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Mark Eyolfson
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Boise, ID, US
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for analyzing electrical failure data
Patent number
7,319,935
Issue date
Jan 15, 2008
Micron Technology, Inc.
Xueqing Sun
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
7,102,737
Issue date
Sep 5, 2006
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
6,704,107
Issue date
Mar 9, 2004
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
6,369,887
Issue date
Apr 9, 2002
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Methods of thermal processing and rapid thermal processing
Patent number
6,287,927
Issue date
Sep 11, 2001
Micron Technology, Inc.
Robert Burke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for automated, in situ material detection usin...
Patent number
6,256,094
Issue date
Jul 3, 2001
Micron Technology, Inc.
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Grant
Methods of thermal processing and rapid thermal processing
Patent number
6,090,677
Issue date
Jul 18, 2000
Micron Technology, Inc.
Robert Burke
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
System and method for analyzing electrical failure data
Publication number
20060265156
Publication date
Nov 23, 2006
Micron Technology, Inc.
Xueqing Sun
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for automated, in situ material detection usin...
Publication number
20040224429
Publication date
Nov 11, 2004
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Application
System and method for analyzing electrical failure data
Publication number
20040158783
Publication date
Aug 12, 2004
Micron Technology, Inc.
Xueqing Sun
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for automated, in situ material detection usin...
Publication number
20020093642
Publication date
Jul 18, 2002
Mark Eyolfson
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for automated, in situ material detection usin...
Publication number
20010013930
Publication date
Aug 16, 2001
Mark Eyolfson
G01 - MEASURING TESTING