Mark Masters

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of operating a nanoprober to electrically probe a device st...
- Patent number 8,536,526
- Issue date Sep 17, 2013
- International Business Machines Corporation
- Paul D. Bell
- G01 - MEASURING TESTING
Information Patent Grant
Shared gate for conventional planar device and horizontal CNT
- Patent number 8,039,334
- Issue date Oct 18, 2011
- International Business Machines Corporation
- Toshiharu Furukawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Shared gate for conventional planar device and horizontal CNT
- Patent number 7,838,943
- Issue date Nov 23, 2010
- International Business Machines Corporation
- Toshiharu Furukawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of forming a dual gated FinFET gain cell
- Patent number 7,674,674
- Issue date Mar 9, 2010
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming a dual gated FinFET gain cell
- Patent number 7,566,613
- Issue date Jul 28, 2009
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vertical carbon nanotube transistor integration
- Patent number 7,535,016
- Issue date May 19, 2009
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit diagnosing method, system, and program product
- Patent number 7,503,021
- Issue date Mar 10, 2009
- International Business Machines Corporation
- Matt Boucher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated carbon nanotube sensors
- Patent number 7,484,423
- Issue date Feb 3, 2009
- International Business Machines Corporation
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Grant
Method for making integrated circuit chip having carbon nanotube co...
- Patent number 7,473,633
- Issue date Jan 6, 2009
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated carbon nanotube sensors
- Patent number 7,247,877
- Issue date Jul 24, 2007
- International Business Machines Corporation
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit chip utilizing carbon nanotube composite interco...
- Patent number 7,135,773
- Issue date Nov 14, 2006
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Horizontal memory gain cells
- Patent number 7,109,546
- Issue date Sep 19, 2006
- International Business Machines Corporation
- Toshiharu Furukawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Canary device for failure analysis
- Patent number 7,089,138
- Issue date Aug 8, 2006
- International Business Machines Corporation
- Pierre J. Bouchard
- G01 - MEASURING TESTING
Information Patent Grant
Dual gated finfet gain cell
- Patent number 6,970,372
- Issue date Nov 29, 2005
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing and structure for visual and electrical test of...
- Patent number 6,627,926
- Issue date Sep 30, 2003
- International Business Machines Corporation
- Thomas J. Hartswick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit wiring
- Patent number 6,307,162
- Issue date Oct 23, 2001
- International Business Machines Corporation
- Mark E. Masters
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of designing and structure for visual and electrical test of...
- Patent number 6,251,773
- Issue date Jun 26, 2001
- International Business Machines Corporation
- Thomas J. Hartswick
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SHARED GATE FOR CONVENTIONAL PLANAR DEVICE AND HORIZONTAL CNT
- Publication number 20110027951
- Publication date Feb 3, 2011
- International Business Machines Corporation
- Toshiharu Furukawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHODS OF OPERATING A NANOPROBER TO ELECTRICALLY PROBE A DEVICE ST...
- Publication number 20100163727
- Publication date Jul 1, 2010
- International Business Machines Corporation
- Paul D. Bell
- G01 - MEASURING TESTING
Information Patent Application
DUAL GATED FINFET GAIN CELL
- Publication number 20080261363
- Publication date Oct 23, 2008
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CARBON NANOTUBE SENSORS
- Publication number 20070197010
- Publication date Aug 23, 2007
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Application
SHARED GATE FOR CONVENTIONAL PLANAR DEVICE AND HORIZONTAL CNT
- Publication number 20070021293
- Publication date Jan 25, 2007
- International Business Machines Corporation
- Toshiharu Furukawa
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
METHOD FOR MAKING INTEGRATED CIRCUIT CHIP HAVING CARBON NANOTUBE CO...
- Publication number 20060292861
- Publication date Dec 28, 2006
- International Business Machines Corporation
- Toshiharu Furukawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
CANARY DEVICE FOR FAILURE ANALYSIS
- Publication number 20060195285
- Publication date Aug 31, 2006
- International Business Machines Corporation
- Pierre J. Bouchard
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL CARBON NANOTUBE TRANSISTOR INTEGRATION
- Publication number 20060169972
- Publication date Aug 3, 2006
- International Business Machines Corporation
- Toshiharu Furukawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
INTEGRATED CARBON NANOTUBE SENSORS
- Publication number 20060038167
- Publication date Feb 23, 2006
- International Business Machines Corporation
- Mark C. Hakey
- G01 - MEASURING TESTING
Information Patent Application
Dual gated finfet gain cell
- Publication number 20060008927
- Publication date Jan 12, 2006
- International Business Machines Corporation
- Toshiharu Furukawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Horizontal memory gain cells
- Publication number 20050286293
- Publication date Dec 29, 2005
- International Business Machines Corporation
- Toshiharu Furukawa
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT DIAGNOSING METHOD, SYSTEM, AND PROGRAM PRODUCT
- Publication number 20050278667
- Publication date Dec 15, 2005
- International Business Machines Corporation
- Matt Boucher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Integrated circuit chip utilizing carbon nanotube composite interco...
- Publication number 20050189655
- Publication date Sep 1, 2005
- International Business Machines Corporation
- Toshiharu Furukawa
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method of designing and structure for visual and electrical test of...
- Publication number 20010005052
- Publication date Jun 28, 2001
- Thomas J. Hartswick
- H01 - BASIC ELECTRIC ELEMENTS

Mark Masters

Person

Patents Grantslast 30 patents

Methods of operating a nanoprober to electrically probe a device st...

Shared gate for conventional planar device and horizontal CNT

Shared gate for conventional planar device and horizontal CNT

Method of forming a dual gated FinFET gain cell

Method of forming a dual gated FinFET gain cell

Vertical carbon nanotube transistor integration

Integrated circuit diagnosing method, system, and program product

Integrated carbon nanotube sensors

Method for making integrated circuit chip having carbon nanotube co...

Integrated carbon nanotube sensors

Integrated circuit chip utilizing carbon nanotube composite interco...

Horizontal memory gain cells

Canary device for failure analysis

Dual gated finfet gain cell

Method of designing and structure for visual and electrical test of...

Integrated circuit wiring

Method of designing and structure for visual and electrical test of...

Patents Applicationslast 30 patents

SHARED GATE FOR CONVENTIONAL PLANAR DEVICE AND HORIZONTAL CNT

METHODS OF OPERATING A NANOPROBER TO ELECTRICALLY PROBE A DEVICE ST...

DUAL GATED FINFET GAIN CELL

INTEGRATED CARBON NANOTUBE SENSORS

SHARED GATE FOR CONVENTIONAL PLANAR DEVICE AND HORIZONTAL CNT

METHOD FOR MAKING INTEGRATED CIRCUIT CHIP HAVING CARBON NANOTUBE CO...

CANARY DEVICE FOR FAILURE ANALYSIS

VERTICAL CARBON NANOTUBE TRANSISTOR INTEGRATION

INTEGRATED CARBON NANOTUBE SENSORS

Dual gated finfet gain cell

Horizontal memory gain cells

INTEGRATED CIRCUIT DIAGNOSING METHOD, SYSTEM, AND PROGRAM PRODUCT

Integrated circuit chip utilizing carbon nanotube composite interco...

Method of designing and structure for visual and electrical test of...