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Patent Application
MULTI-BEAM CHARGED PARTICLE MICROSCOPE DESIGN WITH ANISOTROPIC FILT...
Publication number
20250239429
Publication date
Jul 24, 2025
Carl Zeiss MultiSEM GmbH
Dirk ZEIDLER
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
MULTI-BEAM CHARGED PARTICLE BEAM SYSTEM WITH ANISOTROPIC FILTERING...
Publication number
20240128051
Publication date
Apr 18, 2024
Carl Zeiss MultiSEM GmbH
Dirk Zeidler
H01 - BASIC ELECTRIC ELEMENTS