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Manabu Ando
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Hitachinaka, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Automatic analyzer
Patent number
12,000,849
Issue date
Jun 4, 2024
HITACHI HIGH-TECH CORPORATION
Akihisa Makino
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
11,209,448
Issue date
Dec 28, 2021
HITACHI HIGH-TECH CORPORATION
Akihisa Makino
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
10,416,179
Issue date
Sep 17, 2019
Hitachi High-Technologies Corporation
Akihisa Makino
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,696,329
Issue date
Jul 4, 2017
Hitachi High-Technologies Corporation
Akihisa Makino
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,658,237
Issue date
May 23, 2017
Hitachi High-Technologies Corporation
Tomonori Mimura
G01 - MEASURING TESTING
Information
Patent Grant
Automatic analyzer
Patent number
9,638,640
Issue date
May 2, 2017
Hitachi High-Technologies Corporation
Masahiko Iijima
G01 - MEASURING TESTING
Information
Patent Grant
Communication terminal, information supply system, and information...
Patent number
7,519,374
Issue date
Apr 14, 2009
NTT DoCoMo, Inc.
Shin Hasegawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor memory device with error self-correction system start...
Patent number
5,546,410
Issue date
Aug 13, 1996
NEC Corporation
Manabu Ando
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor memory cell
Patent number
5,388,067
Issue date
Feb 7, 1995
NEC Corporation
Nolifumi Sato
G11 - INFORMATION STORAGE
Information
Patent Grant
High stability static memory device having metal-oxide semiconducto...
Patent number
5,285,096
Issue date
Feb 8, 1994
NEC Corporation
Manabu Ando
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Static memory device provided with a signal generating circuit for...
Patent number
5,029,142
Issue date
Jul 2, 1991
NEC Corporation
Manabu Ando
G11 - INFORMATION STORAGE
Information
Patent Grant
Difference amplifier circuit
Patent number
5,021,745
Issue date
Jun 4, 1991
NEC Corporation
Kenji Kondou
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Tri-state output circuit provided with means for protecting against...
Patent number
4,717,846
Issue date
Jan 5, 1988
Nippon Electric Co. Ltd.
Manabu Ando
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Semiconductor memory device with shortened time period of word line...
Patent number
4,707,809
Issue date
Nov 17, 1987
NEC Corporation
Manabu Ando
G11 - INFORMATION STORAGE
Information
Patent Grant
Static semiconductor memory device
Patent number
4,701,889
Issue date
Oct 20, 1987
NEC Corporation
Manabu Ando
G11 - INFORMATION STORAGE
Information
Patent Grant
Bootstrap driving circuit
Patent number
4,611,134
Issue date
Sep 9, 1986
NEC Corporation
Manabu Ando
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20240272186
Publication date
Aug 15, 2024
HITACHI HIGH-TECH CORPORATION
Akihisa MAKINO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20220074959
Publication date
Mar 10, 2022
HITACHI HIGH-TECH CORPORATION
Akihisa MAKINO
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20190346470
Publication date
Nov 14, 2019
Hitachi High-Technologies Corporation
Akihisa Makino
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20170269113
Publication date
Sep 21, 2017
Hitachi High-Technologies Corporation
Akihisa Makino
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYER
Publication number
20150204794
Publication date
Jul 23, 2015
Hitachi High-Technologies Corporation
Masahiko Iijima
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20150185242
Publication date
Jul 2, 2015
Tomonori Mimura
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20150104351
Publication date
Apr 16, 2015
Hitachi High-Technologies Corporation
Akihisa Makino
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC ANALYZER
Publication number
20130294974
Publication date
Nov 7, 2013
Hitachi High-Technologies Corporation
Masaki Shiba
G01 - MEASURING TESTING
Information
Patent Application
Communication terminal, information supply system, and information...
Publication number
20050239512
Publication date
Oct 27, 2005
NTT DoCoMo, Inc.
Shin Hasegawa
G06 - COMPUTING CALCULATING COUNTING