Manuj Rathor

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Damascene metal-insulator-metal (MIM) device with improved scaleabi...
- Patent number 9,343,666
- Issue date May 17, 2016
- Cypress Semiconductor Corporation
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diode and resistive memory device structures
- Patent number 8,803,120
- Issue date Aug 12, 2014
- Spansion, LLC
- Manuj Rathor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal-insulator-metal-insulator-metal (MIMIM) memory device
- Patent number 8,717,803
- Issue date May 6, 2014
- Spansion LLC
- Manuj Rathor
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device with improved performance
- Patent number 8,373,148
- Issue date Feb 12, 2013
- Spansion LLC
- Zhida Lan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Damascene metal-insulator-metal (MIM) device with improved scaleabi...
- Patent number 8,232,175
- Issue date Jul 31, 2012
- Spansion LLC
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metal-insulator-metal-insulator-metal (MIMIM) memory device
- Patent number 8,093,680
- Issue date Jan 10, 2012
- Spansion LLC
- Manuj Rathor
- G11 - INFORMATION STORAGE
Information Patent Grant
Gettering/stop layer for prevention of reduction of insulating oxid...
- Patent number 8,093,698
- Issue date Jan 10, 2012
- Spansion LLC
- Manuj Rathor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Damascene metal-insulator-metal (MIM) device
- Patent number 8,089,113
- Issue date Jan 3, 2012
- Spansion LLC
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for development of metal-insulator-metal (MIM) devices
- Patent number 8,084,770
- Issue date Dec 27, 2011
- Spansion LLC
- Steven Avanzino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Diode and resistive memory device structures
- Patent number 8,035,099
- Issue date Oct 11, 2011
- Spansion LLC
- Manuj Rathor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a semiconductor structure comprising a field effe...
- Patent number 7,772,077
- Issue date Aug 10, 2010
- Advanced Micro Devices, Inc.
- Andreas Gehring
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structures for development of metal-insulator-metal (MIM) devices
- Patent number 7,468,525
- Issue date Dec 23, 2008
- Spansion LLC
- Steven Avanzino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Increasing self-aligned contact areas in integrated circuits using...
- Patent number 7,323,377
- Issue date Jan 29, 2008
- Cypress Semiconductor Corporation
- Mehran Sedigh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing an oxide-nitride-oxide (ONO) dielectric for...
- Patent number 6,969,689
- Issue date Nov 29, 2005
- Krishnaswamy Ramkumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing a dielectric layer for a silicon-oxide-nitr...
- Patent number 6,818,558
- Issue date Nov 16, 2004
- Cypress Semiconductor Corporation
- Manuj Rathor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for annealing semiconductors and/or integrated circuits
- Patent number 6,624,052
- Issue date Sep 23, 2003
- Cypress Semiconductor Corporation
- Krishnaswamy Ramkumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for annealing semiconductors and/or integrated circuits
- Patent number 6,436,799
- Issue date Aug 20, 2002
- Cypress Semiconductor, Corporation
- Krishnaswamy Ramkumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma etch chemistry and method of improving etch control
- Patent number 6,372,634
- Issue date Apr 16, 2002
- Cypress Semiconductor Corp.
- Jianmin Qiao
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DAMASCENE METAL-INSULATOR-METAL (MIM) DEVICE IMPROVED SCALEABILITY
- Publication number 20120276706
- Publication date Nov 1, 2012
- Suzette K. PANGRLE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METAL-INSULATOR-METAL-INSULATOR-METAL (MIMIM) MEMORY DEVICE
- Publication number 20120081947
- Publication date Apr 5, 2012
- Manuj RATHOR
- G11 - INFORMATION STORAGE
Information Patent Application
DIODE AND RESISTIVE MEMORY DEVICE STRUCTURES
- Publication number 20120025161
- Publication date Feb 2, 2012
- Manuj Rathor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Diode and resistive memory device structures
- Publication number 20090212283
- Publication date Aug 27, 2009
- Manuj Rathor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test Stuctures for development of metal-insulator-metal (MIM) devices
- Publication number 20090072234
- Publication date Mar 19, 2009
- Steven Avanzino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Memory device with improved performance
- Publication number 20080265240
- Publication date Oct 30, 2008
- Spansion LLC, Advanced Micro Devices, Inc.
- Zhida Lan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Gettering/stop layer for prevention of reduction of insulating oxid...
- Publication number 20080130195
- Publication date Jun 5, 2008
- Spansion LLC
- Manuj Rathor
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test structures for development of metal-insulator-metal (MIM) devices
- Publication number 20080128691
- Publication date Jun 5, 2008
- Spansion LLC
- Steven Avanzino
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Damascene metal-insulator-metal (MIM) device
- Publication number 20080132068
- Publication date Jun 5, 2008
- Spansion LLC, Advanced Micro Devices, Inc.
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Damascene metal-insulator-metal (MIM) device with improved scaleabi...
- Publication number 20080123401
- Publication date May 29, 2008
- Spansion LLC
- Suzette K. Pangrle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING A FIELD EFFE...
- Publication number 20080102590
- Publication date May 1, 2008
- Andreas Gehring
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for annealing semiconductors and/or integrated circuits
- Publication number 20020177290
- Publication date Nov 28, 2002
- Krishnaswamy Ramkumar
- H01 - BASIC ELECTRIC ELEMENTS

Manuj Rathor

Person

Patents Grantslast 30 patents

Damascene metal-insulator-metal (MIM) device with improved scaleabi...

Diode and resistive memory device structures

Metal-insulator-metal-insulator-metal (MIMIM) memory device

Memory device with improved performance

Damascene metal-insulator-metal (MIM) device with improved scaleabi...

Metal-insulator-metal-insulator-metal (MIMIM) memory device

Gettering/stop layer for prevention of reduction of insulating oxid...

Damascene metal-insulator-metal (MIM) device

Test structures for development of metal-insulator-metal (MIM) devices

Diode and resistive memory device structures

Method of forming a semiconductor structure comprising a field effe...

Test structures for development of metal-insulator-metal (MIM) devices

Increasing self-aligned contact areas in integrated circuits using...

Method of manufacturing an oxide-nitride-oxide (ONO) dielectric for...

Method of manufacturing a dielectric layer for a silicon-oxide-nitr...

Process for annealing semiconductors and/or integrated circuits

Process for annealing semiconductors and/or integrated circuits

Plasma etch chemistry and method of improving etch control

Patents Applicationslast 30 patents

DAMASCENE METAL-INSULATOR-METAL (MIM) DEVICE IMPROVED SCALEABILITY

METAL-INSULATOR-METAL-INSULATOR-METAL (MIMIM) MEMORY DEVICE

DIODE AND RESISTIVE MEMORY DEVICE STRUCTURES

Diode and resistive memory device structures

Test Stuctures for development of metal-insulator-metal (MIM) devices

Memory device with improved performance

Gettering/stop layer for prevention of reduction of insulating oxid...

Test structures for development of metal-insulator-metal (MIM) devices

Damascene metal-insulator-metal (MIM) device

Damascene metal-insulator-metal (MIM) device with improved scaleabi...

METHOD OF FORMING A SEMICONDUCTOR STRUCTURE COMPRISING A FIELD EFFE...

Process for annealing semiconductors and/or integrated circuits