Mark A. Swart

Person

Villa Park, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wiring board for testing loaded printed circuit board
- Patent number 9,753,058
- Issue date Sep 5, 2017
- Xcerra Corporation
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Wiring board for testing loaded printed circuit board
- Patent number 8,907,694
- Issue date Dec 9, 2014
- Xcerra Corporation
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Terminal for flat test probe
- Patent number 8,710,856
- Issue date Apr 29, 2014
- LTX-Credence Corporation
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 8,523,579
- Issue date Sep 3, 2013
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Scrub inducing compliant electrical contact
- Patent number 8,324,919
- Issue date Dec 4, 2012
- Delaware Capital Formation, Inc.
- Scott Chabineau-Lovgren
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 8,231,416
- Issue date Jul 31, 2012
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Flat plunger round barrel test probe
- Patent number 8,105,119
- Issue date Jan 31, 2012
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Spring contact assembly
- Patent number 7,862,391
- Issue date Jan 4, 2011
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor electromechanical contact
- Patent number 7,695,286
- Issue date Apr 13, 2010
- Delaware Capital Formation, Inc.
- Mark Swart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for scan testing printed circuit boards
- Patent number 7,071,716
- Issue date Jul 4, 2006
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for scan testing printed circuit boards
- Patent number 6,788,078
- Issue date Sep 7, 2004
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Loading mechanism for automated verification and repair station
- Patent number 6,366,107
- Issue date Apr 2, 2002
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Screen display for automated verification and repair station
- Patent number 6,329,830
- Issue date Dec 11, 2001
- Delaware Capital Formation, Inc.
- Doug Tackett
- G01 - MEASURING TESTING
Information Patent Grant
Biased BGA contactor probe tip
- Patent number 6,271,672
- Issue date Aug 7, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Printed circuit board test apparatus
- Patent number 6,268,719
- Issue date Jul 31, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Camera system for automated verification and repair station
- Patent number 6,259,262
- Issue date Jul 10, 2001
- Delware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Test socket
- Patent number 6,204,680
- Issue date Mar 20, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for matched impedance testing
- Patent number 6,191,601
- Issue date Feb 20, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Scan test apparatus for continuity testing of bare printed circuit...
- Patent number 6,191,600
- Issue date Feb 20, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Test socket
- Patent number 6,084,421
- Issue date Jul 4, 2000
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Floating spring probe wireless test fixture
- Patent number 6,066,957
- Issue date May 23, 2000
- Delaware Capital Formation, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
TDR tester for x-y prober
- Patent number 6,051,978
- Issue date Apr 18, 2000
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Floating spring probe wireless test fixture
- Patent number 6,025,729
- Issue date Feb 15, 2000
- Delaware Capital Formation, Inc.
- David Van Loan
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture with self contained shorting means for testing small s...
- Patent number 5,990,696
- Issue date Nov 23, 1999
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Translator fixture with force applying blind pins
- Patent number 5,898,314
- Issue date Apr 27, 1999
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Solid spring electrical contacts for electrical connectors and probes
- Patent number 5,865,641
- Issue date Feb 2, 1999
- Delaware Capital Formation
- Mark A. Swart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe plunger tip
- Patent number D400811
- Issue date Nov 10, 1998
- Delaware Capital Formation, Inc.
- Mark A. Swart
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Circuit board loading assembly
- Patent number 5,807,063
- Issue date Sep 15, 1998
- Delaware Capital Formation, Inc.
- Mark A. Swart
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Spring probe and method for biasing
- Patent number 5,801,544
- Issue date Sep 1, 1998
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Grant
Translator fixture with module for expanding test points
- Patent number 5,798,654
- Issue date Aug 25, 1998
- Everett Charles Technologies, Inc.
- David R. Van Loan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD
- Publication number 20150054539
- Publication date Feb 26, 2015
- XCERRA CORPORATION
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT TEST SOCKET HAVING TEST PROBE INSERTS
- Publication number 20130069685
- Publication date Mar 21, 2013
- Mark A. SWART
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20120282821
- Publication date Nov 8, 2012
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL FOR FLAT TEST PROBE
- Publication number 20110175636
- Publication date Jul 21, 2011
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD
- Publication number 20110148451
- Publication date Jun 23, 2011
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20110039457
- Publication date Feb 17, 2011
- Delaware Capital Formation, Inc.
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
SWAGING PROCESS FOR IMPROVED COMPLIANT CONTACT ELECTRICAL TEST PERF...
- Publication number 20100267291
- Publication date Oct 21, 2010
- Scott Chabineau-Lovgren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCRUB INDUCING COMPLIANT ELECTRICAL CONTACT
- Publication number 20100244875
- Publication date Sep 30, 2010
- Scott Chabineau-Lovgren
- G01 - MEASURING TESTING
Information Patent Application
FLAT PLUNGER ROUND BARREL TEST PROBE
- Publication number 20100197176
- Publication date Aug 5, 2010
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR ELECTROMECHANICAL CONTACT
- Publication number 20090075497
- Publication date Mar 19, 2009
- Mark Swart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPRING CONTACT ASSEMBLY
- Publication number 20090075529
- Publication date Mar 19, 2009
- Charles J. Johnston
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for scan testing printed circuit boards
- Publication number 20050001640
- Publication date Jan 6, 2005
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for scan testing printed circuit boards
- Publication number 20030094961
- Publication date May 22, 2003
- Mark A. Swart
- G01 - MEASURING TESTING
Information Patent Application
TEST PIN WITH REMOVABLE HEAD
- Publication number 20010033180
- Publication date Oct 25, 2001
- MARK A. SWART
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD TESTING APPARATUS
- Publication number 20010015641
- Publication date Aug 23, 2001
- MARK A. SWART
- G01 - MEASURING TESTING
Information Patent Application
LOADING MECHANISM FOR AUTOMATED VERIFICATION AND REPAIR STATION
- Publication number 20010011901
- Publication date Aug 9, 2001
- MARK A. SWART
- G01 - MEASURING TESTING
Information Patent Application
Test socket
- Publication number 20010000947
- Publication date May 10, 2001
- Delaware Capital Formation, Inc.
- Mark A. Swart
- G01 - MEASURING TESTING

