Masafumi Asano

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for designing mask set, recording medium, template, and meth...
- Patent number 10,114,284
- Issue date Oct 30, 2018
- TOSHIBA MEMORY CORPORATION
- Shinichiro Nakagawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mold and mold manufacturing method
- Patent number 10,040,219
- Issue date Aug 7, 2018
- TOSHIBA MEMORY CORPORATION
- Yoko Takekawa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Pattern forming method, processing method, and processing apparatus
- Patent number RE46390
- Issue date May 2, 2017
- Kabushiki Kaisha Toshiba
- Masafumi Asano
Information Patent Grant
Pattern inspection method, pattern formation control method, and pa...
- Patent number 9,433,967
- Issue date Sep 6, 2016
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Mask pattern creation method, recording medium, and semiconductor d...
- Patent number 8,871,408
- Issue date Oct 28, 2014
- Kabushiki Kaisha Toshiba
- Yoko Takekawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Pattern forming method, mold and data processing method
- Patent number 8,722,535
- Issue date May 13, 2014
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern forming method, processing method, and processing apparatus
- Patent number 8,420,422
- Issue date Apr 16, 2013
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Simulation model creating method, computer program product, and met...
- Patent number 8,381,138
- Issue date Feb 19, 2013
- Kabushiki Kaisha Toshiba
- Tetsuaki Matsunawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Simulation model creating method, mask data creating method and sem...
- Patent number 8,055,366
- Issue date Nov 8, 2011
- Kabushiki Kaisha Toshiba
- Shoji Mimotogi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System of testing semiconductor devices, a method for testing semic...
- Patent number 7,982,155
- Issue date Jul 19, 2011
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for managing semiconductor manufacturing device
- Patent number 7,979,154
- Issue date Jul 12, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for controlling semiconductor manufacturing apparatus and co...
- Patent number 7,970,486
- Issue date Jun 28, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method, apparatus, and computer readable medium for evaluating a sa...
- Patent number 7,930,123
- Issue date Apr 19, 2011
- Kabushiki Kaisha Toshiba
- Takahiro Ikeda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for evaluating lithography apparatus and method for controll...
- Patent number 7,883,824
- Issue date Feb 8, 2011
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle set, method for designing a reticle set, exposure monitorin...
- Patent number 7,855,047
- Issue date Dec 21, 2010
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Reticle, apparatus for monitoring optical system, method for monito...
- Patent number 7,812,972
- Issue date Oct 12, 2010
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement coordinate setting system and method
- Patent number 7,756,656
- Issue date Jul 13, 2010
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Management system of semiconductor fabrication apparatus, abnormali...
- Patent number 7,742,834
- Issue date Jun 22, 2010
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Reticle set, method for designing a reticle set, exposure monitorin...
- Patent number 7,655,369
- Issue date Feb 2, 2010
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System of testing semiconductor devices, a method for testing semic...
- Patent number 7,629,550
- Issue date Dec 8, 2009
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation of pattern formation process, photo masks for the evalua...
- Patent number 7,537,869
- Issue date May 26, 2009
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Temperature calibration method for baking processing apparatus, adj...
- Patent number 7,510,341
- Issue date Mar 31, 2009
- Kabushiki Kaisha Toshiba
- Kei Hayasaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Process control method, a method for forming monitor marks, a mask...
- Patent number 7,476,473
- Issue date Jan 13, 2009
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reticle, apparatus for monitoring optical system, method for monito...
- Patent number 7,432,021
- Issue date Oct 7, 2008
- Kabushiki Kaisha Toshiba
- Takashi Sato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure control method and method of manufacturing a semiconductor...
- Patent number 7,396,621
- Issue date Jul 8, 2008
- Kabushiki Kaisha Toshiba
- Tadahito Fujisawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Focus monitor method and mask
- Patent number 7,250,235
- Issue date Jul 31, 2007
- Kabushiki Kaisha Toshiba
- Kyoko Izuha
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Testing system, a computer implemented testing method and a method...
- Patent number 7,184,913
- Issue date Feb 27, 2007
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G01 - MEASURING TESTING
Information Patent Grant
Reticle set, method for designing a reticle set, exposure monitorin...
- Patent number 7,175,943
- Issue date Feb 13, 2007
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Testing system, a computer implemented testing method and a method...
- Patent number 7,103,503
- Issue date Sep 5, 2006
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G01 - MEASURING TESTING
Information Patent Grant
Dose monitoring method and manufacturing method of semiconductor de...
- Patent number 6,919,153
- Issue date Jul 19, 2005
- Kabushiki Kaisaha Toshiba
- Tadahito Fujisawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
IMPRINT METHOD AND TEMPLATE
- Publication number 20210114284
- Publication date Apr 22, 2021
- Toshiba Memory Corporation
- Masafumi ASANO
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
