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Marvin B. Klein
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Malibu, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Laser ultrasonic fastener load measurement probe
Patent number
11,137,304
Issue date
Oct 5, 2021
Intelligent Optical Systems, Inc.
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
System, probe and method for measurement of fastener loading
Patent number
10,527,510
Issue date
Jan 7, 2020
Optech Ventures, LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
System, device and method for measurement of fastener loading
Patent number
10,345,173
Issue date
Jul 9, 2019
Optech Ventures, LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
Device for laser-ultrasonic detection of flip chip attachment defects
Patent number
8,269,979
Issue date
Sep 18, 2012
Optech Ventures, LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
Laser ultrasonic measurement system with movable beam delivery
Patent number
8,243,280
Issue date
Aug 14, 2012
iPhoton Solutions, LLC
Marc Dubois
G01 - MEASURING TESTING
Information
Patent Grant
Optical homodyne interferometer
Patent number
8,149,421
Issue date
Apr 3, 2012
Optech Ventures, LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reduction of non-adaptive signals in photo...
Patent number
8,030,122
Issue date
Oct 4, 2011
HRL Laboratories, LLC
David M. Pepper
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for reduction of non-adaptive signals in photo...
Patent number
7,701,027
Issue date
Apr 20, 2010
HRL Laboratories, LLC
David M. Pepper
G01 - MEASURING TESTING
Information
Patent Grant
Laser-ultrasonic detection of flip chip attachment defects
Patent number
7,327,448
Issue date
Feb 5, 2008
Optech Ventures LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
Laser-ultrasonic detection of subsurface defects in processed metals
Patent number
7,278,315
Issue date
Oct 9, 2007
Op tech Ventures LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for ultrasonic vibration detection during high-pe...
Patent number
7,117,741
Issue date
Oct 10, 2006
Lasson Technologies, Inc.
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Grant
Material thickness measurement method and apparatus
Patent number
6,837,109
Issue date
Jan 4, 2005
Kawasaki Steel Corporation
Makoto Okuno
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced photo-EMF sensor with high bandwidth and large field of view
Patent number
6,818,880
Issue date
Nov 16, 2004
HRL Laboratories, LLC
David M. Pepper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Laser-based glass thickness measurement system and method
Patent number
6,496,268
Issue date
Dec 17, 2002
Innovative Technology Licensing, LLC
Andrew D. W. McKie
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced non-steady-state photo-induced electromotive force detector
Patent number
6,342,721
Issue date
Jan 29, 2002
Hughes Electronics Corporation
David Douglas Nolte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Single beam laser surface velocity and displacement measurement app...
Patent number
6,008,887
Issue date
Dec 28, 1999
Lasson Technologies, Inc.
Marvin B. Klein
G01 - MEASURING TESTING
Information
Patent Grant
Homodyne interferometer and method of sensing material
Patent number
5,900,935
Issue date
May 4, 1999
Marvin B. Klein
G01 - MEASURING TESTING
Information
Patent Grant
Double-doped BaTiO.sub.3 crystal for holographic storage
Patent number
5,847,851
Issue date
Dec 8, 1998
Hughes Electronics Corporation
Barry A. Wechsler
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical amplification system with non-orthogonal signal and distrib...
Patent number
5,729,375
Issue date
Mar 17, 1998
Hughes Electronics
Marvin B. Klein
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hybrid laser power combining and beam cleanup system using nonlinea...
Patent number
5,717,516
Issue date
Feb 10, 1998
Hughes Electronics
Marvin B. Klein
G02 - OPTICS
Information
Patent Grant
System and method for detecting ultrasound using time-delay interfe...
Patent number
5,684,592
Issue date
Nov 4, 1997
Hughes Aircraft Company
Phillip V. Mitchell
G01 - MEASURING TESTING
Information
Patent Grant
Laser-ultrasonic non-destructive, non-contacting inspection system
Patent number
5,585,921
Issue date
Dec 17, 1996
Hughes Aircraft Company
David M. Pepper
G01 - MEASURING TESTING
Information
Patent Grant
Process for making a solid optical limiter containing a graded dist...