Mark A. Swart

Person

Patents Grantslast 30 patents

Wiring board for testing loaded printed circuit board

Wiring board for testing loaded printed circuit board

Terminal for flat test probe

Spring contact assembly

Scrub inducing compliant electrical contact

Spring contact assembly

Flat plunger round barrel test probe

Spring contact assembly

Semiconductor electromechanical contact

Apparatus for scan testing printed circuit boards

Apparatus for scan testing printed circuit boards

Loading mechanism for automated verification and repair station

Screen display for automated verification and repair station

Biased BGA contactor probe tip

Printed circuit board test apparatus

Camera system for automated verification and repair station

Test socket

Test fixture for matched impedance testing

Scan test apparatus for continuity testing of bare printed circuit...

Test socket

Floating spring probe wireless test fixture

TDR tester for x-y prober

Floating spring probe wireless test fixture

Test fixture with self contained shorting means for testing small s...

Translator fixture with force applying blind pins

Solid spring electrical contacts for electrical connectors and probes

Test probe plunger tip

Circuit board loading assembly

Spring probe and method for biasing

Translator fixture with module for expanding test points

Patents Applicationslast 30 patents

WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD

INTEGRATED CIRCUIT TEST SOCKET HAVING TEST PROBE INSERTS

SPRING CONTACT ASSEMBLY

TERMINAL FOR FLAT TEST PROBE

WIRING BOARD FOR TESTING LOADED PRINTED CIRCUIT BOARD

SPRING CONTACT ASSEMBLY

SWAGING PROCESS FOR IMPROVED COMPLIANT CONTACT ELECTRICAL TEST PERF...

SCRUB INDUCING COMPLIANT ELECTRICAL CONTACT

FLAT PLUNGER ROUND BARREL TEST PROBE

SEMICONDUCTOR ELECTROMECHANICAL CONTACT

SPRING CONTACT ASSEMBLY

Apparatus for scan testing printed circuit boards

Apparatus for scan testing printed circuit boards

TEST PIN WITH REMOVABLE HEAD

CIRCUIT BOARD TESTING APPARATUS

LOADING MECHANISM FOR AUTOMATED VERIFICATION AND REPAIR STATION

Test socket