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Mamoru Kobayashi
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Hadano, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Solder bump measuring method and apparatus
Patent number
6,340,109
Issue date
Jan 22, 2002
Hitachi, Ltd.
Yutaka Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Solder bump measuring method and apparatus
Patent number
6,196,441
Issue date
Mar 6, 2001
Hitachi, Ltd.
Yutaka Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Solder bump measuring method and apparatus
Patent number
5,906,309
Issue date
May 25, 1999
Hitachi, Ltd.
Yutaka Hashimoto
G01 - MEASURING TESTING
Information
Patent Grant
Printed circuit board assembling system
Patent number
5,329,690
Issue date
Jul 19, 1994
Hitachi, Ltd.
Yoshihisa Tsuji
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Computer-integrated manufacturing system and method
Patent number
5,231,585
Issue date
Jul 27, 1993
Hitachi Ltd.
Mamoru Kobayashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Printed circuit board with a uniform conductive layer formed by equ...
Patent number
5,023,407
Issue date
Jun 11, 1991
Hitachi, Ltd.
Mitugu Shirai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for aligning solder balls
Patent number
4,871,110
Issue date
Oct 3, 1989
Hitachi, Ltd.
Hideyuki Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Component alignment method
Patent number
4,672,209
Issue date
Jun 9, 1987
Hitachi, Ltd.
Koichi Karasaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Component alignment apparatus
Patent number
4,608,494
Issue date
Aug 26, 1986
Hitachi, Ltd.
Mamoru Kobayashi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automatic wiring machine for printed circuit boards
Patent number
4,437,603
Issue date
Mar 20, 1984
Hitachi, Ltd.
Mamoru Kobayashi
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
Solder bump measuring method and apparatus
Publication number
20010000904
Publication date
May 10, 2001
Hitachi, Ltd.
Yutaka Hashimoto
G01 - MEASURING TESTING