Mackenzie E. King

Person

Newtown, CT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Carbon electrode and lithium ion hybrid capacitor comprising same
- Patent number 10,707,488
- Issue date Jul 7, 2020
- Entegris, Inc.
- Troy Scoggins
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Composition and method for recycling semiconductor wafers having lo...
- Patent number 8,642,526
- Issue date Feb 4, 2014
- Advanced Technology Materials, Inc.
- Pamela M. Visintin
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Method of passivating chemical mechanical polishing compositions fo...
- Patent number 8,236,695
- Issue date Aug 7, 2012
- Advanced Technology Materials, Inc.
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 8,109,130
- Issue date Feb 7, 2012
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Composition and method for recycling semiconductor wafers having lo...
- Patent number 7,960,328
- Issue date Jun 14, 2011
- Advanced Technology Materials, Inc.
- Pamela M. Visintin
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 7,475,588
- Issue date Jan 13, 2009
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatuses for monitoring organic additives in electro...
- Patent number 7,435,320
- Issue date Oct 14, 2008
- Advanced Technology Materials, Inc.
- Jianwen Han
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining organic component concentrations in an elec...
- Patent number 7,427,344
- Issue date Sep 23, 2008
- Advanced Technology Materials, Inc.
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Passivative chemical mechanical polishing composition for copper fi...
- Patent number 7,361,603
- Issue date Apr 22, 2008
- Advanced Technology Materials, Inc.
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Passivative chemical mechanical polishing composition for copper fi...
- Patent number 7,300,601
- Issue date Nov 27, 2007
- Advanced Technology Materials, Inc.
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 7,296,460
- Issue date Nov 20, 2007
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Methods for removing moisture from hydrogen halides
- Patent number 7,288,201
- Issue date Oct 30, 2007
- Entegris, Inc.
- Mackenzie King
- C02 - TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
Information Patent Grant
Sampling management for a process analysis tool to minimize sample...
- Patent number 7,157,051
- Issue date Jan 2, 2007
- Advanced Technology Materials, Inc.
- Mackenzie E. King
- G01 - MEASURING TESTING
Information Patent Grant
One-point recalibration method for reducing error in concentration...
- Patent number 7,141,156
- Issue date Nov 28, 2006
- Advanced Technology Materials, Inc.
- Jianwen Han
- G01 - MEASURING TESTING
Information Patent Grant
Process analyzer for monitoring electrochemical deposition solutions
- Patent number 7,094,323
- Issue date Aug 22, 2006
- Advanced Technology Materials, Inc.
- Mackenzie King
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and process for sensing fluoro species in semiconductor p...
- Patent number 7,080,545
- Issue date Jul 25, 2006
- Advanced Technology Materials, Inc.
- Frank Dimeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Methods for determining organic component concentrations in an elec...
- Patent number 6,984,299
- Issue date Jan 10, 2006
- Advanced Technology Material, Inc.
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Grant
Attenuated total reflection spectroscopic analysis of organic addit...
- Patent number 6,954,560
- Issue date Oct 11, 2005
- Advanced Technology Materials, Inc.
- Yuriy V. Tolmachev
- G01 - MEASURING TESTING
Information Patent Grant
Optical hydrogen detector
- Patent number 6,897,960
- Issue date May 24, 2005
- Frank DiMeo, Jr.
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of antioxidant in solder plating solutions using molybdenu...
- Patent number 6,844,196
- Issue date Jan 18, 2005
- Advanced Technology Materials, Inc.
- Mackenzie E. King
- G01 - MEASURING TESTING
Information Patent Grant
Quartz crystal microbalance sensors and semiconductor manufacturing...
- Patent number 6,295,861
- Issue date Oct 2, 2001
- Advanced Technology Materials, Inc.
- Glenn M. Tom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
CARBON ELECTRODE AND LITHIUM ION HYBRID CAPACITOR COMPRISING SAME
- Publication number 20180358619
- Publication date Dec 13, 2018
- Entegris, Inc.
- Troy Scoggins
- C01 - INORGANIC CHEMISTRY
Information Patent Application
COMPOSITION AND METHOD FOR RECYCLING SEMICONDUCTOR WAFERS HAVING LO...
- Publication number 20110275164
- Publication date Nov 10, 2011
- Advanced Technology Materials, Inc.
- Pamela M. Visintin
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
APPARATUS AND PROCESS FOR SENSING FLUORO SPECIES IN SEMICONDUCTOR P...
- Publication number 20090305427
- Publication date Dec 10, 2009
- Advanced Technology Materials, Inc.
- Frank Dimeo, JR.
- G01 - MEASURING TESTING
Information Patent Application
ELECTROCHEMICAL SAMPLING HEAD OR ARRAY OF SAME
- Publication number 20090205964
- Publication date Aug 20, 2009
- Advanced Technology Materials, Inc.
- William Martin Holber
