Lino A. Velo

Person

San Ramon, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for fabricating a semiconductor chip interconnect
- Patent number 6,812,126
- Issue date Nov 2, 2004
- CVC Products, Inc.
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microelectronic interconnect material with adhesion promotion layer...
- Patent number 6,645,847
- Issue date Nov 11, 2003
- CVC Products, Inc.
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microelectronic interconnect material with adhesion promotion layer...
- Patent number 6,627,995
- Issue date Sep 30, 2003
- CVC Products, Inc.
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming a copper film on a substrate
- Patent number 6,461,675
- Issue date Oct 8, 2002
- CVC Products, Inc.
- Ajit P. Paranjpe
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Microelectronic interconnect material with adhesion promotion layer...
- Patent number 6,365,502
- Issue date Apr 2, 2002
- CVC Products, Inc.
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip interconnect barrier material and fabrication me...
- Patent number 6,294,836
- Issue date Sep 25, 2001
- CVC Products Inc.
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for depositing tantalum-based thin films with...
- Patent number 6,204,204
- Issue date Mar 20, 2001
- CVC Products, Inc.
- Ajit P. Paranjpe
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Wireless temperature calibration device and method
- Patent number 5,326,170
- Issue date Jul 5, 1994
- Texas Instruments, Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for determining wafer temperature using pyrometry
- Patent number 5,305,417
- Issue date Apr 19, 1994
- Texas Instruments Incorporated
- Habib N. Najm
- C30 - CRYSTAL GROWTH
Information Patent Grant
Conditioning of semiconductor wafers for uniform and repeatable rap...
- Patent number 5,296,385
- Issue date Mar 22, 1994
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wireless temperature calibration device and method
- Patent number 5,265,957
- Issue date Nov 30, 1993
- Texas Instruments Incorporated
- Mehrdad M. Moslehi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Microelectronic interconnect material with adhesion promotion layer...
- Publication number 20020137332
- Publication date Sep 26, 2002
- CVC Products, Inc., a Delware corporation
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microelectronic interconnect material with adhesion promotion layer...
- Publication number 20020102838
- Publication date Aug 1, 2002
- CVC Products, Inc., a Delaware corporation
- Ajit P. Paranjpe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING A COPPER FILM ON A SUBSTRATE
- Publication number 20020006468
- Publication date Jan 17, 2002
- AJIT P. PARANJPE
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Lino A. Velo

Person

Patents Grantslast 30 patents

Method for fabricating a semiconductor chip interconnect

Microelectronic interconnect material with adhesion promotion layer...

Microelectronic interconnect material with adhesion promotion layer...

Method for forming a copper film on a substrate

Microelectronic interconnect material with adhesion promotion layer...

Semiconductor chip interconnect barrier material and fabrication me...

Method and apparatus for depositing tantalum-based thin films with...

Wireless temperature calibration device and method

Apparatus and method for determining wafer temperature using pyrometry

Conditioning of semiconductor wafers for uniform and repeatable rap...

Wireless temperature calibration device and method

Patents Applicationslast 30 patents

Microelectronic interconnect material with adhesion promotion layer...

Microelectronic interconnect material with adhesion promotion layer...

METHOD FOR FORMING A COPPER FILM ON A SUBSTRATE