Masahiro Sasajima

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and axis adjustment method thereof
- Patent number 12,027,342
- Issue date Jul 2, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and axis adjustment method thereof
- Patent number 11,764,028
- Issue date Sep 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,610,754
- Issue date Mar 21, 2023
- HITACHI HIGH-TECH CORPORATION
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and method for adjusting position of d...
- Patent number 11,342,155
- Issue date May 24, 2022
- HITACHI HIGH-TECH CORPORATION
- Yuta Imai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample observation method using...
- Patent number 11,183,362
- Issue date Nov 23, 2021
- HITACHI HIGH-TECH CORPORATION
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus and method of setting observation condition
- Patent number 11,043,358
- Issue date Jun 22, 2021
- HITACHI HIGH-TECH CORPORATION
- Ryoko Araki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,971,347
- Issue date Apr 6, 2021
- HITACHI HIGH-TECH CORPORATION
- Mitsuhiro Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,349,567
- Issue date May 24, 2016
- Hitachi High-Technologies Corporation
- Yoshihiro Takahoko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection device
- Patent number 8,816,712
- Issue date Aug 26, 2014
- Hitachi High-Technologies Corporation
- Mitsuhiro Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspection method and device that consider the effect...
- Patent number 8,309,922
- Issue date Nov 13, 2012
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Grant
Sample inspection apparatus
- Patent number 7,989,766
- Issue date Aug 2, 2011
- Hitachi High-Technologies Corporation
- Yasuhiko Nara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for detecting defect by examining electric characteristic...
- Patent number 7,932,733
- Issue date Apr 26, 2011
- Hitachi High-Technologies Corporation
- Masahiro Sasajima
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder
- Patent number D579120
- Issue date Oct 21, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Suzuki
- D24 - Medical and laboratory equipment
Information Patent Grant
Sample holder
- Patent number D578655
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Suzuki
- D24 - Medical and laboratory equipment
Information Patent Grant
Sample holder
- Patent number D578653
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Suzuki
- D24 - Medical and laboratory equipment

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Device and Axis Adjustment Method Thereof
- Publication number 20230377829
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220013326
- Publication date Jan 13, 2022
- Hitachi High-Tech Corporation
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Method for Adjusting Position of D...
- Publication number 20210296081
- Publication date Sep 23, 2021
- Hitachi High-Tech Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Axis Adjustment Method Thereof
- Publication number 20210151279
- Publication date May 20, 2021
- Hitachi High-Tech Corporation
- Yuta IMAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210020422
- Publication date Jan 21, 2021
- Hitachi High-Technologies Corporation
- Mitsuhiro NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING...
- Publication number 20200294764
- Publication date Sep 17, 2020
- Hitachi High-Tech Corporation
- Katsura Takaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING APPARATUS AND METHOD OF SETTING OBSERVATION CONDITION
- Publication number 20200111638
- Publication date Apr 9, 2020
- Hitachi High-Technologies Corporation
- Ryoko ARAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20160086766
- Publication date Mar 24, 2016
- Hitachi High-Technologies Corporation
- Yoshihiro TAKAHOKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION METHOD AND DEVICE THAT CONSIDER THE EFFECT...
- Publication number 20110291009
- Publication date Dec 1, 2011
- Hitachi High-Technologies Corporation
- Tohru Ando
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20110140729
- Publication date Jun 16, 2011
- Hitachi High-Technologies Corporation
- Mitsuhiro Nakamura
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE INSPECTION APPARATUS
- Publication number 20090250610
- Publication date Oct 8, 2009
- Hitachi High-Technologies Corporation
- Yasuhiko NARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR DETECTING DEFECT
- Publication number 20090224788
- Publication date Sep 10, 2009
- Masahiro Sasajima
- G01 - MEASURING TESTING
Information Patent Application
Sample Inspection Apparatus and Sample Inspection Method
- Publication number 20080149848
- Publication date Jun 26, 2008
- Hitachi High-Technologies Corporation
- Hiroyuki Suzuki
- G01 - MEASURING TESTING

Masahiro Sasajima

Person

Patents Grantslast 30 patents

Charged particle beam device and axis adjustment method thereof

Charged particle beam device and axis adjustment method thereof

Charged particle beam device

Charged particle beam device and method for adjusting position of d...

Charged particle beam apparatus and sample observation method using...

Measuring apparatus and method of setting observation condition

Charged particle beam apparatus

Charged particle beam device

Inspection device

Semiconductor inspection method and device that consider the effect...

Sample inspection apparatus

Apparatus for detecting defect by examining electric characteristic...

Sample holder

Sample holder

Sample holder

Patents Applicationslast 30 patents

Charged Particle Beam Device and Axis Adjustment Method Thereof

CHARGED PARTICLE BEAM DEVICE

Charged Particle Beam Device and Method for Adjusting Position of D...

Charged Particle Beam Device and Axis Adjustment Method Thereof

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING...

MEASURING APPARATUS AND METHOD OF SETTING OBSERVATION CONDITION

Charged Particle Beam Device

SEMICONDUCTOR INSPECTION METHOD AND DEVICE THAT CONSIDER THE EFFECT...

INSPECTION DEVICE

SAMPLE INSPECTION APPARATUS

APPARATUS FOR DETECTING DEFECT

Sample Inspection Apparatus and Sample Inspection Method