Luis Elvira Villagra

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Maastrich, NL

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Patents Grantslast 30 patents

Information Patent Grant
Testable integrated circuit and test method therefor
- Patent number 8,531,204
- Issue date Sep 10, 2013
- NXP, B.V.
- Rinze Ida Mechtildis Peter Meijer
- G01 - MEASURING TESTING
Information Patent Grant
Static memory devices
- Patent number 8,107,288
- Issue date Jan 31, 2012
- NXP B.V.
- Luis Elvira Villagra
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TESTABLE INTEGRATED CIRCUIT AND TEST METHOD THEREFOR
- Publication number 20110221502
- Publication date Sep 15, 2011
- NXP B.V.
- Rinze Ida Mechtildis Peter Meijer
- G01 - MEASURING TESTING
Information Patent Application
DUAL-RAIL SRAM WITH INDEPENDENT READ AND WRITE PORTS
- Publication number 20110205787
- Publication date Aug 25, 2011
- NXP B.V.
- Roelof Herman Willem Salters
- G11 - INFORMATION STORAGE
Information Patent Application
STATIC MEMORY DEVICES
- Publication number 20100202192
- Publication date Aug 12, 2010
- NXP B.V.
- Luis Elvira Villagra
- G11 - INFORMATION STORAGE