Mari Shibayama

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor module
- Patent number 6,708,302
- Issue date Mar 16, 2004
- Renesas Technology Corp.
- Mari Shibayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor testing apparatus for testing semiconductor device in...
- Patent number 6,584,592
- Issue date Jun 24, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Omura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing apparatus for testing semiconductor device in...
- Patent number 6,311,300
- Issue date Oct 30, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Omura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor testing apparatus for testing semiconductor device in...
- Publication number 20010021988
- Publication date Sep 13, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Ryuji Omura
- G01 - MEASURING TESTING