Mark W. Michael

Person

Cedar Park, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Small diameter cable
- Patent number 12,195,916
- Issue date Jan 14, 2025
- Fort Wayne Metals Research Products, LLC
- Robert A. Mitchell
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Woven or braided tubular metal construct
- Patent number 11,497,538
- Issue date Nov 15, 2022
- Fort Wayne Metals Research Products, LLC
- Robert A. Mitchell
- D02 - YARNS MECHANICAL FINISHING OF YARNS OR ROPES WARPING OR BEAMING
Information Patent Grant
Bi-tapered spool for wire braiding machines
- Patent number 9,200,388
- Issue date Dec 1, 2015
- Fort Wayne Metals Research Products Corporation
- Jeffery L. Gallmeyer
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Electronic device and method of biasing
- Patent number 8,687,417
- Issue date Apr 1, 2014
- GlobalFoundries Inc.
- Ruigang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for fabricating a semiconductor device having decreased con...
- Patent number 8,329,519
- Issue date Dec 11, 2012
- GLOBALFOUNDRIES, INC.
- Zhonghai Shi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device having decreased contact resistance
- Patent number 8,134,208
- Issue date Mar 13, 2012
- GLOBALFOUNDRIES Inc.
- Zhonghai Shi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for design of semiconductor circuits
- Patent number 7,861,195
- Issue date Dec 28, 2010
- Advanced Mirco Devices, Inc.
- Darin A. Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Compensating for layout dimension effects in semiconductor device m...
- Patent number 7,793,240
- Issue date Sep 7, 2010
- Advanced Micro Devices, Inc.
- Akif Sultan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for fabricating a semiconductor device having an extended st...
- Patent number 7,761,838
- Issue date Jul 20, 2010
- GLOBALFOUNDRIES Inc.
- Zhonghai Shi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drawn strand filled tubing wire
- Patent number 7,745,732
- Issue date Jun 29, 2010
- Fort Wayne Metals Research Products Corporation
- Mark S. Michael
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Methods of forming contact openings
- Patent number 7,670,938
- Issue date Mar 2, 2010
- GLOBALFOUNDRIES, INC.
- David D. Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stress enhanced semiconductor device and methods for fabricating same
- Patent number 7,638,837
- Issue date Dec 29, 2009
- GlobalFoundries Inc.
- Akif Sultan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming transistor devices with different threshold volta...
- Patent number 7,598,161
- Issue date Oct 6, 2009
- Advanced Micro Devices, Inc.
- Jingrong Zhou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of quantifying variations resulting from manufacturing-indu...
- Patent number 7,504,270
- Issue date Mar 17, 2009
- Advanced Micro Devices, Inc.
- David D. Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drawn strand filled tubing wire
- Patent number 7,501,579
- Issue date Mar 10, 2009
- Fort Wayne Metals Research Products Corporation
- Mark S. Michael
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Providing stress uniformity in a semiconductor device
- Patent number 7,473,623
- Issue date Jan 6, 2009
- Advanced Micro Devices, Inc.
- Jian Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drawn strand filled tubing wire
- Patent number 7,420,124
- Issue date Sep 2, 2008
- Fort Wayne Metals Research Products Corp.
- Mark S. Michael
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Contact resistance test structure and methods of using same
- Patent number 7,391,226
- Issue date Jun 24, 2008
- Advanced Micro Devices, Inc.
- Mark W. Michael
- G01 - MEASURING TESTING
Information Patent Grant
Test structure for measuring electrical and dimensional characteris...
- Patent number 7,355,201
- Issue date Apr 8, 2008
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Test structure and method for measuring the resistance of line-end...
- Patent number 7,271,047
- Issue date Sep 18, 2007
- Advanced Micro Devices, Inc.
- Jianhong Zhu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array of gate dielectric structures to measure gate dielectric thic...
- Patent number 6,964,875
- Issue date Nov 15, 2005
- Advanced Micro Devices, Inc.
- William G. En
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Enhanced silicidation of polysilicon gate electrodes
- Patent number 6,867,130
- Issue date Mar 15, 2005
- Advanced Micro Devices, Inc.
- Olov B. Karlsson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array of gate dielectric structures to measure gate dielectric thic...
- Patent number 6,841,832
- Issue date Jan 11, 2005
- Advanced Micro Devices, Inc.
- William G. En
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nitride offset spacer to minimize silicon recess by using poly reox...
- Patent number 6,780,776
- Issue date Aug 24, 2004
- Advanced Micro Devices, Inc.
- Wen-Jie Qi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
SOI device with different silicon thicknesses
- Patent number 6,764,917
- Issue date Jul 20, 2004
- Advanced Micro Devices, Inc.
- Darin A. Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method to reduce parasitic capacitance of MOS transistors
