Mark E. Mason

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Dallas, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Test method and system for characterizing and/or refining an IC des...
- Patent number 8,051,398
- Issue date Nov 1, 2011
- Texas Instruments Incorporated
- Clive D. Bittlestone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for positioning sub-resolution assist features
- Patent number 7,694,269
- Issue date Apr 6, 2010
- Texas Instruments Incorporated
- Nagaraj Savithri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for varying the transmission of an attenuated pha...
- Patent number 6,436,588
- Issue date Aug 20, 2002
- Texas Instruments Incorporated
- Mark E. Mason
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Test Method and System for Characterizing and/or Refining an IC Des...
- Publication number 20090037854
- Publication date Feb 5, 2009
- Clive D. Bittlestone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR POSITIONING SUB-RESOLUTION ASSIST FEATURES
- Publication number 20080203518
- Publication date Aug 28, 2008
- Nagaraj Savithri
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
More accurate and physical method to account for lithographic and e...
- Publication number 20070141476
- Publication date Jun 21, 2007
- TEXAS INSTRUMENTS INCORPORATED
- Lewis W. Flanagin
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Layout modification to eliminate line bending caused by line materi...
- Publication number 20060292885
- Publication date Dec 28, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Vladimir Alexeevich Ukraintsev
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY