Mark H. Werlich

Person

Fremont, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Ion mobility spectrometry-mass spectrometry (IMS-MS) with improved...
- Patent number 9,455,132
- Issue date Sep 27, 2016
- Agilent Technologies, Inc.
- Alexander Mordehai
- G01 - MEASURING TESTING
Information Patent Grant
Ion processing utilizing segmented vacuum manifold
- Patent number 9,281,173
- Issue date Mar 8, 2016
- Agilent Technologies, Inc.
- Alexander Mordehai
- G01 - MEASURING TESTING
Information Patent Grant
Ion sources for improved ionization
- Patent number 8,530,832
- Issue date Sep 10, 2013
- Agilent Technologies, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion funnel for mass spectrometry
- Patent number 8,324,565
- Issue date Dec 4, 2012
- Agilent Technologies, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vacuum divider for differential pumping of a vacuum system
- Patent number 8,147,222
- Issue date Apr 3, 2012
- Agilent Technologies, Inc.
- Alexander Mordehai
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Ion sources for improved ionization
- Patent number 8,039,795
- Issue date Oct 18, 2011
- Agilent Technologies, Inc.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sampling apparatuses in fast polarity-switching ion sources
- Patent number 7,547,891
- Issue date Jun 16, 2009
- Agilent Technologies, Inc.
- Alex Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,797,946
- Issue date Sep 28, 2004
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,639,216
- Issue date Oct 28, 2003
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,498,343
- Issue date Dec 24, 2002
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,294,779
- Issue date Sep 25, 2001
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,278,110
- Issue date Aug 21, 2001
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry
- Patent number RE36892
- Issue date Oct 3, 2000
- Agilent Technologies
- James A. Apffel
- 250 - Radiant energy
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 5,750,988
- Issue date May 12, 1998
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Automated calibrant system for use in a liquid separation/mass spec...
- Patent number 5,703,360
- Issue date Dec 30, 1997
- Hewlett-Packard Company
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for electrospray LC/MS
- Patent number 5,495,108
- Issue date Feb 27, 1996
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ION PROCESSING UTILIZING SEGMENTED VACUUM MANIFOLD
- Publication number 20140353483
- Publication date Dec 4, 2014
- Alexander Mordehai
- G01 - MEASURING TESTING
Information Patent Application
ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY (IMS-MS) WITH IMPROVED...
- Publication number 20140353493
- Publication date Dec 4, 2014
- Alexander Mordehai
- G01 - MEASURING TESTING
Information Patent Application
Ion Sources for Improved Ionization
- Publication number 20120025071
- Publication date Feb 2, 2012
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION FUNNEL FOR MASS SPECTROMETRY
- Publication number 20110147575
- Publication date Jun 23, 2011
- AGILENT TECHNOLOGIES, INC.
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Sources For Improved Ionization
- Publication number 20090250608
- Publication date Oct 8, 2009
- Alexander Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Vacuum Divider for Differential Pumping of a Vacuum System
- Publication number 20080283125
- Publication date Nov 20, 2008
- AGILENT TECHNOLOGIES, INC.
- Alexander Mordehai
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Application
ION SAMPLING APPARATUSES IN FAST POLARITY-SWITCHING ION SOURCES
- Publication number 20080197275
- Publication date Aug 21, 2008
- Alex Mordehai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Orthogonal ion sampling for apci mass spectrometry
- Publication number 20040046118
- Publication date Mar 11, 2004
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20030075680
- Publication date Apr 24, 2003
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20010042829
- Publication date Nov 22, 2001
- James A. Apffel
- G01 - MEASURING TESTING

Mark H. Werlich

Person

Patents Grantslast 30 patents

Ion mobility spectrometry-mass spectrometry (IMS-MS) with improved...

Ion processing utilizing segmented vacuum manifold

Ion sources for improved ionization

Ion funnel for mass spectrometry

Vacuum divider for differential pumping of a vacuum system

Ion sources for improved ionization

Ion sampling apparatuses in fast polarity-switching ion sources

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Automated calibrant system for use in a liquid separation/mass spec...

Orthogonal ion sampling for electrospray LC/MS

Patents Applicationslast 30 patents

ION PROCESSING UTILIZING SEGMENTED VACUUM MANIFOLD

ION MOBILITY SPECTROMETRY-MASS SPECTROMETRY (IMS-MS) WITH IMPROVED...

Ion Sources for Improved Ionization

ION FUNNEL FOR MASS SPECTROMETRY

Ion Sources For Improved Ionization

Vacuum Divider for Differential Pumping of a Vacuum System

ION SAMPLING APPARATUSES IN FAST POLARITY-SWITCHING ION SOURCES

Orthogonal ion sampling for apci mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry