Mark DiManna

Person

Fremont, NH, US

People

Patents Grantslast 30 patents

Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,270,774
- Issue date Apr 8, 2025
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
System to inspect, modify or analyze a region of interest of a samp...
- Patent number 12,044,638
- Issue date Jul 23, 2024
- Carl Zeiss SMT GmbH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,612
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system and method of operating a charged part...
- Patent number 9,530,611
- Issue date Dec 27, 2016
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle source with light monitoring for tip temperature d...
- Patent number 8,993,981
- Issue date Mar 31, 2015
- Carl Zeiss Microscopy, LLC
- John Notte
- G05 - CONTROLLING REGULATING
Information Patent Grant
Ion sources, systems and methods
- Patent number 8,633,451
- Issue date Jan 21, 2014
- Carl Zeiss Microscopy, LLC
- Billy W. Ward
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Dual beam system
- Patent number 8,399,864
- Issue date Mar 19, 2013
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam system
- Patent number 8,013,311
- Issue date Sep 6, 2011
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam system
- Patent number 7,601,976
- Issue date Oct 13, 2009
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual beam system
- Patent number 7,161,159
- Issue date Jan 9, 2007
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20240288391
- Publication date Aug 29, 2024
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT...
- Publication number 20230402251
- Publication date Dec 14, 2023
- Carl Zeiss SMT GmbH
- Louise Barris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...
- Publication number 20220260508
- Publication date Aug 18, 2022
- Carl Zeiss SMT GMBH
- John A. Notte
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008341
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
- Publication number 20150008342
- Publication date Jan 8, 2015
- Carl Zeiss Microscopy, LLC
- John A. Notte
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COOLED CHARGED PARTICLE SYSTEMS AND METHODS
- Publication number 20130118184
- Publication date May 16, 2013
- CARL ZEISS NTS, LLC.
- Alexander Groholski
- F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information Patent Application
ION SOURCES, SYSTEMS AND METHODS
- Publication number 20120241640
- Publication date Sep 27, 2012
- CARL ZEISS NTS, LLC.
- Billy W. Ward
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Application
METHODS AND SYSTEMS FOR HEATING A TIP APEX OF A CHARGED PARTICLE SO...
- Publication number 20120074318
- Publication date Mar 29, 2012
- CARL ZEISS NTS, LLC.
- John Notte, IV
- G05 - CONTROLLING REGULATING
Information Patent Application
Dual Beam System
- Publication number 20110309263
- Publication date Dec 22, 2011
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual Beam System
- Publication number 20100025578
- Publication date Feb 4, 2010
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual beam system
- Publication number 20080035860
- Publication date Feb 14, 2008
- FEI Company
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dual beam system
- Publication number 20050035291
- Publication date Feb 17, 2005
- Raymond Hill
- H01 - BASIC ELECTRIC ELEMENTS

Mark DiManna

Person

Patents Grantslast 30 patents

System to inspect, modify or analyze a region of interest of a samp...

System to inspect, modify or analyze a region of interest of a samp...

Charged particle beam system and method of operating a charged part...

Charged particle beam system and method of operating a charged part...

Charged particle source with light monitoring for tip temperature d...

Ion sources, systems and methods

Dual beam system

Dual beam system

Dual beam system

Dual beam system

Patents Applicationslast 30 patents

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

GAS INJECTION SUBSYSTEM FOR USE IN AN INSPECTION SYSTEM TO INSPECT...

SYSTEM TO INSPECT, MODIFY OR ANALYZE A REGION OF INTEREST OF A SAMP...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...

COOLED CHARGED PARTICLE SYSTEMS AND METHODS

ION SOURCES, SYSTEMS AND METHODS

METHODS AND SYSTEMS FOR HEATING A TIP APEX OF A CHARGED PARTICLE SO...

Dual Beam System

Dual Beam System

Dual beam system

Dual beam system