAL DIMENSION AND QUANTIFICATION OF ELECTRON BE...
- Publication number 20080067373
- Publication date Mar 20, 2008
- International Business Machines Corporation
- Lin Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS
- Publication number 20080065696
- Publication date Mar 13, 2008
- International Business Machines Corporation
- Ejaj Ahmed
- G05 - CONTROLLING REGULATING
Information Patent Application
Optical spot geometric parameter determination using calibration ta...
- Publication number 20080024781
- Publication date Jan 31, 2008
- International Business Machines Corporation
- Shahin Zangooie
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
QUANTIFICATION OF ADSORBED MOLECULAR CONTAMINANT USING THIN FILM ME...
- Publication number 20070283757
- Publication date Dec 13, 2007
- International Business Machines Corporation
- Lin Zhou
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS
- Publication number 20070192056
- Publication date Aug 16, 2007
- International Business Machines Corporation
- Ejaj Ahmed
- G05 - CONTROLLING REGULATING
Information Patent Application
Structure, system and method for dimensionally unstable layer dimen...
- Publication number 20070124108
- Publication date May 31, 2007
- International Business Machines Corporation
- Lin Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Metrology tool error log analysis methodology and system
- Publication number 20060293778
- Publication date Dec 28, 2006
- International Business Machines Corporation
- Sarah A. Kay
- G05 - CONTROLLING REGULATING
Information Patent Application
Method of making electromagnetic wave shielded write and read wires...
- Publication number 20050088783
- Publication date Apr 28, 2005
- Lin Zhou
- G11 - INFORMATION STORAGE

Person

Patents Grantslast 30 patents

Automatic real-time identification and presentation of analogies to...

System and method for perceiving smell remotely

Reducing distractions caused by user devices in group settings

Wafer thinning endpoint detection for TSV technology

Alignment correction system and method of use

Alignment correction system and method of use

Alignment correction system and method of use

Monitoring stage alignment and related stage and calibration target

Characterizing films using optical filter pseudo substrate

Quantification of adsorbed molecular contaminant using thin film me...

Wafer and stage alignment using photonic devices

Determining angle of incidence with respect to workpiece

Metrology tool recipe validator using best known methods

Determining azimuth angle of incident beam to wafer

Alignment correction system and method of use

Scanning probe apparatus with in-situ measurement probe tip cleanin...

Flipping stage arrangement for reduced wafer contamination cross se...

Determining root cause for alarm in processing system

Charged beam apparatus and method that provide charged beam aerial...

Structure, system and method for dimensionally unstable layer dimen...

Optical spot geometric parameter determination using calibration ta...

Measurement of critical dimension and quantification of electron be...

Quantification of adsorbed molecular contaminant using thin film me...

Method of making electromagnetic wave shielded write and read wires...

Metrology tool recipe validator using best known methods

Metrology tool error log analysis methodology and system

Metrology tool error log analysis methodology and system

Electromagnetic wave shielded write and read wires on a support for...

Patents Applicationslast 30 patents

Electromagnetic Wave and Energy Storage

SYSTEM AND METHOD FOR PERCEIVING SMELL REMOTELY

METHOD AND SYSTEM FOR AUTOMATIC REAL-TIME IDENTIFICATION AND PRESEN...

WAFER THINNING ENDPOINT DETECTION FOR TSV TECHNOLOGY

ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE

ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE

ALIGNMENT CORRECTION SYSTEM AND METHOD OF USE

MONITORING STAGE ALIGNMENT AND RELATED STAGE AND CALIBRATION TARGET

CHARACTERIZING FILMS USING OPTICAL FILTER PSEUDO SUBSTRATE

DETERMINING SIGNAL QUALITY OF OPTICAL METROLOGY TOOL

DETERMINING ANGLE OF INCIDENCE WITH RESPECT TO WORKPIECE

OPTICAL SPOT GEOMETRIC PARAMETER DETERMINATION USING CALIBRATION TA...

Alignment Correction System and Method of Use

FLIPPING STAGE ARRANGEMENT FOR REDUCED WAFER CONTAMINATION CROSS SE...

WAFER AND STAGE ALIGNMENT USING PHOTONIC DEVICES

DETERMINING AZIMUTH ANGLE OF INCIDENT BEAM TO WAFER

CHARGED BEAM APPARATUS AND METHOD THAT PROVIDE CHARGED BEAM AERIAL...

SCANNING PROBE APPARATUS WITH IN-SITU MEASUREMENT PROBE TIP CLEANIN...

DETERMINING TOOL SET MATCHING USING PRODUCTION DATA

QUANTIFICATION OF ADSORBED MOLECULAR CONTAMINANT USING THIN FILM ME...

DETERMINING ROOT CAUSE FOR ALARM IN PROCESSING SYSTEM

MASK LAYER TRIM METHOD USING CHARGED PARTICLE BEAM EXPOSURE

MEASUREMENT OF CRITICAL DIMENSION AND QUANTIFICATION OF ELECTRON BE...

METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS

Optical spot geometric parameter determination using calibration ta...

QUANTIFICATION OF ADSORBED MOLECULAR CONTAMINANT USING THIN FILM ME...

METROLOGY TOOL RECIPE VALIDATOR USING BEST KNOWN METHODS

Structure, system and method for dimensionally unstable layer dimen...

Metrology tool error log analysis methodology and system

Method of making electromagnetic wave shielded write and read wires...