Liqi Wang

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Sunnyvale, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Indirect measurement of negative margin voltages in endurance testi...
- Patent number 7,751,248
- Issue date Jul 6, 2010
- Atmel Corporation
- Philip S. Ng
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for preventing snap back in integrated circuits
- Patent number 7,692,483
- Issue date Apr 6, 2010
- Atmel Corporation
- Philip Ng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus to test the power-on-reset trip point of an in...
- Patent number 7,519,486
- Issue date Apr 14, 2009
- Atmel Corporation
- Philip Ng
- G01 - MEASURING TESTING
Information Patent Grant
Indirect measurement of negative margin voltages in endurance testi...
- Patent number 7,336,540
- Issue date Feb 26, 2008
- Atmel Corporation
- Philip S. Ng
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory data access scheme
- Patent number 7,257,046
- Issue date Aug 14, 2007
- Atmel Corporation
- Jinshu Son
- G11 - INFORMATION STORAGE
Information Patent Grant
Fuse data storage system using core memory
- Patent number 7,102,950
- Issue date Sep 5, 2006
- Atmel Corporation
- Jinshu Son
- G11 - INFORMATION STORAGE
Information Patent Grant
Y-mux splitting scheme
- Patent number 7,099,202
- Issue date Aug 29, 2006
- Atmel Corporation
- Jinshu Son
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR PREVENTING SNAP BACK IN INTEGRATED CIRCUITS
- Publication number 20090096501
- Publication date Apr 16, 2009
- ATMEL CORPORATION
- Philip Ng
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INDIRECT MEASUREMENT OF NEGATIVE MARGIN VOLTAGES IN ENDURANCE TESTI...
- Publication number 20080144386
- Publication date Jun 19, 2008
- Atmel Corporation
- Philip S. Ng
- G11 - INFORMATION STORAGE
Information Patent Application
Method and Apparatus to Test the Power-on-Reset Trip Point of an In...
- Publication number 20070266280
- Publication date Nov 15, 2007
- ATMEL CORPORATION
- Philip Ng
- G01 - MEASURING TESTING
Information Patent Application
Indirect measurement of negative margin voltages in endurance testi...
- Publication number 20070237013
- Publication date Oct 11, 2007
- Philip S. Ng
- G11 - INFORMATION STORAGE
Information Patent Application
Memory data access scheme
- Publication number 20060280020
- Publication date Dec 14, 2006
- Jinshu Son
- G11 - INFORMATION STORAGE
Information Patent Application
Fuse data storage system using core memory
- Publication number 20060023549
- Publication date Feb 2, 2006
- Jinshu Son
- G11 - INFORMATION STORAGE