- Patent number 6,713,357
- Issue date Mar 30, 2004
- Advanced Micro Devices, Inc.
- Hai Hong Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tri-level segmented control transistor and fabrication method
- Patent number 6,661,057
- Issue date Dec 9, 2003
- Robert Dawson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Self-aligned VT implant
- Patent number 6,566,696
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- Jon D. Cheek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Photolithographic system including light filter that compensates fo...
- Patent number 6,552,776
- Issue date Apr 22, 2003
- Advanced Micro Devices, Inc.
- Derick J. Wristers
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Implanted barrier layer for retarding upward diffusion of substrate...
- Patent number 6,410,409
- Issue date Jun 25, 2002
- Advanced Micro Devices, Inc.
- Mark I. Gardner
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SMALL DIAMETER CABLE
- Publication number 20210102335
- Publication date Apr 8, 2021
- FORT WAYNE METALS RESEARCH PRODUCTS CORP.
- Robert A. Mitchell
- D07 - ROPES CABLES OTHER THAN ELECTRIC
Information Patent Application
WOVEN OR BRAIDED TUBULAR METAL CONSTRUCT
- Publication number 20190015142
- Publication date Jan 17, 2019
- FORT WAYNE METALS RESEARCH PRODUCTS CORP.
- Robert A. Mitchell
- D03 - WEAVING
Information Patent Application
SEMICONDUCTOR DEVICE HAVING DECREASED CONTACT RESISTANCE
- Publication number 20120070987
- Publication date Mar 22, 2012
- GLOBALFOUNDRIES INC.
- Zhonghai SHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR DESIGN OF SEMICONDUCTOR CIRCUITS
- Publication number 20090193369
- Publication date Jul 30, 2009
- Advanced Micro Devices, Inc.
- Darin A. Chan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DRAWN STRAND FILLED TUBING WIRE
- Publication number 20090133899
- Publication date May 28, 2009
- FORT WAYNE METALS RESEARCH PRODUCTS CORPORATION
- Mark S. Michael
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ELECTRONIC DEVICE AND METHOD OF BIASING
- Publication number 20090090969
- Publication date Apr 9, 2009
- Advanced Micro Devices, Inc.
- Ruigang Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING DECREASED CONTACT RESISTANCE
- Publication number 20090078998
- Publication date Mar 26, 2009
- Advanced Micro Devices, Inc.
- Zhongai Shi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE HAVING AN EXTENDED ST...
- Publication number 20090081837
- Publication date Mar 26, 2009
- Advanced Micro Devices, Inc.
- Zhonghai SHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF FORMING TRANSISTOR DEVICES WITH DIFFERENT THRESHOLD VOLTA...
- Publication number 20090081860
- Publication date Mar 26, 2009
- Advanced Micro Devices, Inc.
- Jingrong ZHOU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRESS ENHANCED SEMICONDUCTOR DEVICE AND METHODS FOR FABRICATING SAME
- Publication number 20090078991
- Publication date Mar 26, 2009
- Advanced Micro Devices, Inc.
- Akif SULTAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPENSATING FOR LAYOUT DIMENSION EFFECTS IN SEMICONDUCTOR DEVICE M...
- Publication number 20080104550
- Publication date May 1, 2008
- Akif Sultan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROVIDING STRESS UNIFORMITY IN A SEMICONDUCTOR DEVICE
- Publication number 20080003789
- Publication date Jan 3, 2008
- Jian Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE FOR MEASURING ELECTRICAL AND DIMENSIONAL CHARACTERIS...
- Publication number 20070296444
- Publication date Dec 27, 2007
- Jianhong Zhu
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF QUANTIFYING VARIATIONS RESULTING FROM MANUFACTURING-INDU...
- Publication number 20070298524
- Publication date Dec 27, 2007
- DAVID D. WU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CONTACT RESISTANCE TEST STRUCTURE AND METHODS OF USING SAME
- Publication number 20070279064
- Publication date Dec 6, 2007
- Mark W. Michael
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF FORMING CONTACT OPENINGS
- Publication number 20070259513
- Publication date Nov 8, 2007
- David D. Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Drawn strand filled tubing wire
- Publication number 20060106443
- Publication date May 18, 2006
- Mark S. Michael
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Drawn strand filled tubing wire
- Publication number 20060106444
- Publication date May 18, 2006
- Mark S. Michael
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DOPANT DIFFUSION-RETARDING BARRIER REGION FORMED WITHIN POLYSILICON...
- Publication number 20020004294
- Publication date Jan 10, 2002
- MARK I. GARDNER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IGFET WITH SILICIDE CONTACT ON ULTRA-THIN GATE
- Publication number 20020003273
- Publication date Jan 10, 2002
- ROBERT DAWSON
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MAKING AN IGFET USING SOLID PHASE DIFFUSION TO DOPE THE G...
- Publication number 20010039094
- Publication date Nov 8, 2001
- DERICK J. WRISTERS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR ISOLATION REGION BOUNDED BY A TRENCH AND COVERED WITH...
- Publication number 20010020727
- Publication date Sep 13, 2001
- FRED N. HAUSE
- H01 - BASIC ELECTRIC ELEMENTS

