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Lowell Starr
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San Jose, CA, US
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last 30 patents
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Patent Grant
Method of performing an extensive diagnostic test in conjunction wi...
Patent number
6,035,420
Issue date
Mar 7, 2000
Micron Electronics, Inc.
Ji-hwan Liu
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Apparatus for performing an extensive diagnostic test in conjunctio...
Patent number
6,009,541
Issue date
Dec 28, 1999
Micron Electronics, Inc.
Ji-hwan Liu
G06 - COMPUTING CALCULATING COUNTING