Masahiko Sugiyama

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Nirasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Prober and probe testing method for temperature-controlling object...
- Patent number 7,332,918
- Issue date Feb 19, 2008
- Tokyo Electron Limited
- Masahiko Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Prober and probe testing method for temperature-controlling object...
- Patent number 6,992,500
- Issue date Jan 31, 2006
- Tokyo Electronic Limited
- Masahiko Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Prober and method for cleaning probes provided therein
- Patent number 6,118,290
- Issue date Sep 12, 2000
- Tokyo Electron Limited
- Masahiko Sugiyama
- G01 - MEASURING TESTING
Information Patent Grant
Wafer prober
- Patent number D383683
- Issue date Sep 16, 1997
- Tokyo Electron Limited
- Osamu Kamata
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Electric probing-test machine having a cooling system
- Patent number 5,198,752
- Issue date Mar 30, 1993
- Tokyo Electron Limited
- Eiji Miyata
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Electric probing-test machine having a cooling system
- Patent number 5,084,671
- Issue date Jan 28, 1992
- Tokyo Electron Limited
- Eiji Miyata
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...

Patents Applicationslast 30 patents

Information Patent Application
Prober and probe testing method for temperature-controlling object...
- Publication number 20060033519
- Publication date Feb 16, 2006
- Masahiko Sugiyama
- G01 - MEASURING TESTING
Information Patent Application
Prober and probe testing method for temperature-controlling object...
- Publication number 20040227536
- Publication date Nov 18, 2004
- Masahiko Sugiyama
- G01 - MEASURING TESTING
Information Patent Application
Chuck device and chuck method
- Publication number 20010013772
- Publication date Aug 16, 2001
- Masahiko Sugiyama
- G01 - MEASURING TESTING