Patent number
5,391,329
Issue date
Feb 21, 1995
Hughes Aircraft Company
Thomas K. Dougherty
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Method and apparatus for energy transfers between optical beams usi...
Patent number
5,130,849
Issue date
Jul 14, 1992
Hughes Aircraft Company
George C. Valley
G02 - OPTICS
Information
Patent Grant
Self-pumped phase conjugate mirror and method using AC-field enhanc...
Patent number
4,773,739
Issue date
Sep 27, 1988
Hughes Aircraft Company
George C. Valley
G02 - OPTICS
Information
Patent Grant
Associative holographic memory apparatus employing phase conjugate...
Patent number
4,739,496
Issue date
Apr 19, 1988
Hughes Aircraft Company
Emanuel Marom
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Erase beam apparatus and method for spatial intensity threshold det...
Patent number
4,720,176
Issue date
Jan 19, 1988
Hughes Aircraft Company
Marvin B. Klein
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electro-optic devices using Stark-induced birefringence and dichroism
Patent number
4,291,950
Issue date
Sep 29, 1981
Hughes Aircraft Company
David M. Pepper
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
LASER ULTRASONIC FASTENER LOAD MEASUREMENT PROBE
Publication number
20200141826
Publication date
May 7, 2020
Optech Ventures LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, PROBE AND METHOD FOR MEASUREMENT OF FASTENER LOADING
Publication number
20190219466
Publication date
Jul 18, 2019
Optech Ventures, LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM, DEVICE AND METHOD FOR MEASUREMENT OF FASTENER LOADING
Publication number
20170363491
Publication date
Dec 21, 2017
Optech Ventures LLC
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Application
Method and system for non-destructive inspection of a colony of str...
Publication number
20100131210
Publication date
May 27, 2010
Martin Fingerhut
G01 - MEASURING TESTING
Information
Patent Application
Laser Ultrasonic Measurement System With Movable Beam Delivery
Publication number
20090290163
Publication date
Nov 26, 2009
Marc DUBOIS
G01 - MEASURING TESTING
Information
Patent Application
Device for laser-ultrasonic detection of flip chip attachment defects
Publication number
20080216575
Publication date
Sep 11, 2008
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Application
Internal thread inspection probe
Publication number
20080079936
Publication date
Apr 3, 2008
Caterpillar Inc.
Christopher A. Kinney
G01 - MEASURING TESTING
Information
Patent Application
LASER-ULTRASONIC DETECTION OF SUBSURFACE DEFECTS IN PROCESSED METALS
Publication number
20070234809
Publication date
Oct 11, 2007
LASSON TECHNOLOGIES, INC.
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Application
Laser-ultrasonic detection of flip chip attachment defects
Publication number
20060021438
Publication date
Feb 2, 2006
LASSON TECHNOLOGIES, INC.
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Application
Method and device for ultrasonic vibration detection during high-pe...
Publication number
20050210983
Publication date
Sep 29, 2005
LASSON TECHNOLOGIES, INC.
Marvin Klein
G01 - MEASURING TESTING
Information
Patent Application
Material thickness measurement method and apparatus
Publication number
20040085550
Publication date
May 6, 2004
Kawasaki Steel Corporation
Makoto Okuno
G01 - MEASURING TESTING
Information
Patent Application
Enhanced Photo-EMF sensor with high bandwidth and large field of view
Publication number
20030151102
Publication date
Aug 14, 2003
David M. Pepper
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HOMODYNE INTERFEROMETER USING PHOTOREFRACTIVE POLYMER COMPOSITE AND...
Publication number
20010015809
Publication date
Aug 23, 2001
MARVIN B. KLEIN
G01 - MEASURING TESTING