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Masahiro Otaka
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Hitachi, JP
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last 30 patents
Information
Patent Grant
Fluid jet nozzle and stress improving treatment method using the no...
Patent number
5,897,062
Issue date
Apr 27, 1999
Hitachi, Ltd.
Kunio Enomoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Measurement system with noise reduction circuit
Patent number
5,793,203
Issue date
Aug 11, 1998
Hitachi, Ltd.
Eriko Takeda
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for performing preventive maintenance on the b...
Patent number
5,749,384
Issue date
May 12, 1998
Hitachi, Ltd.
Eisaku Hayashi
B08 - CLEANING
Information
Patent Grant
Residual stress improving method for members in reactor pressure ve...
Patent number
5,553,106
Issue date
Sep 3, 1996
Hitachi, Ltd.
Kunio Enomoto
C21 - METALLURGY OF IRON
Information
Patent Grant
Apparatus with cancel coil assembly for cancelling a field parallel...
Patent number
5,537,037
Issue date
Jul 16, 1996
Hitachi, Ltd.
Masahiro Otaka
G01 - MEASURING TESTING
Information
Patent Grant
Fluxmeter including squid and pickup coil with flux guiding core an...
Patent number
5,414,356
Issue date
May 9, 1995
Hitachi, Ltd.
Toshihiko Yoshimura
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for inspecting degradation/damage of a material using an...
Patent number
5,331,278
Issue date
Jul 19, 1994
Hitachi, Ltd.
Stephen Evanson
G01 - MEASURING TESTING
Information
Patent Grant
Method of maintaining housing of reactor pressure vessel and heat t...
Patent number
5,329,099
Issue date
Jul 12, 1994
Hitachi, Ltd.
Kunio Enomoto
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method of and apparatus for water-jet peening
Patent number
5,305,361
Issue date
Apr 19, 1994
Hitachi, Ltd.
Kunio Enomoto
C21 - METALLURGY OF IRON
Information
Patent Grant
Apparatus for magnetically detecting degradation of metal material...
Patent number
5,134,368
Issue date
Jul 28, 1992
Hitachi, Ltd.
Masahiro Otaka
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus utilizing a magnetic field for detecting degra...
Patent number
5,059,903
Issue date
Oct 22, 1991
Hitachi, Ltd.
Masahiro Otaka
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for predicting deterioration of a member const...
Patent number
4,987,367
Issue date
Jan 22, 1991
Hitachi, Ltd.
Yuichi Ishikawa
G07 - CHECKING-DEVICES
Information
Patent Grant
Method and apparatus for detecting cracks
Patent number
4,764,970
Issue date
Aug 16, 1988
Hitachi, Ltd.
Makoto Hayashi
G01 - MEASURING TESTING