Martin M. Liphardt

Person

Liincoln, NE, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...
- Patent number 11,885,738
- Issue date Jan 30, 2024
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Fast and accurate Mueller matrix infrared ellipsometer
- Patent number 11,821,833
- Issue date Nov 21, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
- Patent number 11,740,176
- Issue date Aug 29, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Patent number 11,675,208
- Issue date Jun 13, 2023
- J. A. Woollam Co., Inc.
- Stefan Schoeche
- G01 - MEASURING TESTING
Information Patent Grant
Snapshot ellipsometer
- Patent number 11,391,666
- Issue date Jul 19, 2022
- J. A. Woollam Co., Inc.
- Griffin A. P. Hovorka
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Patent number 11,035,729
- Issue date Jun 15, 2021
- J.A. WOQLLAM CO., INC.
- Jeremy A. Van Derslice
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,989,601
- Issue date Apr 27, 2021
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for producing a more uniform intensity waveleng...
- Patent number 10,627,288
- Issue date Apr 21, 2020
- J. A. Woollam Co., Inc.
- Martin M Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for producing a more uniform intensity waveleng...
- Patent number 10,612,976
- Issue date Apr 7, 2020
- J.A. Woollan Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Theta-theta sample positioning stage with application to sample map...
- Patent number 10,444,140
- Issue date Oct 15, 2019
- J. A. Woollam Co., Inc.
- Griffin A. P. Hovorka
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Patent number 10,422,739
- Issue date Sep 24, 2019
- J. A. Woollam Co., Inc.
- Jeremy A. Van Derslice
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflecting optics with enhanced detector system
- Patent number 10,338,362
- Issue date Jul 2, 2019
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Enhanced detector operation made possible by application of a funct...
- Patent number 10,247,611
- Issue date Apr 2, 2019
- J.A. Wooliam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Operation of an electromagnetic radiation focusing element
- Patent number 10,209,528
- Issue date Feb 19, 2019
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Reflectometer, spectrophometer, ellipsometer and polarimeter system...
- Patent number 10,132,684
- Issue date Nov 20, 2018
- J.A. Woolam Co., Inc.
- Jeremy A. Van Derslice
- G01 - MEASURING TESTING
Information Patent Grant
Information maintenance, intensity attenuation, and angle/plane of...
- Patent number 10,066,989
- Issue date Sep 4, 2018
- J. A. Woollam Co., Inc.
- Martin M Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and reflective optics
- Patent number 10,018,815
- Issue date Jul 10, 2018
- J.A. Woolam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Method of characterizing a beam of electromagnetic radiation in ell...
- Patent number 9,952,141
- Issue date Apr 24, 2018
- J. A. Woollam Co., Inc.
- Jeffrey S. Hale
- G01 - MEASURING TESTING
Information Patent Grant
Elliposometer system with polarization state generator and polariza...
- Patent number 9,933,357
- Issue date Apr 3, 2018
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and beam collecting optics with wavelength dependent...
- Patent number 9,921,395
- Issue date Mar 20, 2018
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
System for viewing samples that are undergoing ellipsometric invest...
- Patent number 9,658,151
- Issue date May 23, 2017
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for investigating change in optical properties of...
- Patent number 9,546,943
- Issue date Jan 17, 2017
- J. A. Woollam Co., Inc.
- Jeremy A. Vanderslice
- G01 - MEASURING TESTING
Information Patent Grant
Beam focusing and beam collecting optics
- Patent number 9,500,843
- Issue date Nov 22, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Grant
Reflective focusing optics
- Patent number 9,442,016
- Issue date Sep 13, 2016
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for determining average ellipsometric parameters for planar...
- Patent number 9,360,369
- Issue date Jun 7, 2016
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
In line ellipsometer system and method of use
- Patent number 9,347,768
- Issue date May 24, 2016
- J. A. Woollam Co., Inc.
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 9,041,927
- Issue date May 26, 2015
- J. A. Woollam Co., Inc.
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Grant
Method of evaluating data quality
- Patent number 8,983,787
- Issue date Mar 17, 2015
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
System for viewing samples that are undergoing ellipsometric invest...
- Patent number 8,953,030
- Issue date Feb 10, 2015
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz-infrared ellipsometer system, and method of use
- Patent number 8,934,096
- Issue date Jan 13, 2015
- University of Nebraska Board of Regents
- Craig M. Herzinger
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Fast and accurated mueller matrix infrared ellipsometer
