Mark A. Finn

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Mountain View, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
High-resistance contact detection test mode
- Patent number 6,910,164
- Issue date Jun 21, 2005
- Cypress Semiconductor Corp.
- Mark Finn
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan path circuitry including a programmable delay circuit
- Patent number 6,286,118
- Issue date Sep 4, 2001
- Cypress Semiconductor Corporation
- Jonathan F. Churchill
- G01 - MEASURING TESTING
Information Patent Grant
Scan path circuitry for programming a variable clock pulse width
- Patent number 6,115,836
- Issue date Sep 5, 2000
- Cypress Semiconductor Corporation
- Jonathan F. Churchill
- G01 - MEASURING TESTING
Information Patent Grant
Test mode features for synchronous pipelined memories
- Patent number 6,006,347
- Issue date Dec 21, 1999
- Cypress Semiconductor Corporation
- Jonathan F. Churchill
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan path circuitry including an output register having a flow thro...
- Patent number 5,953,285
- Issue date Sep 14, 1999
- Cypress Semiconductor Corp.
- Jonathan F. Churchill
- G11 - INFORMATION STORAGE
Information Patent Grant
Scan path circuitry including a programmable delay circuit
- Patent number 5,936,977
- Issue date Aug 10, 1999
- Cypress Semiconductor Corp.
- Jonathan F. Churchill
- G01 - MEASURING TESTING