Mark W. Michael

Person

Patents Grantslast 30 patents

Small diameter cable

Woven or braided tubular metal construct

Bi-tapered spool for wire braiding machines

Electronic device and method of biasing

Methods for fabricating a semiconductor device having decreased con...

Semiconductor device having decreased contact resistance

Process for design of semiconductor circuits

Compensating for layout dimension effects in semiconductor device m...

Method for fabricating a semiconductor device having an extended st...

Drawn strand filled tubing wire

Methods of forming contact openings

Stress enhanced semiconductor device and methods for fabricating same

Method of forming transistor devices with different threshold volta...

Methods of quantifying variations resulting from manufacturing-indu...

Drawn strand filled tubing wire

Providing stress uniformity in a semiconductor device

Drawn strand filled tubing wire

Contact resistance test structure and methods of using same

Test structure for measuring electrical and dimensional characteris...

Test structure and method for measuring the resistance of line-end...

Array of gate dielectric structures to measure gate dielectric thic...

Enhanced silicidation of polysilicon gate electrodes

Array of gate dielectric structures to measure gate dielectric thic...

Nitride offset spacer to minimize silicon recess by using poly reox...

SOI device with different silicon thicknesses

Method to reduce parasitic capacitance of MOS transistors

Tri-level segmented control transistor and fabrication method

Self-aligned VT implant

Photolithographic system including light filter that compensates fo...

Implanted barrier layer for retarding upward diffusion of substrate...

Patents Applicationslast 30 patents

SMALL DIAMETER CABLE

WOVEN OR BRAIDED TUBULAR METAL CONSTRUCT

SEMICONDUCTOR DEVICE HAVING DECREASED CONTACT RESISTANCE

PROCESS FOR DESIGN OF SEMICONDUCTOR CIRCUITS

DRAWN STRAND FILLED TUBING WIRE

ELECTRONIC DEVICE AND METHOD OF BIASING

SEMICONDUCTOR DEVICE HAVING DECREASED CONTACT RESISTANCE

METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE HAVING AN EXTENDED ST...

METHOD OF FORMING TRANSISTOR DEVICES WITH DIFFERENT THRESHOLD VOLTA...

STRESS ENHANCED SEMICONDUCTOR DEVICE AND METHODS FOR FABRICATING SAME

COMPENSATING FOR LAYOUT DIMENSION EFFECTS IN SEMICONDUCTOR DEVICE M...

PROVIDING STRESS UNIFORMITY IN A SEMICONDUCTOR DEVICE

TEST STRUCTURE FOR MEASURING ELECTRICAL AND DIMENSIONAL CHARACTERIS...

METHODS OF QUANTIFYING VARIATIONS RESULTING FROM MANUFACTURING-INDU...

CONTACT RESISTANCE TEST STRUCTURE AND METHODS OF USING SAME

METHODS OF FORMING CONTACT OPENINGS

Drawn strand filled tubing wire

Drawn strand filled tubing wire

DOPANT DIFFUSION-RETARDING BARRIER REGION FORMED WITHIN POLYSILICON...

IGFET WITH SILICIDE CONTACT ON ULTRA-THIN GATE

METHOD OF MAKING AN IGFET USING SOLID PHASE DIFFUSION TO DOPE THE G...

SEMICONDUCTOR ISOLATION REGION BOUNDED BY A TRENCH AND COVERED WITH...