Makoto Abbe

Person

Tsukuba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating precision of output data using error propagation
- Patent number 8,306,787
- Issue date Nov 6, 2012
- Mitutoyo Corporation
- Kiyoshi Takamasu
- G01 - MEASURING TESTING
Information Patent Grant
Two-dimensional lattice calibrating device, two-dimensional lattice...
- Patent number 7,765,079
- Issue date Jul 27, 2010
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Optical axis polarization type laser interferometer
- Patent number 7,599,070
- Issue date Oct 6, 2009
- Mitutoyo Corporation
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Grant
Method for estimating absolute distance of tracking laser interfero...
- Patent number 7,538,888
- Issue date May 26, 2009
- Mitutoyo Corporation
- Shinichi Hara
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring device, form measuring method, form analysis device,...
- Patent number 7,483,807
- Issue date Jan 27, 2009
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical-axis deflection type laser interferometer, calibration meth...
- Patent number 7,408,650
- Issue date Aug 5, 2008
- Mitutoyo Corporation
- Yasushi Ueshima
- G01 - MEASURING TESTING
Information Patent Grant
Method and program for estimating uncertainty
- Patent number 7,225,104
- Issue date May 29, 2007
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Grant
Form measuring device, form measuring method, form analysis device,...
- Patent number 7,188,046
- Issue date Mar 6, 2007
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of calibrating measuring machines
- Patent number 6,748,790
- Issue date Jun 15, 2004
- Mitutoyo Corporation
- Makoto Abbe
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for calibrating measuring machines
- Patent number 6,640,607
- Issue date Nov 4, 2003
- Mitutoyo Corporation
- Makoto Abbe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF EVALUATING PRECISION OF OUTPUT DATA USING ERROR PROPAGATION
- Publication number 20110054835
- Publication date Mar 3, 2011
- MITUTOYO CORPORATION
- Kiyoshi TAKAMASU
- G01 - MEASURING TESTING
Information Patent Application
Two-dimensional lattice calibrating device, two-dimensional lattice...
- Publication number 20080294364
- Publication date Nov 27, 2008
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL AXIS POLARIZATION TYPE LASER INTERFEROMETER
- Publication number 20080198387
- Publication date Aug 21, 2008
- MITUTOYO CORPORATION
- Naoyuki Taketomi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL-AXIS DEFLECTION TYPE LASER INTERFEROMETER, CALIBRATION METH...
- Publication number 20080049211
- Publication date Feb 28, 2008
- Mitutoyo Corporation
- Yasushi Ueshima
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ESTIMATING ABSOLUTE DISTANCE OF TRACKING LASER INTERFERO...
- Publication number 20070268494
- Publication date Nov 22, 2007
- Mitutoyo Corporation
- Shinichi Hara
- G01 - MEASURING TESTING
Information Patent Application
Form measuring device, form measuring method, form analysis device,...
- Publication number 20070112541
- Publication date May 17, 2007
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and program for estimating uncertainty
- Publication number 20060149507
- Publication date Jul 6, 2006
- Mitutoyo Corporation
- Masayuki Nara
- G01 - MEASURING TESTING
Information Patent Application
Form measuring device, form measuring method, form analysis device,...
- Publication number 20050065751
- Publication date Mar 24, 2005
- Mitutoyo Corporation
- Masayuki Nara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of calibrating measuring machines
- Publication number 20020189319
- Publication date Dec 19, 2002
- Mitutoyo Corporation
- Makoto Abbe
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for calibrating measuring machines
- Publication number 20020148275
- Publication date Oct 17, 2002
- Mitutoyo Corporation
- Makoto Abbe
- G01 - MEASURING TESTING

Makoto Abbe

Person

Patents Grantslast 30 patents

Method of evaluating precision of output data using error propagation

Two-dimensional lattice calibrating device, two-dimensional lattice...

Optical axis polarization type laser interferometer

Method for estimating absolute distance of tracking laser interfero...

Form measuring device, form measuring method, form analysis device,...

Optical-axis deflection type laser interferometer, calibration meth...

Method and program for estimating uncertainty

Form measuring device, form measuring method, form analysis device,...

Method of calibrating measuring machines

Method and apparatus for calibrating measuring machines

Patents Applicationslast 30 patents

METHOD OF EVALUATING PRECISION OF OUTPUT DATA USING ERROR PROPAGATION

Two-dimensional lattice calibrating device, two-dimensional lattice...

OPTICAL AXIS POLARIZATION TYPE LASER INTERFEROMETER

OPTICAL-AXIS DEFLECTION TYPE LASER INTERFEROMETER, CALIBRATION METH...

METHOD FOR ESTIMATING ABSOLUTE DISTANCE OF TRACKING LASER INTERFERO...

Form measuring device, form measuring method, form analysis device,...

Method and program for estimating uncertainty

Form measuring device, form measuring method, form analysis device,...

Method of calibrating measuring machines

Method and apparatus for calibrating measuring machines