- Publication number 20230194414
- Publication date Jun 22, 2023
- J. A. WOOLLAM CO., INC.
- STEFAN SCHOECHE
- G01 - MEASURING TESTING
Information Patent Application
Fast and accurate mueller matrix infrared spectroscopic ellipsometer
- Publication number 20230184671
- Publication date Jun 15, 2023
- J. A. WOOLLAM CO., INC.
- STEFAN SCHOECHE
- G01 - MEASURING TESTING
Information Patent Application
Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...
- Publication number 20220244169
- Publication date Aug 4, 2022
- J. A. WOOLLAM CO., INC.
- Ping He
- G02 - OPTICS
Information Patent Application
BEAM FOCUSING AND BEAM COLLECTING OPTICS
- Publication number 20160356998
- Publication date Dec 8, 2016
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Reflective focusing optics
- Publication number 20150355029
- Publication date Dec 10, 2015
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
System for viewing samples that are undergoing ellipsometric invest...
- Publication number 20150185136
- Publication date Jul 2, 2015
- J. A. WOOLLAM CO., INC.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE
- Publication number 20150153230
- Publication date Jun 4, 2015
- REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20140027644
- Publication date Jan 30, 2014
- REGENTS OF THE UNIVERSITY OF NEBRASKA (50%)
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Operation of an electromagnetic radiation focusing element
- Publication number 20130163099
- Publication date Jun 27, 2013
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
View-finder in ellipsometer or the like systems
- Publication number 20120314218
- Publication date Dec 13, 2012
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20120261580
- Publication date Oct 18, 2012
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20120206724
- Publication date Aug 16, 2012
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
System and method of aligning a sample
- Publication number 20120092653
- Publication date Apr 19, 2012
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Ellipsometric investigation and analysis of textured samples
- Publication number 20120057158
- Publication date Mar 8, 2012
- James N. Hilfiker
- G01 - MEASURING TESTING
Information Patent Application
Mounting for deviation angle self compensating substantially achrom...
- Publication number 20110188040
- Publication date Aug 4, 2011
- Ping He
- G01 - MEASURING TESTING
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20110109906
- Publication date May 12, 2011
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Terahertz-infrared ellipsometer system, and method of use
- Publication number 20100220313
- Publication date Sep 2, 2010
- Craig M. Herzinger
- G01 - MEASURING TESTING
Information Patent Application
System and method for controlling intensity of a beam of electromag...
- Publication number 20090231700
- Publication date Sep 17, 2009
- Galen L. Pfeiffer
- G02 - OPTICS
Information Patent Application
System and method of aligning a sample
- Publication number 20090207408
- Publication date Aug 20, 2009
- Martin H. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20090103093
- Publication date Apr 23, 2009
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Ellipsometric investigation and analysis of textured samples
- Publication number 20090103094
- Publication date Apr 23, 2009
- James N. Hilfiker
- G01 - MEASURING TESTING
Information Patent Application
Method of constructing a deviation angle self compensating substant...
- Publication number 20090091758
- Publication date Apr 9, 2009
- Blaine D. Johs
- G02 - OPTICS
Information Patent Application
Application of digital light processor in scanning spectrometer and...
- Publication number 20090073449
- Publication date Mar 19, 2009
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Information maintenance during intensity attenuation in focused beams
- Publication number 20080285035
- Publication date Nov 20, 2008
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
Sample orientation system and method
- Publication number 20080117413
- Publication date May 22, 2008
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
System for and method of investigating the exact same point on a sa...
- Publication number 20070097373
- Publication date May 3, 2007
- Galen L. Pfeiffer
- G01 - MEASURING TESTING
Information Patent Application
Combined spatial filter and relay systems in rotating compensator e...
- Publication number 20060268272
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Combined spatial filter and relay systems
- Publication number 20060268271
- Publication date Nov 30, 2006
- Martin M. Liphardt
- G02 - OPTICS
Information Patent Application
Sample analysis methodology utilizing electromagnetic radiation
- Publication number 20040257567
- Publication date Dec 23, 2004
- John A. Woollam
- G01 - MEASURING TESTING
Information Patent Application
Spatial filter source beam conditioning in ellipsometer and the lik...
- Publication number 20010046089
- Publication date Nov 29, 2001
- Martin M. Liphardt
- G01 - MEASURING TESTING

