Membership
Tour
Register
Log in
Magdy S. Abadir
Follow
Person
Austin, TX, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Analog mixed signal model equivalence checking
Patent number
9,594,860
Issue date
Mar 14, 2017
NXP USA, INC.
Himyanshu Anand
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit with degradation monitoring
Patent number
9,329,229
Issue date
May 3, 2016
Freescale Semiconductors, Inc.
Magdy S Abadir
G01 - MEASURING TESTING
Information
Patent Grant
System and method for testing address-swap faults in multiport memo...
Patent number
9,287,006
Issue date
Mar 15, 2016
FREESCALE SEMICONDUCTOR, INC.
Rajesh Raina
G11 - INFORMATION STORAGE
Information
Patent Grant
Prediction of electronic component behavior in bus-based systems
Patent number
9,135,195
Issue date
Sep 15, 2015
FREESCASLE SEMICONDUCTOR, INC.
Aseem Gupta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Efficient apparatus and method for testing digital shadow logic aro...
Patent number
9,069,042
Issue date
Jun 30, 2015
FREESCALE SEMICONDUCTOR, INC.
Rajesh Raina
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit device with reduced leakage and method therefor
Patent number
8,898,614
Issue date
Nov 25, 2014
FREESCALE SEMICONDUCTOR, INC.
Puneet Sharma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Data processing device design tool and methods
Patent number
8,127,258
Issue date
Feb 28, 2012
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for circuit symbolic timing analysis of circuit d...
Patent number
8,050,904
Issue date
Nov 1, 2011
FREESCALE SEMICONDUCTOR, INC.
Jayanta Bhadra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Model correspondence method and device
Patent number
7,650,579
Issue date
Jan 19, 2010
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for testing delay paths of an integrated circuit
Patent number
7,647,573
Issue date
Jan 12, 2010
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Design analysis tool and method for deriving correspondence between...
Patent number
7,360,183
Issue date
Apr 15, 2008
FREESCALE SEMICONDUCTOR, INC.
Jayanta Bhadra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system of data processor design by sensitizing logical d...
Patent number
7,003,743
Issue date
Feb 21, 2006
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Design analysis tool for path extraction and false path identificat...
Patent number
6,952,812
Issue date
Oct 4, 2005
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for generating transition delay fault test patterns
Patent number
6,651,227
Issue date
Nov 18, 2003
Motorola, Inc.
Magdy S. Abadir
G01 - MEASURING TESTING
Information
Patent Grant
Verification of design blocks and method of equivalence checking of...
Patent number
6,378,112
Issue date
Apr 23, 2002
Motorola, Inc.
Andrew K. Martin
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEM AND METHOD FOR TESTING ADDRESS-SWAP FAULTS IN MULTIPORT MEMO...
Publication number
20150371720
Publication date
Dec 24, 2015
FREESCALE SEMICONDUCTOR, INC.
RAJESH RAINA
G11 - INFORMATION STORAGE
Information
Patent Application
Analog Mixed Signal Model Equivalence Checking
Publication number
20150178428
Publication date
Jun 25, 2015
Himyanshu Anand
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Efficient Apparatus and Method for Testing Digital Shadow Logic Aro...
Publication number
20150128001
Publication date
May 7, 2015
FREESCALE SEMICONDUCTOR, INC.
Rajesh Raina
G01 - MEASURING TESTING
Information
Patent Application
INTEGRATED CIRCUIT WITH DEGRADATION MONITORING
Publication number
20140132293
Publication date
May 15, 2014
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G01 - MEASURING TESTING
Information
Patent Application
PREDICTION OF ELECTRONIC COMPONENT BEHAVIOR IN BUS-BASED SYSTEMS
Publication number
20140032803
Publication date
Jan 30, 2014
FREESCALE SEMICONDUCTOR, INC.
Aseem Gupta
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INTEGRATED CIRCUIT DEVICE WITH REDUCED LEAKAGE AND METHOD THEREFOR
Publication number
20110258588
Publication date
Oct 20, 2011
FREESCALE SEMICONDUCTOR, INC.
Puneet Sharma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DATA PROCESSING DEVICE DESIGN TOOL AND METHODS
Publication number
20100050139
Publication date
Feb 25, 2010
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and Method for Circuit Symbolic Timing Analysis of Circuit D...
Publication number
20080071515
Publication date
Mar 20, 2008
Jayanta Bhadra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and device for testing delay paths of an integrated circuit
Publication number
20070277135
Publication date
Nov 29, 2007
FREESCALE SEMICONDUCTOR, INC.
Jing Zeng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Model correspondence method and device
Publication number
20070277133
Publication date
Nov 29, 2007
FREESCALE SEMICONDUCTOR, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Design analysis tool and method for deriving correspondence between...
Publication number
20060120167
Publication date
Jun 8, 2006
Freescale Semiconductor Inc.
Jayanta Bhadra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and system of data processor design
Publication number
20030149945
Publication date
Aug 7, 2003
MOTOROLA, INC.
Magdy S. Abadir
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for generating transition delay fault test patterns
Publication number
20030079189
Publication date
Apr 24, 2003
Magdy S. Abadir
G01 - MEASURING TESTING
Information
Patent Application
Design analysis tool for path extraction and false path identificat...
Publication number
20020112213
Publication date
Aug 15, 2002
Magdy S. Abadir
G01 - MEASURING TESTING