Manabu Ando

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic analyzer
- Patent number 12,000,849
- Issue date Jun 4, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 11,209,448
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 10,416,179
- Issue date Sep 17, 2019
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,696,329
- Issue date Jul 4, 2017
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,658,237
- Issue date May 23, 2017
- Hitachi High-Technologies Corporation
- Tomonori Mimura
- G01 - MEASURING TESTING
Information Patent Grant
Automatic analyzer
- Patent number 9,638,640
- Issue date May 2, 2017
- Hitachi High-Technologies Corporation
- Masahiko Iijima
- G01 - MEASURING TESTING
Information Patent Grant
Communication terminal, information supply system, and information...
- Patent number 7,519,374
- Issue date Apr 14, 2009
- NTT DoCoMo, Inc.
- Shin Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory device with error self-correction system start...
- Patent number 5,546,410
- Issue date Aug 13, 1996
- NEC Corporation
- Manabu Ando
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor memory cell
- Patent number 5,388,067
- Issue date Feb 7, 1995
- NEC Corporation
- Nolifumi Sato
- G11 - INFORMATION STORAGE
Information Patent Grant
High stability static memory device having metal-oxide semiconducto...
- Patent number 5,285,096
- Issue date Feb 8, 1994
- NEC Corporation
- Manabu Ando
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Static memory device provided with a signal generating circuit for...
- Patent number 5,029,142
- Issue date Jul 2, 1991
- NEC Corporation
- Manabu Ando
- G11 - INFORMATION STORAGE
Information Patent Grant
Difference amplifier circuit
- Patent number 5,021,745
- Issue date Jun 4, 1991
- NEC Corporation
- Kenji Kondou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Tri-state output circuit provided with means for protecting against...
- Patent number 4,717,846
- Issue date Jan 5, 1988
- Nippon Electric Co. Ltd.
- Manabu Ando
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor memory device with shortened time period of word line...
- Patent number 4,707,809
- Issue date Nov 17, 1987
- NEC Corporation
- Manabu Ando
- G11 - INFORMATION STORAGE
Information Patent Grant
Static semiconductor memory device
- Patent number 4,701,889
- Issue date Oct 20, 1987
- NEC Corporation
- Manabu Ando
- G11 - INFORMATION STORAGE
Information Patent Grant
Bootstrap driving circuit
- Patent number 4,611,134
- Issue date Sep 9, 1986
- NEC Corporation
- Manabu Ando
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20240272186
- Publication date Aug 15, 2024
- HITACHI HIGH-TECH CORPORATION
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20220074959
- Publication date Mar 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Akihisa MAKINO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20190346470
- Publication date Nov 14, 2019
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20170269113
- Publication date Sep 21, 2017
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYER
- Publication number 20150204794
- Publication date Jul 23, 2015
- Hitachi High-Technologies Corporation
- Masahiko Iijima
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20150185242
- Publication date Jul 2, 2015
- Tomonori Mimura
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20150104351
- Publication date Apr 16, 2015
- Hitachi High-Technologies Corporation
- Akihisa Makino
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC ANALYZER
- Publication number 20130294974
- Publication date Nov 7, 2013
- Hitachi High-Technologies Corporation
- Masaki Shiba
- G01 - MEASURING TESTING
Information Patent Application
Communication terminal, information supply system, and information...
- Publication number 20050239512
- Publication date Oct 27, 2005
- NTT DoCoMo, Inc.
- Shin Hasegawa
- G06 - COMPUTING CALCULATING COUNTING

Manabu Ando

Person

Patents Grantslast 30 patents

Automatic analyzer

Automatic analyzer

Automatic analyzer

Automatic analyzer

Automatic analyzer

Automatic analyzer

Communication terminal, information supply system, and information...

Semiconductor memory device with error self-correction system start...

Semiconductor memory cell

High stability static memory device having metal-oxide semiconducto...

Static memory device provided with a signal generating circuit for...

Difference amplifier circuit

Tri-state output circuit provided with means for protecting against...

Semiconductor memory device with shortened time period of word line...

Static semiconductor memory device

Bootstrap driving circuit

Patents Applicationslast 30 patents

AUTOMATIC ANALYZER

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AUTOMATIC ANALYZER

Communication terminal, information supply system, and information...