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Mark L. Jones
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Boise, ID, US
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Patents Grants
last 30 patents
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Patent Grant
Methods for non-lot-based manufacturing of articles
Patent number
8,600,540
Issue date
Dec 3, 2013
Micron Technology, Inc.
Mark L. Jones
G05 - CONTROLLING REGULATING
Information
Patent Grant
Methods for non lot-based integrated circuit manufacturing
Patent number
8,315,730
Issue date
Nov 20, 2012
Micron Technology, Inc.
Mark L. Jones
G05 - CONTROLLING REGULATING
Information
Patent Grant
Process and method for continuous, non lot-based integrated circuit...
Patent number
7,738,988
Issue date
Jun 15, 2010
Micron Technology, Inc.
Mark L. Jones
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Process and method for continuous, non lot-based integrated circuit...
Patent number
7,555,358
Issue date
Jun 30, 2009
Micron Technology, Inc.
Mark L. Jones
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for continuous, non lot-based integrated circuit manufacturing
Patent number
6,427,092
Issue date
Jul 30, 2002
Micron Technology, Inc.
Mark L. Jones
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for continuous, non lot-based integrated circuit manufacturing
Patent number
5,856,923
Issue date
Jan 5, 1999
Micron Technology, Inc.
Mark L. Jones
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHODS FOR NON LOT BASED INTEGRATED CIRCUIT MANUFACTURING
Publication number
20130006411
Publication date
Jan 3, 2013
Micron Technology, Inc.
Mark L. Jones
G01 - MEASURING TESTING
Information
Patent Application
METHODS FOR NON LOT-BASED INTEGRATED CIRCUIT MANUFACTURING
Publication number
20100222913
Publication date
Sep 2, 2010
Micron Technology, Inc.
Mark L. Jones
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PROCESS AND METHOD FOR CONTINUOUS, NON LOT-BASED INTEGRATED CIRCUIT...
Publication number
20070239307
Publication date
Oct 11, 2007
Mark L. Jones
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for continuous, non lot-based integrated circuit manufacturing
Publication number
20020183884
Publication date
Dec 5, 2002
Mark L. Jones
G01 - MEASURING TESTING