Ling Kuey Yang

Person

Changhua, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Transistor structure and manufacturing method thereof
- Patent number 12,027,584
- Issue date Jul 2, 2024
- Macronix International Co., Ltd.
- Jeng Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor substrate and semiconductor device
- Patent number 10,497,652
- Issue date Dec 3, 2019
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit device with layered trench conductors
- Patent number 10,388,664
- Issue date Aug 20, 2019
- Macronix International Co., Ltd.
- Yukai Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device and method of manufacturing the same
- Patent number 10,354,924
- Issue date Jul 16, 2019
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for detecting defects of wafer by wafer sort
- Patent number 9,869,712
- Issue date Jan 16, 2018
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring and analyzing surface structure of chip or wafer
- Patent number 9,589,086
- Issue date Mar 7, 2017
- Macronix International Co., Ltd.
- Tuung Luoh
- G02 - OPTICS
Information Patent Grant
Method for detecting an electrical defect of contact/via plugs
- Patent number 9,244,112
- Issue date Jan 26, 2016
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G01 - MEASURING TESTING
Information Patent Grant
Methods for fabricating semiconductor device
- Patent number 9,236,497
- Issue date Jan 12, 2016
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection optimization
- Patent number 9,116,108
- Issue date Aug 25, 2015
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting bitmap failure associated with physical coordinate
- Patent number 9,006,003
- Issue date Apr 14, 2015
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Grant
Method for reducing wordline bridge rate
- Patent number 8,791,022
- Issue date Jul 29, 2014
- Macronix International Co. LTD
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer polysilicon suppression of implant species penetration
- Patent number 8,735,958
- Issue date May 27, 2014
- Macronix International Co., Ltd.
- Chun Ling Chiang
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for improving flatness of a layer deposited on polycrystalli...
- Patent number 8,669,184
- Issue date Mar 11, 2014
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
USB HUB and power management method thereof
- Patent number 8,661,281
- Issue date Feb 25, 2014
- Wistron NeWeb Corp.
- Chen-Chao Chang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
In-line inspection yield prediction system
- Patent number 8,594,963
- Issue date Nov 26, 2013
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Nonvolatile memory device and method for making the same
- Patent number 8,581,322
- Issue date Nov 12, 2013
- Macronix International Co., Ltd.
- Chi-Pin Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory and manufacturing method thereof
- Patent number 8,581,327
- Issue date Nov 12, 2013
- Macronix International Co., Ltd.
- Erh-Kun Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methodology for wordline short reduction
- Patent number 8,383,515
- Issue date Feb 26, 2013
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and associated method for making a floating gate cell wit...
- Patent number 8,354,335
- Issue date Jan 15, 2013
- Macronix International Co., Ltd.
- Chen-Chin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test pattern for detecting piping in a memory array
- Patent number 8,329,480
- Issue date Dec 11, 2012
- Macronix International Co., Ltd.
- Che-Lun Hung
- G11 - INFORMATION STORAGE
Information Patent Grant
Conductor removal process
- Patent number 8,288,280
- Issue date Oct 16, 2012
- Macronix International Co., Ltd.
- Yung-Tai Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of fabricating integrated circuit with small pitch
- Patent number 8,211,806
- Issue date Jul 3, 2012
- Macronix International Co., Ltd.
- Chia-Wei Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charge trapping memory cell having bandgap engineered tunneling str...
- Patent number 8,169,835
- Issue date May 1, 2012
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer with improved intrinsic gettering ability
- Patent number 8,106,483
- Issue date Jan 31, 2012
- Macronix International Co., Ltd.
- Chun-Ling Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Etching method for semiconductor element
- Patent number 7,951,707
- Issue date May 31, 2011
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of improving intrinsic gettering ability of wafer
- Patent number 7,939,432
- Issue date May 10, 2011
- Macronix International Co., Ltd.
- Chun-Ling Chiang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fabrication method of electronic device
- Patent number 7,938,972
- Issue date May 10, 2011
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming self-aligned contacts and local interconnects si...
- Patent number 7,888,804
- Issue date Feb 15, 2011
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory and manufacturing method thereof
- Patent number 7,879,706
- Issue date Feb 1, 2011
- Macronix International Co., Ltd.
- Erh-Kun Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and associated method for making a floating gate cell wit...
- Patent number 7,879,708
- Issue date Feb 1, 2011
- Macronix International Co. LTD
- Chen-Chin Liu
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MEMORY DEVICE AND METHOD FOR FORMING THE SAME
- Publication number 20230403852
- Publication date Dec 14, 2023
- Macronix International Co., Ltd.
- Chi-Pin LU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20230326969
- Publication date Oct 12, 2023
- Macronix International Co., Ltd.
- Jeng Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20190067119
- Publication date Feb 28, 2019
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT DEVICE WITH LAYERED TRENCH CONDUCTORS
- Publication number 20180269225
- Publication date Sep 20, 2018
- Macronix International Co., Ltd.
- Yukai HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20170069762
- Publication date Mar 9, 2017
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR DETECTING DEFECTS OF WAFER BY WAFER SORT
- Publication number 20160314237
- Publication date Oct 27, 2016
- Macronix International Co., Ltd.
- Tuung Luoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection of inconsistencies in and on semiconductor devices and s...
- Publication number 20160123905
- Publication date May 5, 2016
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR CONTACT BY DIE TO DATABASE
- Publication number 20160110859
- Publication date Apr 21, 2016
- Macronix International Co., Ltd.
- Tuung Luoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR REDUCING DEFECTS IN POLYSILICON LAYERS
- Publication number 20150340236
- Publication date Nov 26, 2015
- Macronix International Co., Ltd.
- Jeng Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETECTING AN ELECTRICAL DEFECT OF CONTACT/VIA PLUGS
- Publication number 20150323583
- Publication date Nov 12, 2015
- Macronix International Co., Ltd.
- Hsiang-Chou Liao
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM INSPECTION OPTIMIZATION
- Publication number 20150226687
- Publication date Aug 13, 2015
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING AND ANALYZING SURFACE STRUCTURE OF CHIP OR WAFER
- Publication number 20150213172
- Publication date Jul 30, 2015
- Macronix International Co., Ltd.
- Tuung Luoh
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20150171223
- Publication date Jun 18, 2015
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE INSPECTION METHOD OF DIE TO DATABASE
- Publication number 20150110384
- Publication date Apr 23, 2015
- Macronix International Co., Ltd.
- Tuung Luoh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR STRUCTURE FOR IMPROVED OXIDE FILL IN
- Publication number 20140117356
- Publication date May 1, 2014
- Macronix International Co., Ltd.
- Jeng Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GATE STRUCTURE AND METHOD OF MANUFACTURING THEREOF
- Publication number 20140048866
- Publication date Feb 20, 2014
- MACRONIX INTERNATIONAL CO., LTD.
- Jeng Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE WITH INCREASED RELIAB...
- Publication number 20130168754
- Publication date Jul 4, 2013
- MACRONIX INTERNATIONAL CO., LTD.
- Jeng Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NONVOLATILE MEMORY DEVICE AND METHOD FOR MAKING THE SAME
- Publication number 20130001667
- Publication date Jan 3, 2013
- Macronix International Co., Ltd.
- Chi-Pin Lu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR IMPROVING FLATNESS OF A LAYER DEPOSITED ON POLYCRYSTALLI...
- Publication number 20120190198
- Publication date Jul 26, 2012
- Macronix International Co., Ltd.
- Tuung Luoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
USB HUB AND POWER MANAGEMENT METHOD THEREOF
- Publication number 20120144213
- Publication date Jun 7, 2012
- WISTRON NEWEB CORP.
- Chen-Chao Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR REDUCING WORDLINE BRIDGE RATE
- Publication number 20120129350
- Publication date May 24, 2012
- MACRONIX INTERNATIONAL CO., LTD.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODOLOGY FOR WORDLINE SHORT REDUCTION
- Publication number 20120122296
- Publication date May 17, 2012
- MACRONIX INTERNATIONAL CO., LTD.
- Tuung LUOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST PATTERN FOR DETECTING PIPING IN A MEMORY ARRAY
- Publication number 20120074401
- Publication date Mar 29, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Che-Lun Hung
- G11 - INFORMATION STORAGE
Information Patent Application
IN-LINE INSPECTION YIELD PREDICTION SYSTEM
- Publication number 20120053855
- Publication date Mar 1, 2012
- MACRONIX INTERNATIONAL CO., LTD
- Hsiang-Chou Liao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT WITH IMPROVED INTRINSIC GETTERING ABILITY
- Publication number 20110175203
- Publication date Jul 21, 2011
- MACRONIX INTERNATIONAL CO. LTD
- CHUN-LING CHIANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY AND MANUFACTURING METHOD THEREOF
- Publication number 20110089480
- Publication date Apr 21, 2011
- MACRONIX INTERNATIONAL CO., LTD.
- Erh-Kun Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND ASSOCIATED METHOD FOR MAKING A FLOATING GATE CELL WIT...
- Publication number 20110086482
- Publication date Apr 14, 2011
- Macronix International Co., Ltd.
- Chen-Chin Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGE TRAPPING MEMORY CELL HAVING BANDGAP ENGINEERED TUNNELING STR...
- Publication number 20110075486
- Publication date Mar 31, 2011
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING NON-VOLATILE MEMORY
- Publication number 20100210085
- Publication date Aug 19, 2010
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS FOR FABRICATING DIELECTRIC LAYER AND NON-VOLATILE MEMORY
- Publication number 20100178758
- Publication date Jul 15, 2010
- Macronix International Co., Ltd.
- Jeng-Hwa Liao
- H01 - BASIC ELECTRIC ELEMENTS

Ling Kuey Yang

Person

Patents Grantslast 30 patents

Transistor structure and manufacturing method thereof

Semiconductor substrate and semiconductor device

Integrated circuit device with layered trench conductors

Semiconductor memory device and method of manufacturing the same

Method and system for detecting defects of wafer by wafer sort

Method for measuring and analyzing surface structure of chip or wafer

Method for detecting an electrical defect of contact/via plugs

Methods for fabricating semiconductor device

Electron beam inspection optimization

Method of detecting bitmap failure associated with physical coordinate

Method for reducing wordline bridge rate

Multi-layer polysilicon suppression of implant species penetration

Method for improving flatness of a layer deposited on polycrystalli...

USB HUB and power management method thereof

In-line inspection yield prediction system

Nonvolatile memory device and method for making the same

Memory and manufacturing method thereof

Methodology for wordline short reduction

Apparatus and associated method for making a floating gate cell wit...

Test pattern for detecting piping in a memory array

Conductor removal process

Method of fabricating integrated circuit with small pitch

Charge trapping memory cell having bandgap engineered tunneling str...

Wafer with improved intrinsic gettering ability

Etching method for semiconductor element

Method of improving intrinsic gettering ability of wafer

Fabrication method of electronic device

Method for forming self-aligned contacts and local interconnects si...

Memory and manufacturing method thereof

Apparatus and associated method for making a floating gate cell wit...

Patents Applicationslast 30 patents

MEMORY DEVICE AND METHOD FOR FORMING THE SAME

TRANSISTOR STRUCTURE AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME

INTEGRATED CIRCUIT DEVICE WITH LAYERED TRENCH CONDUCTORS

MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME

METHOD AND SYSTEM FOR DETECTING DEFECTS OF WAFER BY WAFER SORT

Inspection of inconsistencies in and on semiconductor devices and s...

INSPECTION METHOD FOR CONTACT BY DIE TO DATABASE

METHOD FOR REDUCING DEFECTS IN POLYSILICON LAYERS

METHOD FOR DETECTING AN ELECTRICAL DEFECT OF CONTACT/VIA PLUGS

ELECTRON BEAM INSPECTION OPTIMIZATION

METHOD FOR MEASURING AND ANALYZING SURFACE STRUCTURE OF CHIP OR WAFER

METHODS FOR FABRICATING SEMICONDUCTOR DEVICE

IMAGE INSPECTION METHOD OF DIE TO DATABASE

SEMICONDUCTOR STRUCTURE FOR IMPROVED OXIDE FILL IN

GATE STRUCTURE AND METHOD OF MANUFACTURING THEREOF

METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE WITH INCREASED RELIAB...

NONVOLATILE MEMORY DEVICE AND METHOD FOR MAKING THE SAME

METHOD FOR IMPROVING FLATNESS OF A LAYER DEPOSITED ON POLYCRYSTALLI...

USB HUB AND POWER MANAGEMENT METHOD THEREOF

METHOD FOR REDUCING WORDLINE BRIDGE RATE

METHODOLOGY FOR WORDLINE SHORT REDUCTION

TEST PATTERN FOR DETECTING PIPING IN A MEMORY ARRAY

IN-LINE INSPECTION YIELD PREDICTION SYSTEM

INTEGRATED CIRCUIT WITH IMPROVED INTRINSIC GETTERING ABILITY

MEMORY AND MANUFACTURING METHOD THEREOF

APPARATUS AND ASSOCIATED METHOD FOR MAKING A FLOATING GATE CELL WIT...

CHARGE TRAPPING MEMORY CELL HAVING BANDGAP ENGINEERED TUNNELING STR...

METHOD FOR FABRICATING NON-VOLATILE MEMORY

METHODS FOR FABRICATING DIELECTRIC LAYER AND NON-VOLATILE MEMORY