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Masahiro Sakuta

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Apparatus for and method of mass analysis
    • Patent number 10,989,642
    • Issue date Apr 27, 2021
    • Hitachi High-Tech Science Corporation
    • Masahiro Sakuta
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass analysis apparatus and method
    • Patent number 10,847,355
    • Issue date Nov 24, 2020
    • Hitachi High-Tech Science Corporation
    • Masahiro Sakuta
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Apparatus for and method of mass analysis
    • Patent number 10,651,018
    • Issue date May 12, 2020
    • Hitachi High-Tech Science Corporation
    • Masahiro Sakuta
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Mass analysis apparatus and method
    • Patent number 10,636,638
    • Issue date Apr 28, 2020
    • HITATCHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro Sakuta
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    X-ray analyzer
    • Patent number 9,784,700
    • Issue date Oct 10, 2017
    • Hitachi High-Tech Science Corporation
    • Masahiro Sakuta
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    X-ray flourescent analyzer
    • Patent number 9,719,949
    • Issue date Aug 1, 2017
    • Hitachi High-Tech Science Corporation
    • Masahiro Sakuta
    • G01 - MEASURING TESTING
  • Information Patent Grant

    X-ray fluorescence analyzer
    • Patent number 9,188,553
    • Issue date Nov 17, 2015
    • Hitachi High-Tech Science Corporation
    • Masahiro Sakuta
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    MASS ANALYSIS APPARATUS AND METHOD
    • Publication number 20200118804
    • Publication date Apr 16, 2020
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro SAKUTA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    APPARATUS FOR AND METHOD OF MASS ANALYSIS
    • Publication number 20190214240
    • Publication date Jul 11, 2019
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro SAKUTA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SPECTRAL DATA PROCESSING APPARATUS AND SPECTRAL DATA PROCESSING METHOD
    • Publication number 20190025123
    • Publication date Jan 24, 2019
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro Sakuta
    • G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
  • Information Patent Application

    MASS ANALYSIS APPARATUS AND METHOD
    • Publication number 20190027349
    • Publication date Jan 24, 2019
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro SAKUTA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    APPARATUS FOR AND METHOD OF MASS ANALYSIS
    • Publication number 20190025174
    • Publication date Jan 24, 2019
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro SAKUTA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Sample Plate for X-Ray Analysis and X-Ray Fluorescent Analyzer
    • Publication number 20160011129
    • Publication date Jan 14, 2016
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro Sakuta
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-Ray Analyzer
    • Publication number 20150268179
    • Publication date Sep 24, 2015
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro Sakuta
    • G01 - MEASURING TESTING
  • Information Patent Application

    X-Ray Fluorescence Analyzer
    • Publication number 20140286474
    • Publication date Sep 25, 2014
    • HITACHI HIGH-TECH SCIENCE CORPORATION
    • Masahiro Sakuta
    • G01 - MEASURING TESTING