Martin M. Liphardt

Person

Patents Grantslast 30 patents

Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...

Fast and accurate Mueller matrix infrared ellipsometer

Fast and accurate mueller matrix infrared spectroscopic ellipsometer

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

Snapshot ellipsometer

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

Beam focusing and reflective optics

Systems and methods for producing a more uniform intensity waveleng...

Systems and methods for producing a more uniform intensity waveleng...

Theta-theta sample positioning stage with application to sample map...

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

Beam focusing and reflecting optics with enhanced detector system

Enhanced detector operation made possible by application of a funct...

Operation of an electromagnetic radiation focusing element

Reflectometer, spectrophometer, ellipsometer and polarimeter system...

Information maintenance, intensity attenuation, and angle/plane of...

Beam focusing and reflective optics

Method of characterizing a beam of electromagnetic radiation in ell...

Elliposometer system with polarization state generator and polariza...

Beam focusing and beam collecting optics with wavelength dependent...

System for viewing samples that are undergoing ellipsometric invest...

System and method for investigating change in optical properties of...

Beam focusing and beam collecting optics

Reflective focusing optics

System for determining average ellipsometric parameters for planar...

In line ellipsometer system and method of use

Terahertz-infrared ellipsometer system, and method of use

Method of evaluating data quality

System for viewing samples that are undergoing ellipsometric invest...

Terahertz-infrared ellipsometer system, and method of use

Patents Applicationslast 30 patents

Fast and accurated mueller matrix infrared ellipsometer

Fast and accurate mueller matrix infrared spectroscopic ellipsometer

Reflectometer, spectrophotometer, ellipsometer and polarimeter syst...

BEAM FOCUSING AND BEAM COLLECTING OPTICS

Reflective focusing optics

System for viewing samples that are undergoing ellipsometric invest...

TERAHERTZ-INFRARED ELLIPSOMETER SYSTEM, AND METHOD OF USE

Terahertz-infrared ellipsometer system, and method of use

Operation of an electromagnetic radiation focusing element

View-finder in ellipsometer or the like systems

Terahertz-infrared ellipsometer system, and method of use

Terahertz-infrared ellipsometer system, and method of use

System and method of aligning a sample

Ellipsometric investigation and analysis of textured samples

Mounting for deviation angle self compensating substantially achrom...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Terahertz-infrared ellipsometer system, and method of use

System and method for controlling intensity of a beam of electromag...

System and method of aligning a sample

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Ellipsometric investigation and analysis of textured samples

Method of constructing a deviation angle self compensating substant...

Application of digital light processor in scanning spectrometer and...

Information maintenance during intensity attenuation in focused beams

Sample orientation system and method

System for and method of investigating the exact same point on a sa...

Combined spatial filter and relay systems in rotating compensator e...

Combined spatial filter and relay systems

Sample analysis methodology utilizing electromagnetic radiation

Spatial filter source beam conditioning in ellipsometer and the lik...