Luis A. Basto

Follow

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for testing embedded cores
- Patent number 7,568,141
- Issue date Jul 28, 2009
- Intel Corporation
- Sankaran M. Menon
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for testing embedded cores
- Patent number 7,313,739
- Issue date Dec 25, 2007
- Analog Devices, Inc.
- Sankaran M. Menon
- G11 - INFORMATION STORAGE
Information Patent Grant
Universally accessible fully programmable memory built-in self-test...
- Patent number 6,959,256
- Issue date Oct 25, 2005
- Analog Devices, Inc.
- Luis Antonio Basto
- G11 - INFORMATION STORAGE
Information Patent Grant
Insertion of scan hardware
- Patent number 6,675,364
- Issue date Jan 6, 2004
- Advanced Micro Devices, Inc.
- Luis A. Basto
- G01 - MEASURING TESTING
Information Patent Grant
High performance, low power, scannable flip-flop
- Patent number 6,348,825
- Issue date Feb 19, 2002
- Analog Devices, Inc.
- Dwight Elmer Galbi
- G01 - MEASURING TESTING
Information Patent Grant
Graphical user interface for testability operation
- Patent number 6,341,361
- Issue date Jan 22, 2002
- Advanced Micro Devices, Inc.
- Luis A. Basto
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus for Testing Embedded Cores
- Publication number 20080104466
- Publication date May 1, 2008
- Analog Devics, Inc.,a Delaware corporation
- Sankaran M. Menon
- G01 - MEASURING TESTING
Information Patent Application
Universally accessible fully programmable memory built-in self-test...
- Publication number 20040230395
- Publication date Nov 18, 2004
- Luis Antonio Basto
- G11 - INFORMATION STORAGE
Information Patent Application
Method and apparatus for testing embedded cores
- Publication number 20040128596
- Publication date Jul 1, 2004
- Sankaran M. Menon
- G01 - MEASURING TESTING