Maarten Jacobus Swanenberg

Person

Nijmegen, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Screening method and apparatus for detecting deep trench isolation...
- Patent number 11,448,690
- Issue date Sep 20, 2022
- NXP USA, INC.
- Laurent Segarra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Low cost LF driver current sense topology
- Patent number 10,516,372
- Issue date Dec 24, 2019
- NXP B.V.
- Hermanus J. Effing
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Electrostatic discharge protection apparatuses
- Patent number 10,475,783
- Issue date Nov 12, 2019
- NXP B.V.
- Jan Claes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Extended drain NMOS transistor with buried P type region
- Patent number 10,177,243
- Issue date Jan 8, 2019
- NXP B.V.
- Dimitar Milkov Dochev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Thyristor, a method of triggering a thyristor, and thyristor circuits
- Patent number 9,871,129
- Issue date Jan 16, 2018
- Silergy Corp.
- Rob Van Dalen
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Cascode semiconductor device for power factor correction
- Patent number 9,268,351
- Issue date Feb 23, 2016
- NXP B.V.
- Philip Rutter
- G05 - CONTROLLING REGULATING
Information Patent Grant
Interface for communication between voltage domains
- Patent number 8,818,265
- Issue date Aug 26, 2014
- NXP B.V.
- Peter Gerard Steeneken
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Galvanic isolation device and method
- Patent number 8,749,223
- Issue date Jun 10, 2014
- NXP B.V.
- Maarten Jacobus Swanenberg
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Edge termination for semiconductor device
- Patent number 7,859,076
- Issue date Dec 28, 2010
- NXP B.V.
- Rob Van Dalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of providing enhanced breakdown by diluted doping profiles i...
- Patent number 7,790,589
- Issue date Sep 7, 2010
- NXP B.V.
- Paulus J. T. Eggenkamp
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCREENING METHOD AND APPARATUS FOR DETECTING DEEP TRENCH ISOLATION...
- Publication number 20220003812
- Publication date Jan 6, 2022
- NXP USA, Inc.
- Laurent Segarra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Low Cost LF Driver Current Sense Topology
- Publication number 20200014345
- Publication date Jan 9, 2020
- NXP B.V.
- Hermanus J. Effing
- G01 - MEASURING TESTING
Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION APPARATUSES
- Publication number 20190115340
- Publication date Apr 18, 2019
- NXP B.V.
- Jan Claes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EXTENDED DRAIN NMOS TRANSISTOR WITH BURIED P TYPE REGION
- Publication number 20180366561
- Publication date Dec 20, 2018
- NXP B.V.
- DIMITAR MILKOV DOCHEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
THYRISTOR, A METHOD OF TRIGGERING A THYRISTOR, AND THYRISTOR CIRCUITS
- Publication number 20140375377
- Publication date Dec 25, 2014
- NXP B.V.
- Rob Van Dalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CASCODE SEMICONDUCTOR DEVICE
- Publication number 20140292287
- Publication date Oct 2, 2014
- NXP B.V.
- Philip RUTTER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERFACE FOR COMMUNICATION BETWEEN VOLTAGE DOMAINS
- Publication number 20130281033
- Publication date Oct 24, 2013
- Peter Gerard Steeneken
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
GALVANIC ISOLATION DEVICE AND METHOD
- Publication number 20120326699
- Publication date Dec 27, 2012
- NXP B.V.
- Maarten Jacobus SWANENBERG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EDGE TERMINATION FOR SEMICONDUCTOR DEVICE
- Publication number 20100001362
- Publication date Jan 7, 2010
- NXP B.V.
- Rob Van Dalen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MOSFET FOR HIGH VOLTAGE APPLICATIONS AND A METHOD OF FABRICATING SAME
- Publication number 20090045460
- Publication date Feb 19, 2009
- Koninklijke Philips Electronics N.V.
- Jan Jacob Koning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PROVIDING ENHANCED BREAKDOWN BY DILUTED DOPING PROFILES I...
- Publication number 20080265319
- Publication date Oct 30, 2008
- Paulus J.T. Eggenkamp
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and circuit arrangement for esd protection of a connection t...
- Publication number 20060018063
- Publication date Jan 26, 2006
- Koninklijke Philips Electronics N.V.
- Hendrik Boezen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Power supply having rectifier and shunt circuit
- Publication number 20020075708
- Publication date Jun 20, 2002
- Arjan Van Den Berg
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Maarten Jacobus Swanenberg

Person

Patents Grantslast 30 patents

Screening method and apparatus for detecting deep trench isolation...

Low cost LF driver current sense topology

Electrostatic discharge protection apparatuses

Extended drain NMOS transistor with buried P type region

Thyristor, a method of triggering a thyristor, and thyristor circuits

Cascode semiconductor device for power factor correction

Interface for communication between voltage domains

Galvanic isolation device and method

Edge termination for semiconductor device

Method of providing enhanced breakdown by diluted doping profiles i...

Patents Applicationslast 30 patents

SCREENING METHOD AND APPARATUS FOR DETECTING DEEP TRENCH ISOLATION...

Low Cost LF Driver Current Sense Topology

ELECTROSTATIC DISCHARGE PROTECTION APPARATUSES

EXTENDED DRAIN NMOS TRANSISTOR WITH BURIED P TYPE REGION

THYRISTOR, A METHOD OF TRIGGERING A THYRISTOR, AND THYRISTOR CIRCUITS

CASCODE SEMICONDUCTOR DEVICE

INTERFACE FOR COMMUNICATION BETWEEN VOLTAGE DOMAINS

GALVANIC ISOLATION DEVICE AND METHOD

EDGE TERMINATION FOR SEMICONDUCTOR DEVICE

MOSFET FOR HIGH VOLTAGE APPLICATIONS AND A METHOD OF FABRICATING SAME

METHOD OF PROVIDING ENHANCED BREAKDOWN BY DILUTED DOPING PROFILES I...

Method and circuit arrangement for esd protection of a connection t...

Power supply having rectifier and shunt circuit