METHOD FOR DESIGNING MASK SET, RECORDING MEDIUM, TEMPLATE, AND METH...
- Publication number 20190033712
- Publication date Jan 31, 2019
- Toshiba Memory Corporation
- Shinichiro NAKAGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMPRINT METHOD AND TEMPLATE
- Publication number 20180264712
- Publication date Sep 20, 2018
- Toshiba Memory Corporation
- Masafumi ASANO
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
PATTERN DATA GENERATION METHOD, PATTERN DATA GENERATION DEVICE, AND...
- Publication number 20150261904
- Publication date Sep 17, 2015
- Kabushiki Kaisha Toshiba
- Sachiko KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD, PATTERN FORMATION CONTROL METHOD, AND PA...
- Publication number 20150235911
- Publication date Aug 20, 2015
- Kabushiki Kaisha Toshiba
- Masafumi ASANO
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
PATTERN INSPECTION MEMBER, PATTERN INSPECTION METHOD, AND PATTERN I...
- Publication number 20150224702
- Publication date Aug 13, 2015
- Kabushiki Kaisha Toshiba
- MASAFUMI ASANO
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
IMPRINT TEMPLATE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20150217504
- Publication date Aug 6, 2015
- Kabushiki Kaisha Toshiba
- Shinichiro Nakagawa
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
METHOD FOR DESIGNING MASK SET, RECORDING MEDIUM, TEMPLATE, AND METH...
- Publication number 20150037713
- Publication date Feb 5, 2015
- Kabushiki Kaisha Toshiba
- Shinichiro NAKAGAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20140354799
- Publication date Dec 4, 2014
- Kabushiki Kaisha Toshiba
- Tomoko OJIMA
- G01 - MEASURING TESTING
Information Patent Application
PATTERN FORMATION DEVICE, METHOD FOR PATTERN FORMATION, AND PROGRAM...
- Publication number 20140346701
- Publication date Nov 27, 2014
- Sachiko Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Application
MOLD AND MOLD MANUFACTURING METHOD
- Publication number 20140284846
- Publication date Sep 25, 2014
- Kabushiki Kaisha Toshiba
- Yoko TAKEKAWA
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
PATTERN FORMING METHOD, MOLD AND DATA PROCESSING METHOD
- Publication number 20130323925
- Publication date Dec 5, 2013
- Kabushiki Kaisha Toshiba
- Masafumi ASANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MASK PATTERN CREATION METHOD, RECORDING MEDIUM, AND SEMICONDUCTOR D...
- Publication number 20130224635
- Publication date Aug 29, 2013
- Yoko TAKEKAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PATTERN FORMATION DEVICE, METHOD FOR PATTERN FORMATION, AND PROGRAM...
- Publication number 20130069278
- Publication date Mar 21, 2013
- Sachiko Kobayashi
- B82 - NANO-TECHNOLOGY
Information Patent Application
PATTERN FORMATION METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVIC...
- Publication number 20120318561
- Publication date Dec 20, 2012
- Kazuhiro TAKAHATA
- B82 - NANO-TECHNOLOGY
Information Patent Application
SIMULATION MODEL CREATING METHOD, COMPUTER PROGRAM PRODUCT, AND MET...
- Publication number 20120324407
- Publication date Dec 20, 2012
- Tetsuaki MATSUNAWA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TEMPLATE, TEMPLATE MANUFACTURING METHOD, AND TEMPLATE MANUFACTURING...
- Publication number 20120315349
- Publication date Dec 13, 2012
- Yingkang ZHANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
Imprint Apparatus, Imprint Method, and Process Condition Selection...
- Publication number 20120205782
- Publication date Aug 16, 2012
- Masafumi ASANO
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
PATTERN FORMATION METHOD
- Publication number 20120009791
- Publication date Jan 12, 2012
- Yingkang ZHANG
- B82 - NANO-TECHNOLOGY
Information Patent Application
TEMPLATE, MANUFACTURING METHOD, AND PROCESSING METHOD
- Publication number 20110315077
- Publication date Dec 29, 2011
- Masafumi ASANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and system for managing semiconductor manufacturing device
- Publication number 20110245956
- Publication date Oct 6, 2011
- Kabushiki Kaisha Toshiba
- Hiroshi Matsushita
- G05 - CONTROLLING REGULATING
Information Patent Application
PATTERN FORMING METHOD, PROCESSING METHOD, AND PROCESSING APPARATUS
- Publication number 20110229988
- Publication date Sep 22, 2011
- Masafumi ASANO
- B82 - NANO-TECHNOLOGY
Information Patent Application
EVALUATING APPARATUS, EVALUATING METHOD, AND COMPUTER PROGRAM PRODUCT
- Publication number 20110224934
- Publication date Sep 15, 2011
- Seiro Miyoshi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FEATURE-QUANTITY EXTRACTING METHOD, DESIGNED-CIRCUIT-PATTERN VERIFY...
- Publication number 20100166289
- Publication date Jul 1, 2010
- Masaki SATAKE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Reticle set, method for designing a reticle set, exposure monitorin...
- Publication number 20100112485
- Publication date May 6, 2010
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System of testing semiconductor devices, a method for testing semic...
- Publication number 20100068833
- Publication date Mar 18, 2010
- Kabushiki Kaisha Toshiba
- Masafumi Asano
- G01 - MEASURING TESTING
Information Patent Application
PATTERN DATA CREATING METHOD, PHOTOMASK FABRICATING METHOD, AND MET...
- Publication number 20090305148
- Publication date Dec 10, 2009
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR EVALUATING LITHOGRAPHY APPARATUS AND METHOD FOR CONTROLL...
- Publication number 20090246654
- Publication date Oct 1, 2009
- Masafumi Asano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SIMULATION MODEL CREATING METHOD, MASK DATA CREATING METHOD AND SEM...
- Publication number 20090240362
- Publication date Sep 24, 2009
- Shoji Mimotogi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SAMPLING ESTIMATING METHOD, SAMPLING INSPECTION ESTIMATING APPARATU...
- Publication number 20090192743
- Publication date Jul 30, 2009
- Takahiro IKEDA
- G05 - CONTROLLING REGULATING

