Luc Irena Franciscus De Schepper

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Hasselt, BE

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Patents Grantslast 30 patents

Information Patent Grant
Method for thermal impedance evaluation of packaged semiconductor c...
- Patent number 5,927,853
- Issue date Jul 27, 1999
- Filip Christiaens
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for local temperature sensing for use in perfo...
- Patent number 5,915,838
- Issue date Jun 29, 1999
- IMEC vzw
- Lambert Stals
- G01 - MEASURING TESTING
Information Patent Grant
Method for local temperature sensing for use in performing high res...
- Patent number 5,833,365
- Issue date Nov 10, 1998
- Interuniversitair Micro-Electronika Centrum vzw
- Lambert Stals
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for thermal impedance evaluation of packaged s...
- Patent number 5,795,063
- Issue date Aug 18, 1998
- Interuniversitair Micro-Elektronica Centrum VZW
- Filip Christiaens
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring electromagnetic ageing parameter...
- Patent number 5,646,540
- Issue date Jul 8, 1997
- Interuniversitair Micro-Elektronic Centrum VZW
- Lambert Mathias Maria Stals
- G01 - MEASURING TESTING