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
ELECTROCHEMICAL SENSING AND DATA ANALYSIS SYSTEM, APPARATUS AND MET...
- Publication number 20090200171
- Publication date Aug 13, 2009
- Advanced Technology Materials, Inc.
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
METHOD OF PASSIVATING CHEMICAL MECHANICAL POLISHING COMPOSITIONS FO...
- Publication number 20090137122
- Publication date May 28, 2009
- Advanced Technology Materials, Inc.
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Composition and Method for Recycling Semiconductor Wafers Having Lo...
- Publication number 20080261847
- Publication date Oct 23, 2008
- Advanced Technology Materials, Inc.
- Pamela M. Visintin
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
SIMULTANEOUS INORGANIC, ORGANIC AND BYPRODUCT ANALYSIS IN ELECTROCH...
- Publication number 20070261963
- Publication date Nov 15, 2007
- Advanced Technology Materials, Inc.
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
PASSIVATIVE CHEMICAL MECHANICAL POLISHING COMPOSITION FOR COPPER FI...
- Publication number 20070181852
- Publication date Aug 9, 2007
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Composition for removing moisture from hydrogen halides
- Publication number 20070138102
- Publication date Jun 21, 2007
- Mackenzie King
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
ONE-POINT RECALIBRATION METHOD FOR REDUCING ERROR IN CONCENTRATION...
- Publication number 20070102301
- Publication date May 10, 2007
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Process analyzer for monitoring electrochemical deposition solutions
- Publication number 20060266648
- Publication date Nov 30, 2006
- Mackenzie E. King
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Methods and apparatus for determining organic component concentrati...
- Publication number 20060102475
- Publication date May 18, 2006
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Methods and apparatuses for analyzing solder plating solutions
- Publication number 20050270535
- Publication date Dec 8, 2005
- Peter M. Robertson
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Method of passivating chemical mechanical polishing compositions fo...
- Publication number 20050263490
- Publication date Dec 1, 2005
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Passivative chemical mechanical polishing composition for copper fi...
- Publication number 20050255693
- Publication date Nov 17, 2005
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Methods and apparatuses for monitoring organic additives in electro...
- Publication number 20050241948
- Publication date Nov 3, 2005
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
One-point recalibration method for reducing error in concentration...
- Publication number 20050236273
- Publication date Oct 27, 2005
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Methods for analyzing inorganic components of an electrolytic solut...
- Publication number 20050236280
- Publication date Oct 27, 2005
- Jianwen Han
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR DETERMINING ORGANIC COMPONENT CONCENTRATI...
- Publication number 20050236274
- Publication date Oct 27, 2005
- Jianwen Han
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20050230258
- Publication date Oct 20, 2005
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
Electrochemical deposition analysis system including high-stability...
- Publication number 20050224370
- Publication date Oct 13, 2005
- Jun Liu
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20050205424
- Publication date Sep 22, 2005
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and process for sensing fluoro species in semiconductor p...
- Publication number 20050199496
- Publication date Sep 15, 2005
- Frank Dimeo
- G01 - MEASURING TESTING
Information Patent Application
On-wafer electrochemical deposition plating metrology process and a...
- Publication number 20050109624
- Publication date May 26, 2005
- MacKenzie King
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Electrode assembly for analysis of metal electroplating solution, c...
- Publication number 20050067304
- Publication date Mar 31, 2005
- MacKenzie E. King
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Sampling management for a process analysis tool to minimize sample...
- Publication number 20050053522
- Publication date Mar 10, 2005
- Mackenzie E. King
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information Patent Application
Attenuated total reflection spectroscopic analysis of organic addit...
- Publication number 20040126049
- Publication date Jul 1, 2004
- Yuriy V. Tolmachev
- G01 - MEASURING TESTING
Information Patent Application
Passivative chemical mechanical polishing composition for copper fi...
- Publication number 20040108302
- Publication date Jun 10, 2004
- Jun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Methods and apparatuses for analyzing solder plating solutions
- Publication number 20040108224
- Publication date Jun 10, 2004
- Peter M. Robertson
- C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR

Mackenzie E. King

Person

Patents Grantslast 30 patents

Carbon electrode and lithium ion hybrid capacitor comprising same

Composition and method for recycling semiconductor wafers having lo...

Method of passivating chemical mechanical polishing compositions fo...

Apparatus and process for sensing fluoro species in semiconductor p...

Composition and method for recycling semiconductor wafers having lo...

Apparatus and process for sensing fluoro species in semiconductor p...

Methods and apparatuses for monitoring organic additives in electro...

Methods for determining organic component concentrations in an elec...

Passivative chemical mechanical polishing composition for copper fi...

Passivative chemical mechanical polishing composition for copper fi...

Apparatus and process for sensing fluoro species in semiconductor p...

Methods for removing moisture from hydrogen halides

Sampling management for a process analysis tool to minimize sample...

One-point recalibration method for reducing error in concentration...

Process analyzer for monitoring electrochemical deposition solutions

Apparatus and process for sensing fluoro species in semiconductor p...

Methods for determining organic component concentrations in an elec...

Attenuated total reflection spectroscopic analysis of organic addit...

Optical hydrogen detector

Analysis of antioxidant in solder plating solutions using molybdenu...

Quartz crystal microbalance sensors and semiconductor manufacturing...

Patents Applicationslast 30 patents

CARBON ELECTRODE AND LITHIUM ION HYBRID CAPACITOR COMPRISING SAME

COMPOSITION AND METHOD FOR RECYCLING SEMICONDUCTOR WAFERS HAVING LO...

APPARATUS AND PROCESS FOR SENSING FLUORO SPECIES IN SEMICONDUCTOR P...

ELECTROCHEMICAL SAMPLING HEAD OR ARRAY OF SAME

ELECTROCHEMICAL SENSING AND DATA ANALYSIS SYSTEM, APPARATUS AND MET...

METHOD OF PASSIVATING CHEMICAL MECHANICAL POLISHING COMPOSITIONS FO...

Composition and Method for Recycling Semiconductor Wafers Having Lo...

SIMULTANEOUS INORGANIC, ORGANIC AND BYPRODUCT ANALYSIS IN ELECTROCH...

PASSIVATIVE CHEMICAL MECHANICAL POLISHING COMPOSITION FOR COPPER FI...

Composition for removing moisture from hydrogen halides

ONE-POINT RECALIBRATION METHOD FOR REDUCING ERROR IN CONCENTRATION...

Process analyzer for monitoring electrochemical deposition solutions

Methods and apparatus for determining organic component concentrati...

Methods and apparatuses for analyzing solder plating solutions

Method of passivating chemical mechanical polishing compositions fo...

Passivative chemical mechanical polishing composition for copper fi...

Methods and apparatuses for monitoring organic additives in electro...

One-point recalibration method for reducing error in concentration...

Methods for analyzing inorganic components of an electrolytic solut...

METHODS AND APPARATUS FOR DETERMINING ORGANIC COMPONENT CONCENTRATI...

Apparatus and process for sensing fluoro species in semiconductor p...

Electrochemical deposition analysis system including high-stability...

Apparatus and process for sensing fluoro species in semiconductor p...

Apparatus and process for sensing fluoro species in semiconductor p...

On-wafer electrochemical deposition plating metrology process and a...

Electrode assembly for analysis of metal electroplating solution, c...

Sampling management for a process analysis tool to minimize sample...

Attenuated total reflection spectroscopic analysis of organic addit...

Passivative chemical mechanical polishing composition for copper fi...

Methods and apparatuses for analyzing solder plating solutions