Makoto Segawa

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory device implemented with a test circuit
- Patent number 6,529,438
- Issue date Mar 4, 2003
- Kabushiki Kaisha Toshiba
- Yoichi Suzuki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having protective and test circuits
- Patent number 6,442,009
- Issue date Aug 27, 2002
- Kabushiki Kaisha Toshiba
- Yasushi Kameda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,388,938
- Issue date May 14, 2002
- Kabushiki Kaisha Toshiba
- Takao Nakajima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 6,037,638
- Issue date Mar 14, 2000
- Kabushiki Kaisha Toshiba
- Mitsuhiro Abe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device for use in apparatus requiring high-spe...
- Patent number RE36404
- Issue date Nov 23, 1999
- Kabushiki Kaisha Toshiba
- Yasushi Kameda
- 365 - Static information storage and retrieval
Information Patent Grant
Semiconductor device and SRAM having plural power supply voltages
- Patent number 5,825,707
- Issue date Oct 20, 1998
- Kabushiki Kaisha Toshiba
- Yasumitsu Nozawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device provided with LDD transistors
- Patent number 5,751,035
- Issue date May 12, 1998
- Kabushiki Kaisha Toshiba
- Yasushi Kameda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bi-CMOS circuit
- Patent number 5,661,429
- Issue date Aug 26, 1997
- Kabushiki Kaisha Toshiba
- Takao Nakajima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor memory device for use an apparatus requiring high-spe...
- Patent number 5,467,317
- Issue date Nov 14, 1995
- Kabushiki Kaisha Toshiba
- Yasushi Kameda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit for a stable constant delay time
- Patent number 5,459,423
- Issue date Oct 17, 1995
- Kabushiki Kaisha Toshiba
- Yasumitsu Nozawa
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor memory device
- Patent number 5,440,512
- Issue date Aug 8, 1995
- Kabushiki Kaisha Toshiba
- Takayuki Harima
- G11 - INFORMATION STORAGE
Information Patent Grant
Detector circuit for testing semiconductor memory device
- Patent number 5,400,282
- Issue date Mar 21, 1995
- Kabushiki Kaisha Toshiba
- Youichi Suzuki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and its topography
- Patent number 5,263,002
- Issue date Nov 16, 1993
- Kabushiki Kaisha Toshiba
- Youichi Suzuki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,136,542
- Issue date Aug 4, 1992
- Kabushiki Kaishi Toshiba
- Sumako Abe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device capable of relieving defective bits
- Patent number 5,097,448
- Issue date Mar 17, 1992
- Kabushiki Kaisha Toshiba
- Makoto Segawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 5,079,612
- Issue date Jan 7, 1992
- Kabushiki Kaisha Toshiba
- Hiroshi Takamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device with improved output to differential da...
- Patent number 5,043,944
- Issue date Aug 27, 1991
- Kabushiki Kaisha Toshiba
- Kenichi Nakamura
- G11 - INFORMATION STORAGE
Information Patent Grant
Static random access memory
- Patent number 4,939,691
- Issue date Jul 3, 1990
- Kabushiki Kaisha Toshiba
- Shigeto Mizukami
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 4,907,057
- Issue date Mar 6, 1990
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shoji Ariizumi
- G11 - INFORMATION STORAGE
Information Patent Grant
Protected MOS transistor circuit
- Patent number 4,893,159
- Issue date Jan 9, 1990
- Kabushiki Kaisha Toshiba
- Youichi Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with switching noise reduction by feedback
- Patent number 4,864,164
- Issue date Sep 5, 1989
- Kabushiki Kaisha Toshiba
- Shigeo Ohshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Random access memory with resistance to crystal lattice memory errors
- Patent number 4,760,560
- Issue date Jul 26, 1988
- Kabushiki Kaisha Toshiba
- Shoji Ariizumi
- G05 - CONTROLLING REGULATING
Information Patent Grant
MOSFET buffer circuit with an improved bootstrapping circuit
- Patent number 4,725,746
- Issue date Feb 16, 1988
- Kabushiki Kaisha Toshiba
- Makoto Segawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device having multiple conductive layers and the meth...
- Patent number 4,673,969
- Issue date Jun 16, 1987
- Kabushiki Kaisha Toshiba
- Shoji Ariizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Redundancy circuit for a semiconductor memory device
- Patent number 4,648,075
- Issue date Mar 3, 1987
- Kabushiki Kaisha Toshiba
- Makoto Segawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Inverter circuit provided with gate protection
- Patent number 4,578,694
- Issue date Mar 25, 1986
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shoji Ariizumi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Static bootstrap semiconductor drive circuit
- Patent number 4,554,469
- Issue date Nov 19, 1985
- Tokyo Shibaura Denki Kabushiki Kaisha
- Makoto Segawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Driver circuit having a bootstrap buffer circuit
- Patent number 4,549,102
- Issue date Oct 22, 1985
- Tokyo Shibaura Denki Kabushiki Kaisha
- Makoto Segawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having multiple conductive layers and the meth...
- Patent number 4,544,941
- Issue date Oct 1, 1985
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shoji Ariizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Static memory having load polysilicon resistors formed over driver...
- Patent number 4,541,006
- Issue date Sep 10, 1985
- Tokyo Shibaura Denki Kabushiki Kaisha
- Shoji Ariizumi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory device
- Publication number 20010028594
- Publication date Oct 11, 2001
- Kabushiki Kaisha Toshiba
- Takao Nakajima
- G11 - INFORMATION STORAGE

Makoto Segawa

Person

Patents Grantslast 30 patents

Semiconductor memory device implemented with a test circuit

Semiconductor device having protective and test circuits

Semiconductor memory device

Semiconductor memory device

Semiconductor memory device for use in apparatus requiring high-spe...

Semiconductor device and SRAM having plural power supply voltages

Semiconductor device provided with LDD transistors

Bi-CMOS circuit

Semiconductor memory device for use an apparatus requiring high-spe...

Semiconductor integrated circuit for a stable constant delay time

Semiconductor memory device

Detector circuit for testing semiconductor memory device

Semiconductor memory device and its topography

Semiconductor memory device

Semiconductor memory device capable of relieving defective bits

Semiconductor integrated circuit device

Semiconductor memory device with improved output to differential da...

Static random access memory

Semiconductor device

Protected MOS transistor circuit

Integrated circuit with switching noise reduction by feedback

Random access memory with resistance to crystal lattice memory errors

MOSFET buffer circuit with an improved bootstrapping circuit

Semiconductor device having multiple conductive layers and the meth...

Redundancy circuit for a semiconductor memory device

Inverter circuit provided with gate protection

Static bootstrap semiconductor drive circuit

Driver circuit having a bootstrap buffer circuit

Semiconductor device having multiple conductive layers and the meth...

Static memory having load polysilicon resistors formed over driver...

Patents Applicationslast 30 patents

Semiconductor memory device