Marshall D. Wilson

Person

Tampa, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Topside contact device and method for characterization of high elec...
- Patent number 11,561,254
- Issue date Jan 24, 2023
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Measuring semiconductor doping using constant surface potential cor...
- Patent number 10,969,370
- Issue date Apr 6, 2021
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Photoluminescence mapping of passivation defects for silicon photov...
- Patent number 9,685,906
- Issue date Jun 20, 2017
- Semilab SDI LLC
- Jacek Lagowski
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Accurate measurement of excess carrier lifetime using carrier decay...
- Patent number 8,912,799
- Issue date Dec 16, 2014
- Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Accurate measuring of long steady state minority carrier diffusion...
- Patent number 8,093,920
- Issue date Jan 10, 2012
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Detecting concealed security threats
- Patent number 7,188,513
- Issue date Mar 13, 2007
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for accessing container security threats and method of use
- Patent number 7,100,424
- Issue date Sep 5, 2006
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Grant
Determining composition of mixed dielectrics
- Patent number 6,815,974
- Issue date Nov 9, 2004
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Steady state method for measuring the thickness and the capacitance...
- Patent number 6,680,621
- Issue date Jan 20, 2004
- Semiconductor Diagnostics, Inc.
- Alexander Savtchouk
- G01 - MEASURING TESTING
Information Patent Grant
Steady state method for measuring the thickness and the capacitance...
- Patent number 6,597,193
- Issue date Jul 22, 2003
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of different mobile ion concentrations in the oxide lay...
- Patent number 6,569,691
- Issue date May 27, 2003
- Semiconductor Diagnostics, Inc.
- Lubomir L. Jastrzebski
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring stress induced leakage current and gate dielec...
- Patent number 6,538,462
- Issue date Mar 25, 2003
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of the interface trap charge in an oxide semiconductor...
- Patent number 6,037,797
- Issue date Mar 14, 2000
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...
- Publication number 20220381816
- Publication date Dec 1, 2022
- SEMILAB Semiconductor Physics Laboratory Co., Ltd.
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
Measuring semiconductor doping using constant surface potential cor...
- Publication number 20160356750
- Publication date Dec 8, 2016
- Semilab SDI LLC
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
PHOTOLUMINESCENCE MAPPING OF PASSIVATION DEFECTS FOR SILICON PHOTOV...
- Publication number 20150008952
- Publication date Jan 8, 2015
- Semilab SDI LLC
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASUREMENT OF EXCESS CARRIER LIFETIME USING CARRIER DECAY...
- Publication number 20130169283
- Publication date Jul 4, 2013
- Semiconductor Physics Laboratory Co., Ltd.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE MEASURING OF LONG STEADY STATE MINORITY CARRIER DIFFUSION...
- Publication number 20100085073
- Publication date Apr 8, 2010
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
DETECTING CONCEALED SECURITY THREATS
- Publication number 20060226998
- Publication date Oct 12, 2006
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACCESSING CONTAINER SECURITY THREATS AND METHOD OF USE
- Publication number 20060169025
- Publication date Aug 3, 2006
- Marshall Wilson
- G01 - MEASURING TESTING
Information Patent Application
Steady state method for measuring the thickness and the capacitance...
- Publication number 20020130674
- Publication date Sep 19, 2002
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
Steady state method for measuring the thickness and the capacitance...
- Publication number 20020125900
- Publication date Sep 12, 2002
- Alexander Savtchouk
- G01 - MEASURING TESTING

Marshall D. Wilson

Person

Patents Grantslast 30 patents

Topside contact device and method for characterization of high elec...

Measuring semiconductor doping using constant surface potential cor...

Photoluminescence mapping of passivation defects for silicon photov...

Accurate measurement of excess carrier lifetime using carrier decay...

Accurate measuring of long steady state minority carrier diffusion...

Detecting concealed security threats

Apparatus for accessing container security threats and method of use

Determining composition of mixed dielectrics

Steady state method for measuring the thickness and the capacitance...

Steady state method for measuring the thickness and the capacitance...

Measurement of different mobile ion concentrations in the oxide lay...

Method for measuring stress induced leakage current and gate dielec...

Measurement of the interface trap charge in an oxide semiconductor...

Patents Applicationslast 30 patents

TOPSIDE CONTACT DEVICE AND METHOD FOR CHARACTERIZATION OF HIGH ELEC...

Measuring semiconductor doping using constant surface potential cor...

PHOTOLUMINESCENCE MAPPING OF PASSIVATION DEFECTS FOR SILICON PHOTOV...

ACCURATE MEASUREMENT OF EXCESS CARRIER LIFETIME USING CARRIER DECAY...

ACCURATE MEASURING OF LONG STEADY STATE MINORITY CARRIER DIFFUSION...

DETECTING CONCEALED SECURITY THREATS

APPARATUS FOR ACCESSING CONTAINER SECURITY THREATS AND METHOD OF USE

Steady state method for measuring the thickness and the capacitance...

Steady state method for measuring the thickness and the capacitance...