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Louis Christopher Milano
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Endicott, NY, US
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last 30 patents
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Patent Grant
Method and system for improving efficiency of sequential test compr...
Patent number
9,817,068
Issue date
Nov 14, 2017
Cadence Design Systems, Inc.
Vivek Chickermane
G01 - MEASURING TESTING
Information
Patent Grant
Elastic compression-optimizing tester bandwidth with compressed tes...
Patent number
9,470,754
Issue date
Oct 18, 2016
Cadence Design Systems, Inc.
Vivek Chickermane
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for synchronizing multiple circuits clocked at...
Patent number
6,611,159
Issue date
Aug 26, 2003
International Business Machines Corporation
Louis C. Milano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit including fully testable small scale read only m...
Patent number
5,694,346
Issue date
Dec 2, 1997
International Business Machines Corporation
Louis Christopher Milano
G06 - COMPUTING CALCULATING COUNTING