Masafumi Asano

Person

Patents Grantslast 30 patents

Method for designing mask set, recording medium, template, and meth...

Mold and mold manufacturing method

Pattern forming method, processing method, and processing apparatus

Pattern inspection method, pattern formation control method, and pa...

Mask pattern creation method, recording medium, and semiconductor d...

Pattern forming method, mold and data processing method

Pattern forming method, processing method, and processing apparatus

Simulation model creating method, computer program product, and met...

Simulation model creating method, mask data creating method and sem...

System of testing semiconductor devices, a method for testing semic...

Method and system for managing semiconductor manufacturing device

Method for controlling semiconductor manufacturing apparatus and co...

Method, apparatus, and computer readable medium for evaluating a sa...

Method for evaluating lithography apparatus and method for controll...

Reticle set, method for designing a reticle set, exposure monitorin...

Reticle, apparatus for monitoring optical system, method for monito...

Measurement coordinate setting system and method

Management system of semiconductor fabrication apparatus, abnormali...

Reticle set, method for designing a reticle set, exposure monitorin...

System of testing semiconductor devices, a method for testing semic...

Evaluation of pattern formation process, photo masks for the evalua...

Temperature calibration method for baking processing apparatus, adj...

Process control method, a method for forming monitor marks, a mask...

Reticle, apparatus for monitoring optical system, method for monito...

Exposure control method and method of manufacturing a semiconductor...

Focus monitor method and mask

Testing system, a computer implemented testing method and a method...

Reticle set, method for designing a reticle set, exposure monitorin...

Testing system, a computer implemented testing method and a method...

Dose monitoring method and manufacturing method of semiconductor de...

Patents Applicationslast 30 patents

IMPRINT METHOD AND TEMPLATE

METHOD FOR DESIGNING MASK SET, RECORDING MEDIUM, TEMPLATE, AND METH...

IMPRINT METHOD AND TEMPLATE

PATTERN DATA GENERATION METHOD, PATTERN DATA GENERATION DEVICE, AND...

PATTERN INSPECTION METHOD, PATTERN FORMATION CONTROL METHOD, AND PA...

PATTERN INSPECTION MEMBER, PATTERN INSPECTION METHOD, AND PATTERN I...

IMPRINT TEMPLATE AND METHOD FOR MANUFACTURING THE SAME

METHOD FOR DESIGNING MASK SET, RECORDING MEDIUM, TEMPLATE, AND METH...

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

PATTERN FORMATION DEVICE, METHOD FOR PATTERN FORMATION, AND PROGRAM...

MOLD AND MOLD MANUFACTURING METHOD

PATTERN FORMING METHOD, MOLD AND DATA PROCESSING METHOD

MASK PATTERN CREATION METHOD, RECORDING MEDIUM, AND SEMICONDUCTOR D...

PATTERN FORMATION DEVICE, METHOD FOR PATTERN FORMATION, AND PROGRAM...

PATTERN FORMATION METHOD, METHOD FOR MANUFACTURING ELECTRONIC DEVIC...

SIMULATION MODEL CREATING METHOD, COMPUTER PROGRAM PRODUCT, AND MET...

TEMPLATE, TEMPLATE MANUFACTURING METHOD, AND TEMPLATE MANUFACTURING...

Imprint Apparatus, Imprint Method, and Process Condition Selection...

PATTERN FORMATION METHOD

TEMPLATE, MANUFACTURING METHOD, AND PROCESSING METHOD

Method and system for managing semiconductor manufacturing device

PATTERN FORMING METHOD, PROCESSING METHOD, AND PROCESSING APPARATUS

EVALUATING APPARATUS, EVALUATING METHOD, AND COMPUTER PROGRAM PRODUCT

FEATURE-QUANTITY EXTRACTING METHOD, DESIGNED-CIRCUIT-PATTERN VERIFY...

Reticle set, method for designing a reticle set, exposure monitorin...

System of testing semiconductor devices, a method for testing semic...

PATTERN DATA CREATING METHOD, PHOTOMASK FABRICATING METHOD, AND MET...

METHOD FOR EVALUATING LITHOGRAPHY APPARATUS AND METHOD FOR CONTROLL...

SIMULATION MODEL CREATING METHOD, MASK DATA CREATING METHOD AND SEM...

SAMPLING ESTIMATING METHOD, SAMPLING INSPECTION ESTIMATING APPARATU...