Margaret Lecko Gibson

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Underhill Center, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of stabilizing oxide etch and chamber performance using seas...
- Patent number 6,899,785
- Issue date May 31, 2005
- International Business Machines Corporation
- Kellie L. Dutra
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned copper silicide formation for improved adhesion/electr...
- Patent number 6,818,992
- Issue date Nov 16, 2004
- International Business Machines Corporation
- Douglas S. Armbrust
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating a nitrided silicon-oxide gate dielectric
- Patent number 6,780,720
- Issue date Aug 24, 2004
- International Business Machines Corporation
- Jay S. Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monitor for verification of ozone reaction
- Patent number 6,368,867
- Issue date Apr 9, 2002
- International Business Machines Corporation
- Margaret Lecko Gibson
- G01 - MEASURING TESTING
Information Patent Grant
Self-aligned copper silicide formation for improved adhesion/electr...
- Patent number 6,251,775
- Issue date Jun 26, 2001
- International Business Machines Corporation
- Douglas S. Armbrust
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for fabricating a nitrided silicon-oxide gate dielectric
- Publication number 20040002226
- Publication date Jan 1, 2004
- International Business Machines Corporation
- Jay S. Burnham
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of stabilizing oxide etch and chamber performance using seas...
- Publication number 20030092272
- Publication date May 15, 2003
- Kellie L. Dutra
- H01 - BASIC ELECTRIC ELEMENTS